Improved Sensitivity in Microwave Assessment of Moisture Absorption in Polymeric Filaments Used in Additive Manufacturing

Polymer-based additive manufacturing (AM) has gained widespread utility, where rapidly producing complex parts is of interest. However, there are still many challenges that limit broader industrial adoption, which are related to the real-time and in-line inspection of the process. In a previous inve...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on instrumentation and measurement 2024, Vol.73, p.1-4
Hauptverfasser: Ahmadi, Farzaneh, Zoughi, Reza
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 4
container_issue
container_start_page 1
container_title IEEE transactions on instrumentation and measurement
container_volume 73
creator Ahmadi, Farzaneh
Zoughi, Reza
description Polymer-based additive manufacturing (AM) has gained widespread utility, where rapidly producing complex parts is of interest. However, there are still many challenges that limit broader industrial adoption, which are related to the real-time and in-line inspection of the process. In a previous investigation a near-field microwave nondestructive testing (NDT) technique was developed for detecting and evaluating moisture absorption in polymeric filaments used in AM. This method involved loading an open-ended rectangular waveguide (OERW) with an optimally designed dielectric slab to make an extended dielectric-loaded waveguide (EDLW) probe. The dielectric insertion served to confine the electric field distribution in a smaller region compared to the OERW probe. This investigation improves upon that method by reducing the opening dimension of the waveguide aperture into a small slit improving measurement sensitivity and spatial resolution. Numerical electromagnetic (EM) simulations within the Ka-band (26.5-40 GHz) frequency range were conducted using CST Studio Suite and validated by conducting several relevant experiments.
doi_str_mv 10.1109/TIM.2024.3413178
format Article
fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_journals_3072322430</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>10555428</ieee_id><sourcerecordid>3072322430</sourcerecordid><originalsourceid>FETCH-LOGICAL-c175t-2290eacd006b5a8fa75078920001e759c91af6ffa0a77fb56bf0d77c265ca9373</originalsourceid><addsrcrecordid>eNpNkMFLwzAUxoMoOKd3Dx4CnjtfkqZpj2M4HawouJ1DmiaSsbYz6Sb9703ZDp4evPf7vsf3IfRIYEYIFC-bVTmjQNMZSwkjIr9CE8K5SIoso9doAkDypEh5dovuQtgBgMhSMUHDqjn47mRq_GXa4Hp3cv2AXYtLp333q04Gz0MwITSm7XFncdm50B99XFeh84fede2If3b7oTHeabx0ezXCAW9DtI23eV2PxgaXqj1apaPctd_36MaqfTAPlzlF2-XrZvGerD_eVov5OtFE8D6htACjdA2QVVzlVgkOIi9oTECM4IUuiLKZtQqUELbiWWWhFkLTjGtVMMGm6PnsG3P-HE3o5a47-ja-lAwEZZSmDCIFZyqmDsEbKw_eNcoPkoAcC5axYDkWLC8FR8nTWeKMMf9wznlKc_YH-xt5Cw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>3072322430</pqid></control><display><type>article</type><title>Improved Sensitivity in Microwave Assessment of Moisture Absorption in Polymeric Filaments Used in Additive Manufacturing</title><source>IEEE Electronic Library (IEL)</source><creator>Ahmadi, Farzaneh ; Zoughi, Reza</creator><creatorcontrib>Ahmadi, Farzaneh ; Zoughi, Reza</creatorcontrib><description>Polymer-based additive manufacturing (AM) has gained widespread utility, where rapidly producing complex parts is of interest. However, there are still many challenges that limit broader industrial adoption, which are related to the real-time and in-line inspection of the process. In a previous investigation a near-field microwave nondestructive testing (NDT) technique was developed for detecting and evaluating moisture absorption in polymeric filaments used in AM. This method involved loading an open-ended rectangular waveguide (OERW) with an optimally designed dielectric slab to make an extended dielectric-loaded waveguide (EDLW) probe. The dielectric insertion served to confine the electric field distribution in a smaller region compared to the OERW probe. This investigation improves upon that method by reducing the opening dimension of the waveguide aperture into a small slit improving measurement sensitivity and spatial resolution. Numerical electromagnetic (EM) simulations within the Ka-band (26.5-40 GHz) frequency range were conducted using CST Studio Suite and validated by conducting several relevant experiments.