Characterization of Bias-Dependent Ceramic Capacitors From Reflection Coefficient Measurements Performed Using a VNA

Multilayer ceramic capacitors are characterized using one-port network analyzer measurements. The proposal allows determining the bias-dependent capacitance and the series parasitics by using a single test fixture. For this purpose, the inaccuracy introduced by the bias-dependent response of the cir...

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Veröffentlicht in:	IEEE transactions on electromagnetic compatibility 2024-04, Vol.66 (2), p.1-8
Hauptverfasser:	Sanchez-Munoz, Juan Pablo, Torres-Torres, Reydezel
Format:	Artikel
Sprache:	eng
Schlagworte:	Bias Bias-tee Calibration Capacitance Capacitance measurement Capacitors Ceramic capacitors Ceramics Circuits Fixtures Frequency measurement Microwave measurement multilayer ceramic capacitor Multilayers Network analysers Reflectance series inductance series resistance Voltage measurement
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