Improved Sensitivity in Microwave Assessment of Moisture Absorption in Polymeric Filaments Used in Additive Manufacturing
Polymer-based additive manufacturing (AM) has gained widespread utility, where rapidly producing complex parts is of interest. However, there are still many challenges that limit broader industrial adoption, which are related to the real-time and in-line inspection of the process. In a previous inve...
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Veröffentlicht in: | IEEE transactions on instrumentation and measurement 2024, Vol.73, p.1-4 |
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description | Polymer-based additive manufacturing (AM) has gained widespread utility, where rapidly producing complex parts is of interest. However, there are still many challenges that limit broader industrial adoption, which are related to the real-time and in-line inspection of the process. In a previous investigation a near-field microwave nondestructive testing (NDT) technique was developed for detecting and evaluating moisture absorption in polymeric filaments used in AM. This method involved loading an open-ended rectangular waveguide (OERW) with an optimally designed dielectric slab to make an extended dielectric-loaded waveguide (EDLW) probe. The dielectric insertion served to confine the electric field distribution in a smaller region compared to the OERW probe. This investigation improves upon that method by reducing the opening dimension of the waveguide aperture into a small slit improving measurement sensitivity and spatial resolution. Numerical electromagnetic (EM) simulations within the Ka-band (26.5-40 GHz) frequency range were conducted using CST Studio Suite and validated by conducting several relevant experiments. |
doi_str_mv | 10.1109/TIM.2024.3413178 |
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However, there are still many challenges that limit broader industrial adoption, which are related to the real-time and in-line inspection of the process. In a previous investigation a near-field microwave nondestructive testing (NDT) technique was developed for detecting and evaluating moisture absorption in polymeric filaments used in AM. This method involved loading an open-ended rectangular waveguide (OERW) with an optimally designed dielectric slab to make an extended dielectric-loaded waveguide (EDLW) probe. The dielectric insertion served to confine the electric field distribution in a smaller region compared to the OERW probe. This investigation improves upon that method by reducing the opening dimension of the waveguide aperture into a small slit improving measurement sensitivity and spatial resolution. 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(IEEE) 2024</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c175t-2290eacd006b5a8fa75078920001e759c91af6ffa0a77fb56bf0d77c265ca9373</cites><orcidid>0000-0001-5906-2001 ; 0000-0001-9421-1551</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/10555428$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,4024,27923,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/10555428$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Ahmadi, Farzaneh</creatorcontrib><creatorcontrib>Zoughi, Reza</creatorcontrib><title>Improved Sensitivity in Microwave Assessment of Moisture Absorption in Polymeric Filaments Used in Additive Manufacturing</title><title>IEEE transactions on instrumentation and measurement</title><addtitle>TIM</addtitle><description>Polymer-based additive manufacturing (AM) has gained widespread utility, where rapidly producing complex parts is of interest. However, there are still many challenges that limit broader industrial adoption, which are related to the real-time and in-line inspection of the process. In a previous investigation a near-field microwave nondestructive testing (NDT) technique was developed for detecting and evaluating moisture absorption in polymeric filaments used in AM. This method involved loading an open-ended rectangular waveguide (OERW) with an optimally designed dielectric slab to make an extended dielectric-loaded waveguide (EDLW) probe. The dielectric insertion served to confine the electric field distribution in a smaller region compared to the OERW probe. This investigation improves upon that method by reducing the opening dimension of the waveguide aperture into a small slit improving measurement sensitivity and spatial resolution. Numerical electromagnetic (EM) simulations within the Ka-band (26.5-40 GHz) frequency range were conducted using CST Studio Suite and validated by conducting several relevant experiments.