</description><identifier>ISSN: 0018-9456</identifier><identifier>EISSN: 1557-9662</identifier><identifier>DOI: 10.1109/TIM.2024.3413178</identifier><identifier>CODEN: IEIMAO</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Absorption ; Additive manufacturing ; Additive manufacturing (AM) ; Dielectrics ; Electric fields ; Extremely high frequencies ; Filaments ; Frequency ranges ; Manufacturing ; millimeter waves ; Moisture ; moisture absorbency near-field ; Moisture absorption ; Moisture measurement ; Nondestructive testing ; polymers ; Probes ; Programmable logic arrays ; Real time ; Rectangular waveguides ; Reflection ; Sensitivity ; Sensitivity analysis ; Spatial resolution</subject><ispartof>IEEE transactions on instrumentation and measurement, 2024, Vol.73, p.1-4</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2024</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c175t-2290eacd006b5a8fa75078920001e759c91af6ffa0a77fb56bf0d77c265ca9373</cites><orcidid>0000-0001-5906-2001 ; 0000-0001-9421-1551</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/10555428$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,4024,27923,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/10555428$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Ahmadi, Farzaneh</creatorcontrib><creatorcontrib>Zoughi, Reza</creatorcontrib><title>Improved Sensitivity in Microwave Assessment of Moisture Absorption in Polymeric Filaments Used in Additive Manufacturing</title><title>IEEE transactions on instrumentation and measurement</title><addtitle>TIM</addtitle><description>Polymer-based additive manufacturing (AM) has gained widespread utility, where rapidly producing complex parts is of interest. However, there are still many challenges that limit broader industrial adoption, which are related to the real-time and in-line inspection of the process. In a previous investigation a near-field microwave nondestructive testing (NDT) technique was developed for detecting and evaluating moisture absorption in polymeric filaments used in AM. This method involved loading an open-ended rectangular waveguide (OERW) with an optimally designed dielectric slab to make an extended dielectric-loaded waveguide (EDLW) probe. The dielectric insertion served to confine the electric field distribution in a smaller region compared to the OERW probe. This investigation improves upon that method by reducing the opening dimension of the waveguide aperture into a small slit improving measurement sensitivity and spatial resolution. Numerical electromagnetic (EM) simulations within the Ka-band (26.5-40 GHz) frequency range were conducted using CST Studio Suite and validated by conducting several relevant experiments.</description><subject>Absorption</subject><subject>Additive manufacturing</subject><subject>Additive manufacturing (AM)</subject><subject>Dielectrics</subject><subject>Electric fields</subject><subject>Extremely high frequencies</subject><subject>Filaments</subject><subject>Frequency ranges</subject><subject>Manufacturing</subject><subject>millimeter waves</subject><subject>Moisture</subject><subject>moisture absorbency near-field</subject><subject>Moisture absorption</subject><subject>Moisture measurement</subject><subject>Nondestructive testing</subject><subject>polymers</subject><subject>Probes</subject><subject>Programmable logic arrays</subject><subject>Real time</subject><subject>Rectangular waveguides</subject><subject>Reflection</subject><subject>Sensitivity</subject><subject>Sensitivity analysis</subject><subject>Spatial resolution</subject><issn>0018-9456</issn><issn>1557-9662</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpNkMFLwzAUxoMoOKd3Dx4CnjtfkqZpj2M4HawouJ1DmiaSsbYz6Sb9703ZDp4evPf7vsf3IfRIYEYIFC-bVTmjQNMZSwkjIr9CE8K5SIoso9doAkDypEh5dovuQtgBgMhSMUHDqjn47mRq_GXa4Hp3cv2AXYtLp333q04Gz0MwITSm7XFncdm50B99XFeh84fede2If3b7oTHeabx0ezXCAW9DtI23eV2PxgaXqj1apaPctd_36MaqfTAPlzlF2-XrZvGerD_eVov5OtFE8D6htACjdA2QVVzlVgkOIi9oTECM4IUuiLKZtQqUELbiWWWhFkLTjGtVMMGm6PnsG3P-HE3o5a47-ja-lAwEZZSmDCIFZyqmDsEbKw_eNcoPkoAcC5axYDkWLC8FR8nTWeKMMf9wznlKc_YH-xt5Cw</recordid><startdate>2024</startdate><enddate>2024</enddate><creator>Ahmadi, Farzaneh</creator><creator>Zoughi, Reza</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0001-5906-2001</orcidid><orcidid>https://orcid.org/0000-0001-9421-1551</orcidid></search><sort><creationdate>2024</creationdate><title>Improved Sensitivity in Microwave Assessment of Moisture Absorption in Polymeric Filaments Used in Additive Manufacturing</title><author>Ahmadi, Farzaneh ; Zoughi, Reza</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c175t-2290eacd006b5a8fa75078920001e759c91af6ffa0a77fb56bf0d77c265ca9373</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><topic>Absorption</topic><topic>Additive manufacturing</topic><topic>Additive manufacturing (AM)</topic><topic>Dielectrics</topic><topic>Electric fields</topic><topic>Extremely high frequencies</topic><topic>Filaments</topic><topic>Frequency ranges</topic><topic>Manufacturing</topic><topic>millimeter waves</topic><topic>Moisture</topic><topic>moisture absorbency near-field</topic><topic>Moisture absorption</topic><topic>Moisture measurement</topic><topic>Nondestructive testing</topic><topic>polymers</topic><topic>Probes</topic><topic>Programmable logic arrays</topic><topic>Real time</topic><topic>Rectangular waveguides</topic><topic>Reflection</topic><topic>Sensitivity</topic><topic>Sensitivity analysis</topic><topic>Spatial resolution</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ahmadi, Farzaneh</creatorcontrib><creatorcontrib>Zoughi, Reza</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on instrumentation and measurement</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Ahmadi, Farzaneh</au><au>Zoughi, Reza</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Improved Sensitivity in Microwave Assessment of Moisture Absorption in Polymeric Filaments Used in Additive Manufacturing</atitle><jtitle>IEEE transactions on instrumentation and measurement</jtitle><stitle>TIM</stitle><date>2024</date><risdate>2024</risdate><volume>73</volume><spage>1</spage><epage>4</epage><pages>1-4</pages><issn>0018-9456</issn><eissn>1557-9662</eissn><coden>IEIMAO</coden><abstract>Polymer-based additive manufacturing (AM) has gained widespread utility, where rapidly producing complex parts is of interest. However, there are still many challenges that limit broader industrial adoption, which are related to the real-time and in-line inspection of the process. In a previous investigation a near-field microwave nondestructive testing (NDT) technique was developed for detecting and evaluating moisture absorption in polymeric filaments used in AM. This method involved loading an open-ended rectangular waveguide (OERW) with an optimally designed dielectric slab to make an extended dielectric-loaded waveguide (EDLW) probe. The dielectric insertion served to confine the electric field distribution in a smaller region compared to the OERW probe. This investigation improves upon that method by reducing the opening dimension of the waveguide aperture into a small slit improving measurement sensitivity and spatial resolution. Numerical electromagnetic (EM) simulations within the Ka-band (26.5-40 GHz) frequency range were conducted using CST Studio Suite and validated by conducting several relevant experiments.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TIM.2024.3413178</doi><tpages>4</tpages><orcidid>https://orcid.org/0000-0001-5906-2001</orcidid><orcidid>https://orcid.org/0000-0001-9421-1551</orcidid></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 0018-9456
ispartof IEEE transactions on instrumentation and measurement, 2024, Vol.73, p.1-4
issn 0018-9456
1557-9662
language eng
recordid cdi_proquest_journals_3072322430
source IEEE Electronic Library (IEL)
subjects Absorption
Additive manufacturing
Additive manufacturing (AM)
Dielectrics
Electric fields
Extremely high frequencies
Filaments
Frequency ranges
Manufacturing
millimeter waves
Moisture
moisture absorbency near-field
Moisture absorption
Moisture measurement
Nondestructive testing
polymers
Probes
Programmable logic arrays
Real time
Rectangular waveguides
Reflection
Sensitivity
Sensitivity analysis
Spatial resolution
title Improved Sensitivity in Microwave Assessment of Moisture Absorption in Polymeric Filaments Used in Additive Manufacturing
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-19T17%3A12%3A47IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Improved%20Sensitivity%20in%20Microwave%20Assessment%20of%20Moisture%20Absorption%20in%20Polymeric%20Filaments%20Used%20in%20Additive%20Manufacturing&rft.jtitle=IEEE%20transactions%20on%20instrumentation%20and%20measurement&rft.au=Ahmadi,%20Farzaneh&rft.date=2024&rft.volume=73&rft.spage=1&rft.epage=4&rft.pages=1-4&rft.issn=0018-9456&rft.eissn=1557-9662&rft.coden=IEIMAO&rft_id=info:doi/10.1109/TIM.2024.3413178&rft_dat=%3Cproquest_RIE%3E3072322430%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=3072322430&rft_id=info:pmid/&rft_ieee_id=10555428&rfr_iscdi=true