Towards Single-Event Upset detection in Hardware Secure RISC-V processors
Single-event effects and hardware security show close similarities in terms of vulnerabilities and mitigation techniques. Secure processors address physical attacks from the outside, such as external laser stimulation, to compromise the program and extract sensitive information from the systems. To...
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Veröffentlicht in: | Journal of instrumentation 2024-06, Vol.19 (6), p.C06009 |
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creator | Jonckers, N. Engelen, B. Appels, K. De Raedemaeker, S. Mariën, L. Prinzie, J. |
description | Single-event effects and hardware security show close similarities in terms of vulnerabilities and mitigation techniques. Secure processors address physical attacks from the outside, such as external laser stimulation, to compromise the program and extract sensitive information from the systems. To overcome this vulnerability, secure extensions to the hardware architecture are often built into modern processor cores. Given the limited design resources often found in space or high-energy physics experiment development teams, this article addresses the extent to which secure hardware architectures can be a reliable source of processor SEU detection. |
doi_str_mv | 10.1088/1748-0221/19/06/C06009 |
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fullrecord | <record><control><sourceid>proquest_iop_j</sourceid><recordid>TN_cdi_proquest_journals_3066900056</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>3066900056</sourcerecordid><originalsourceid>FETCH-LOGICAL-c308t-e3ce10521142fc26650adc2c2be57d1c0a686ebd131647220a786ffe0882174b3</originalsourceid><addsrcrecordid>eNqFkEFLw0AQhRdRsFb_gix4E2JmN8kkOUqobaEg2Nbrkm4mklKzcTdV_PduiWgPgqcZmO_N4z3GrgXcCciyUKRxFoCUIhR5CBgWgAD5CRv9HE6P9nN24dwWIMmTGEZsvjIfpa0cXzbty46CyTu1PV93jnpeUU-6b0zLm5bPPOVJ4kvSez-e5ssieOadNZqcM9ZdsrO63Dm6-p5jtn6YrIpZsHiczov7RaAjyPqAIk0CEilELGstERMoKy213FCSVkJDiRnSphKRwDiVEso0w7omn1T6EJtozG6Gv976bU-uV1uzt623VBEg5uCzoadwoLQ1zlmqVWeb19J-KgHqUJs6NKIOjSiRK0A11OaFt4OwMd3v523TeqNjUHVV7WH5B_yPwxdL73ul</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>3066900056</pqid></control><display><type>article</type><title>Towards Single-Event Upset detection in Hardware Secure RISC-V processors</title><source>IOP Publishing Journals</source><source>Institute of Physics (IOP) Journals - HEAL-Link</source><creator>Jonckers, N. ; Engelen, B. ; Appels, K. ; De Raedemaeker, S. ; Mariën, L. ; Prinzie, J.</creator><creatorcontrib>Jonckers, N. ; Engelen, B. ; Appels, K. ; De Raedemaeker, S. ; Mariën, L. ; Prinzie, J.</creatorcontrib><description>Single-event effects and hardware security show close similarities in terms of vulnerabilities and mitigation techniques. Secure processors address physical attacks from the outside, such as external laser stimulation, to compromise the program and extract sensitive information from the systems. To overcome this vulnerability, secure extensions to the hardware architecture are often built into modern processor cores. Given the limited design resources often found in space or high-energy physics experiment development teams, this article addresses the extent to which secure hardware architectures can be a reliable source of processor SEU detection.</description><identifier>ISSN: 1748-0221</identifier><identifier>EISSN: 1748-0221</identifier><identifier>DOI: 10.1088/1748-0221/19/06/C06009</identifier><language>eng</language><publisher>Bristol: IOP Publishing</publisher><subject>Computing (architecture, farms, GRID for recording, storage, archiving, and distribution of data) ; Digital electronic circuits ; Hardware ; Microprocessors ; Radiation-hard electronics ; RISC ; Single Event Effects ; Single event upsets ; VLSI circuits</subject><ispartof>Journal of instrumentation, 2024-06, Vol.19 (6), p.C06009</ispartof><rights>2024 IOP Publishing Ltd and Sissa Medialab</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c308t-e3ce10521142fc26650adc2c2be57d1c0a686ebd131647220a786ffe0882174b3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://iopscience.iop.org/article/10.1088/1748-0221/19/06/C06009/pdf$$EPDF$$P50$$Giop$$H</linktopdf><link.rule.ids>314,776,780,27901,27902,53821,53868</link.rule.ids></links><search><creatorcontrib>Jonckers, N.</creatorcontrib><creatorcontrib>Engelen, B.</creatorcontrib><creatorcontrib>Appels, K.</creatorcontrib><creatorcontrib>De Raedemaeker, S.</creatorcontrib><creatorcontrib>Mariën, L.</creatorcontrib><creatorcontrib>Prinzie, J.