Microwave Holography for EMI Source Imaging

Emission source microscopy technique can be utilized to localize the radiation sources in complex and electrically large electronic systems. In the two-dimensional emission source microscopy algorithm, both magnitude and phase of the field need to be measured, and a vector network analyzer or an osc...

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Veröffentlicht in:	IEEE transactions on electromagnetic compatibility 2024-04, Vol.66 (2), p.557-565
Hauptverfasser:	Yan, Xin, Li, Jiangshuai, Zhang, Wei, Ghosh, Kaustav, Sochoux, Philippe, Beetner, Daryl G., Khilkevich, Victor
Format:	Artikel
Sprache:	eng
Schlagworte:	Algorithms Antenna measurements Antennas Electromagnetic interference Electronic systems Emission Emission source microscopy Holograms Holography Mathematical functions Microscopy Microwave holography Microwave imaging Microwave measurement Microwave theory and techniques Network analysers Noise measurement Noise reduction Radiation Radiation sources Signal to noise ratio source imaging Spectrum analysers
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