</description><subject>Absorption</subject><subject>Additive manufacturing</subject><subject>Additive manufacturing (AM)</subject><subject>Dielectrics</subject><subject>Electric fields</subject><subject>Extremely high frequencies</subject><subject>Filaments</subject><subject>Frequency ranges</subject><subject>Manufacturing</subject><subject>millimeter waves</subject><subject>Moisture</subject><subject>moisture absorbency near-field</subject><subject>Moisture absorption</subject><subject>Moisture measurement</subject><subject>Nondestructive testing</subject><subject>polymers</subject><subject>Probes</subject><subject>Programmable logic arrays</subject><subject>Real time</subject><subject>Rectangular waveguides</subject><subject>Reflection</subject><subject>Sensitivity</subject><subject>Sensitivity analysis</subject><subject>Spatial resolution</subject><issn>0018-9456</issn><issn>1557-9662</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpNkMFLwzAUxoMoOKd3Dx4CnjtfkqZpj2M4HawouJ1DmiaSsbYz6Sb9703ZDp4evPf7vsf3IfRIYEYIFC-bVTmjQNMZSwkjIr9CE8K5SIoso9doAkDypEh5dovuQtgBgMhSMUHDqjn47mRq_GXa4Hp3cv2AXYtLp333q04Gz0MwITSm7XFncdm50B99XFeh84fede2If3b7oTHeabx0ezXCAW9DtI23eV2PxgaXqj1apaPctd_36MaqfTAPlzlF2-XrZvGerD_eVov5OtFE8D6htACjdA2QVVzlVgkOIi9oTECM4IUuiLKZtQqUELbiWWWhFkLTjGtVMMGm6PnsG3P-HE3o5a47-ja-lAwEZZSmDCIFZyqmDsEbKw_eNcoPkoAcC5axYDkWLC8FR8nTWeKMMf9wznlKc_YH-xt5Cw</recordid><startdate>2024</startdate><enddate>2024</enddate><creator>Ahmadi, Farzaneh</creator><creator>Zoughi, Reza</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0001-5906-2001</orcidid><orcidid>https://orcid.org/0000-0001-9421-1551</orcidid></search><sort><creationdate>2024</creationdate><title>Improved Sensitivity in Microwave Assessment of Moisture Absorption in Polymeric Filaments Used in Additive Manufacturing</title><author>Ahmadi, Farzaneh ; Zoughi, Reza</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c175t-2290eacd006b5a8fa75078920001e759c91af6ffa0a77fb56bf0d77c265ca9373</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><topic>Absorption</topic><topic>Additive manufacturing</topic><topic>Additive manufacturing (AM)</topic><topic>Dielectrics</topic><topic>Electric fields</topic><topic>Extremely high frequencies</topic><topic>Filaments</topic><topic>Frequency ranges</topic><topic>Manufacturing</topic><topic>millimeter waves</topic><topic>Moisture</topic><topic>moisture absorbency near-field</topic><topic>Moisture absorption</topic><topic>Moisture measurement</topic><topic>Nondestructive testing</topic><topic>polymers</topic><topic>Probes</topic><topic>Programmable logic arrays</topic><topic>Real time</topic><topic>Rectangular waveguides</topic><topic>Reflection</topic><topic>Sensitivity</topic><topic>Sensitivity analysis</topic><topic>Spatial resolution</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ahmadi, Farzaneh</creatorcontrib><creatorcontrib>Zoughi, Reza</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on instrumentation and measurement</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Ahmadi, Farzaneh</au><au>Zoughi, Reza</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Improved Sensitivity in Microwave Assessment of Moisture Absorption in Polymeric Filaments Used in Additive Manufacturing</atitle><jtitle>IEEE transactions on instrumentation and measurement</jtitle><stitle>TIM</stitle><date>2024</date><risdate>2024</risdate><volume>73</volume><spage>1</spage><epage>4</epage><pages>1-4</pages><issn>0018-9456</issn><eissn>1557-9662</eissn><coden>IEIMAO</coden><abstract>Polymer-based additive manufacturing (AM) has gained widespread utility, where rapidly producing complex parts is of interest. However, there are still many challenges that limit broader industrial adoption, which are related to the real-time and in-line inspection of the process. In a previous investigation a near-field microwave nondestructive testing (NDT) technique was developed for detecting and evaluating moisture absorption in polymeric filaments used in AM. This method involved loading an open-ended rectangular waveguide (OERW) with an optimally designed dielectric slab to make an extended dielectric-loaded waveguide (EDLW) probe. The dielectric insertion served to confine the electric field distribution in a smaller region compared to the OERW probe. This investigation improves upon that method by reducing the opening dimension of the waveguide aperture into a small slit improving measurement sensitivity and spatial resolution. 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subjects | Absorption Additive manufacturing Additive manufacturing (AM) Dielectrics Electric fields Extremely high frequencies Filaments Frequency ranges Manufacturing millimeter waves Moisture moisture absorbency near-field Moisture absorption Moisture measurement Nondestructive testing polymers Probes Programmable logic arrays Real time Rectangular waveguides Reflection Sensitivity Sensitivity analysis Spatial resolution |
title | Improved Sensitivity in Microwave Assessment of Moisture Absorption in Polymeric Filaments Used in Additive Manufacturing |
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