Microwave Holography for EMI Source Imaging
Emission source microscopy technique can be utilized to localize the radiation sources in complex and electrically large electronic systems. In the two-dimensional emission source microscopy algorithm, both magnitude and phase of the field need to be measured, and a vector network analyzer or an osc...
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| Veröffentlicht in: | IEEE transactions on electromagnetic compatibility 2024-04, Vol.66 (2), p.557-565 |
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| container_title | IEEE transactions on electromagnetic compatibility |
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| creator | Yan, Xin Li, Jiangshuai Zhang, Wei Ghosh, Kaustav Sochoux, Philippe Beetner, Daryl G. Khilkevich, Victor |
| description | Emission source microscopy technique can be utilized to localize the radiation sources in complex and electrically large electronic systems. In the two-dimensional emission source microscopy algorithm, both magnitude and phase of the field need to be measured, and a vector network analyzer or an oscilloscope has to be used as a receiver, resulting in reduced signal-to-noise ratio and longer measurement time compared to a spectrum analyzer (SA). In this article, a phaseless electromagnetic interference source imaging method is proposed based on microwave holography. The field produced by the device under test is not measured directly, instead, the interference pattern between the emitted field and the reference wave is created and measured as the hologram. The hologram is a real-valued function that can be measured using a SA. The proposed method is validated through measurements for both passive and active devices. The proposed algorithm is efficient and reliable in identifying major radiation sources and determining their location and relative strength. |
| doi_str_mv | 10.1109/TEMC.2023.3340233 |
| format | Article |
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In the two-dimensional emission source microscopy algorithm, both magnitude and phase of the field need to be measured, and a vector network analyzer or an oscilloscope has to be used as a receiver, resulting in reduced signal-to-noise ratio and longer measurement time compared to a spectrum analyzer (SA). In this article, a phaseless electromagnetic interference source imaging method is proposed based on microwave holography. The field produced by the device under test is not measured directly, instead, the interference pattern between the emitted field and the reference wave is created and measured as the hologram. The hologram is a real-valued function that can be measured using a SA. The proposed method is validated through measurements for both passive and active devices. 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(IEEE) 2024</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c246t-28e4f526b76cc6a50a42bdba8a7a7d639cf75b3eabb211155126ffe575c272463</cites><orcidid>0000-0002-9205-983X ; 0000-0003-4210-3051 ; 0000-0001-6710-7329 ; 0000-0002-2491-1912 ; 0000-0002-3149-4133 ; 0000-0002-0639-9484 ; 0000-0002-8343-7413</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/10365594$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27923,27924,54757</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/10365594$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Yan, Xin</creatorcontrib><creatorcontrib>Li, Jiangshuai</creatorcontrib><creatorcontrib>Zhang, Wei</creatorcontrib><creatorcontrib>Ghosh, Kaustav</creatorcontrib><creatorcontrib>Sochoux, Philippe</creatorcontrib><creatorcontrib>Beetner, Daryl G.</creatorcontrib><creatorcontrib>Khilkevich, Victor</creatorcontrib><title>Microwave Holography for EMI Source Imaging</title><title>IEEE transactions on electromagnetic compatibility</title><addtitle>TEMC</addtitle><description>Emission source microscopy technique can be utilized to localize the radiation sources in complex and electrically large electronic systems. In the two-dimensional emission source microscopy algorithm, both magnitude and phase of the field need to be measured, and a vector network analyzer or an oscilloscope has to be used as a receiver, resulting in reduced signal-to-noise ratio and longer measurement time compared to a spectrum analyzer (SA). In this article, a phaseless electromagnetic interference source imaging method is proposed based on microwave holography. The field produced by the device under test is not measured directly, instead, the interference pattern between the emitted field and the reference wave is created and measured as the hologram. The hologram is a real-valued function that can be measured using a SA. The proposed method is validated through measurements for both passive and active devices. The proposed algorithm is efficient and reliable in identifying major radiation sources and determining their location and relative strength.</description><subject>Algorithms</subject><subject>Antenna measurements</subject><subject>Antennas</subject><subject>Electromagnetic interference</subject><subject>Electronic systems</subject><subject>Emission</subject><subject>Emission source microscopy</subject><subject>Holograms</subject><subject>Holography</subject><subject>Mathematical functions</subject><subject>Microscopy</subject><subject>Microwave holography</subject><subject>Microwave imaging</subject><subject>Microwave measurement</subject><subject>Microwave theory and techniques</subject><subject>Network analysers</subject><subject>Noise measurement</subject><subject>Noise reduction</subject><subject>Radiation</subject><subject>Radiation sources</subject><subject>Signal to noise ratio</subject><subject>source imaging</subject><subject>Spectrum analysers</subject><issn>0018-9375</issn><issn>1558-187X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpNkE9LAzEUxIMouFY_gOBhwaNsTfLyZ_coS2sLLR6s4C0kaVK3tN2atEq_vVm2B0_Dg5l5ww-he4KHhODqeTGa10OKKQwBWBK4QBnhvCxIKT8vUYYxKYsKJL9GNzGu08k4hQw9zRsb2l_94_JJu2lXQe-_TrlvQz6aT_P39hisy6dbvWp2q1t05fUmuruzDtDHeLSoJ8Xs7XVav8wKS5k4FLR0zHMqjBTWCs2xZtQsjS611HIpoLJecgNOG0MJSSMJFd47LrmlMjXAAD32vfvQfh9dPKh12rFLLxVghjETJZDkIr0r7Y8xOK_2odnqcFIEq46J6piojok6M0mZhz7TOOf--UFwXjH4AwvoW2w</recordid><startdate>20240401</startdate><enddate>20240401</enddate><creator>Yan, Xin</creator><creator>Li, Jiangshuai</creator><creator>Zhang, Wei</creator><creator>Ghosh, Kaustav</creator><creator>Sochoux, Philippe</creator><creator>Beetner, Daryl G.</creator><creator>Khilkevich, Victor</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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| subjects | Algorithms Antenna measurements Antennas Electromagnetic interference Electronic systems Emission Emission source microscopy Holograms Holography Mathematical functions Microscopy Microwave holography Microwave imaging Microwave measurement Microwave theory and techniques Network analysers Noise measurement Noise reduction Radiation Radiation sources Signal to noise ratio source imaging Spectrum analysers |
| title | Microwave Holography for EMI Source Imaging |
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