</creatorcontrib><title>Towards Single-Event Upset detection in Hardware Secure RISC-V processors</title><title>Journal of instrumentation</title><addtitle>J. Instrum</addtitle><description>Single-event effects and hardware security show close similarities in terms of vulnerabilities and mitigation techniques. Secure processors address physical attacks from the outside, such as external laser stimulation, to compromise the program and extract sensitive information from the systems. To overcome this vulnerability, secure extensions to the hardware architecture are often built into modern processor cores. Given the limited design resources often found in space or high-energy physics experiment development teams, this article addresses the extent to which secure hardware architectures can be a reliable source of processor SEU detection.</description><subject>Computing (architecture, farms, GRID for recording, storage, archiving, and distribution of data)</subject><subject>Digital electronic circuits</subject><subject>Hardware</subject><subject>Microprocessors</subject><subject>Radiation-hard electronics</subject><subject>RISC</subject><subject>Single Event Effects</subject><subject>Single event upsets</subject><subject>VLSI circuits</subject><issn>1748-0221</issn><issn>1748-0221</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><recordid>eNqFkEFLw0AQhRdRsFb_gix4E2JmN8kkOUqobaEg2Nbrkm4mklKzcTdV_PduiWgPgqcZmO_N4z3GrgXcCciyUKRxFoCUIhR5CBgWgAD5CRv9HE6P9nN24dwWIMmTGEZsvjIfpa0cXzbty46CyTu1PV93jnpeUU-6b0zLm5bPPOVJ4kvSez-e5ssieOadNZqcM9ZdsrO63Dm6-p5jtn6YrIpZsHiczov7RaAjyPqAIk0CEilELGstERMoKy213FCSVkJDiRnSphKRwDiVEso0w7omn1T6EJtozG6Gv976bU-uV1uzt623VBEg5uCzoadwoLQ1zlmqVWeb19J-KgHqUJs6NKIOjSiRK0A11OaFt4OwMd3v523TeqNjUHVV7WH5B_yPwxdL73ul</recordid><startdate>20240601</startdate><enddate>20240601</enddate><creator>Jonckers, N.</creator><creator>Engelen, B.</creator><creator>Appels, K.</creator><creator>De Raedemaeker, S.</creator><creator>Mariën, L.</creator><creator>Prinzie, J.</creator><general>IOP Publishing</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20240601</creationdate><title>Towards Single-Event Upset detection in Hardware Secure RISC-V processors</title><author>Jonckers, N. ; Engelen, B. ; Appels, K. ; De Raedemaeker, S. ; Mariën, L. ; Prinzie, J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c308t-e3ce10521142fc26650adc2c2be57d1c0a686ebd131647220a786ffe0882174b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><topic>Computing (architecture, farms, GRID for recording, storage, archiving, and distribution of data)</topic><topic>Digital electronic circuits</topic><topic>Hardware</topic><topic>Microprocessors</topic><topic>Radiation-hard electronics</topic><topic>RISC</topic><topic>Single Event Effects</topic><topic>Single event upsets</topic><topic>VLSI circuits</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Jonckers, N.</creatorcontrib><creatorcontrib>Engelen, B.</creatorcontrib><creatorcontrib>Appels, K.</creatorcontrib><creatorcontrib>De Raedemaeker, S.</creatorcontrib><creatorcontrib>Mariën, L.</creatorcontrib><creatorcontrib>Prinzie, J.</creatorcontrib><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of instrumentation</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Jonckers, N.</au><au>Engelen, B.</au><au>Appels, K.</au><au>De Raedemaeker, S.</au><au>Mariën, L.</au><au>Prinzie, J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Towards Single-Event Upset detection in Hardware Secure RISC-V processors</atitle><jtitle>Journal of instrumentation</jtitle><addtitle>J. Instrum</addtitle><date>2024-06-01</date><risdate>2024</risdate><volume>19</volume><issue>6</issue><spage>C06009</spage><pages>C06009-</pages><issn>1748-0221</issn><eissn>1748-0221</eissn><abstract>Single-event effects and hardware security show close similarities in terms of vulnerabilities and mitigation techniques. Secure processors address physical attacks from the outside, such as external laser stimulation, to compromise the program and extract sensitive information from the systems. To overcome this vulnerability, secure extensions to the hardware architecture are often built into modern processor cores. Given the limited design resources often found in space or high-energy physics experiment development teams, this article addresses the extent to which secure hardware architectures can be a reliable source of processor SEU detection.</abstract><cop>Bristol</cop><pub>IOP Publishing</pub><doi>10.1088/1748-0221/19/06/C06009</doi><tpages>7</tpages></addata></record> |
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subjects | Computing (architecture, farms, GRID for recording, storage, archiving, and distribution of data) Digital electronic circuits Hardware Microprocessors Radiation-hard electronics RISC Single Event Effects Single event upsets VLSI circuits |
title | Towards Single-Event Upset detection in Hardware Secure RISC-V processors |
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