The thermochromic characteristics of ITO/VO2 composite films on SiO2 nanospheres

As a promising thermochromic material for smart windows, VO 2 -based films have received extensive attention. To enhance the luminous transmittance ( T lum ) of thermochromic smart windows without seriously affecting the solar modulation efficiency (Δ T sol ), this paper prepared VO 2 films by rapid...

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Veröffentlicht in:Journal of materials science. Materials in electronics 2024-04, Vol.35 (11), p.752, Article 752
Hauptverfasser: Zeng, Xiaofei, Zhou, Liwei, Mi, Wei, Wang, Di, He, Linan, Qi, Dongdong
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creator Zeng, Xiaofei
Zhou, Liwei
Mi, Wei
Wang, Di
He, Linan
Qi, Dongdong
description As a promising thermochromic material for smart windows, VO 2 -based films have received extensive attention. To enhance the luminous transmittance ( T lum ) of thermochromic smart windows without seriously affecting the solar modulation efficiency (Δ T sol ), this paper prepared VO 2 films by rapid thermal annealing of sputtered vanadium thin films on an ordered SiO 2 nanosphere array, and then the ITO as antireflection layer was deposited on VO 2 film by reactive magnetron sputtering. The surface morphology, crystal structure and optical transmittance of the films were characterized by Scanning Electron Microscopy, X-ray diffraction and UV–VIS–NIR spectrophotometer, respectively. The SiO 2 nanospheres provide continuous refractive index gradient, while the deposition of the ITO antireflection layer creates conditions for thin film interference, thereby synergistically reducing surface reflection in the VO 2 -based smart window. Compared with the planar VO 2 thin film ( T lum , 39.1%), the ITO/VO 2 /SiO 2 composite structure can significantly increase the T lum from 39.1 to 55.5%, an increase of nearly 16.4%, while the Δ T sol is basically unchanged. The results provide an effective strategy for improving the performance of smart windows.
doi_str_mv 10.1007/s10854-024-12539-y
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_3037705380</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>3037705380</sourcerecordid><originalsourceid>FETCH-LOGICAL-c270t-450cc2b3f96247ac985004d088c4bfc45ac950747f6fe846de20b55d9cd51c083</originalsourceid><addsrcrecordid>eNp9kM1Lw0AQxRdRsFb_AU8Bz7GT_chujlL8KBQqWMXbkk52TUqTjbvpIf-9qxG8eRp4896b4UfIdQa3GYBchAyU4ClQnmZUsCIdT8gsE5KlXNH3UzKDQsiUC0rPyUUIewDIOVMz8rytTTLUxrcOa-_aBhOsS1_iYHwThgZD4myy2m4WbxuaoGt7F5rBJLY5tHHVJS9N1Luyc6GPLSZckjNbHoK5-p1z8vpwv10-pevN42p5t06RShjiK4BId8wWOeWyxEIJAF6BUsh3FrmIkgDJpc2tUTyvDIWdEFWBlcgQFJuTm6m39-7zaMKg9-7ou3hSM2BSgmAKootOLvQuBG-s7n3Tln7UGehvcnoipyM5_UNOjzHEplCI5u7D-L_qf1Jf_UFxJw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>3037705380</pqid></control><display><type>article</type><title>The thermochromic characteristics of ITO/VO2 composite films on SiO2 nanospheres</title><source>SpringerLink Journals - AutoHoldings</source><creator>Zeng, Xiaofei ; Zhou, Liwei ; Mi, Wei ; Wang, Di ; He, Linan ; Qi, Dongdong</creator><creatorcontrib>Zeng, Xiaofei ; Zhou, Liwei ; Mi, Wei ; Wang, Di ; He, Linan ; Qi, Dongdong</creatorcontrib><description>As a promising thermochromic material for smart windows, VO 2 -based films have received extensive attention. To enhance the luminous transmittance ( T lum ) of thermochromic smart windows without seriously affecting the solar modulation efficiency (Δ T sol ), this paper prepared VO 2 films by rapid thermal annealing of sputtered vanadium thin films on an ordered SiO 2 nanosphere array, and then the ITO as antireflection layer was deposited on VO 2 film by reactive magnetron sputtering. The surface morphology, crystal structure and optical transmittance of the films were characterized by Scanning Electron Microscopy, X-ray diffraction and UV–VIS–NIR spectrophotometer, respectively. The SiO 2 nanospheres provide continuous refractive index gradient, while the deposition of the ITO antireflection layer creates conditions for thin film interference, thereby synergistically reducing surface reflection in the VO 2 -based smart window. Compared with the planar VO 2 thin film ( T lum , 39.1%), the ITO/VO 2 /SiO 2 composite structure can significantly increase the T lum from 39.1 to 55.5%, an increase of nearly 16.4%, while the Δ T sol is basically unchanged. The results provide an effective strategy for improving the performance of smart windows.</description><identifier>ISSN: 0957-4522</identifier><identifier>EISSN: 1573-482X</identifier><identifier>DOI: 10.1007/s10854-024-12539-y</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Composite structures ; Crystal structure ; Magnetron sputtering ; Materials Science ; Nanospheres ; Optical and Electronic Materials ; Refractivity ; Silicon dioxide ; Smart materials ; Thin films ; Vanadium oxides ; Windows (apertures)</subject><ispartof>Journal of materials science. Materials in electronics, 2024-04, Vol.35 (11), p.752, Article 752</ispartof><rights>The Author(s), under exclusive licence to Springer Science+Business Media, LLC, part of Springer Nature 2024. Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c270t-450cc2b3f96247ac985004d088c4bfc45ac950747f6fe846de20b55d9cd51c083</cites><orcidid>0000-0001-5666-8315</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s10854-024-12539-y$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s10854-024-12539-y$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,780,784,27915,27916,41479,42548,51310</link.rule.ids></links><search><creatorcontrib>Zeng, Xiaofei</creatorcontrib><creatorcontrib>Zhou, Liwei</creatorcontrib><creatorcontrib>Mi, Wei</creatorcontrib><creatorcontrib>Wang, Di</creatorcontrib><creatorcontrib>He, Linan</creatorcontrib><creatorcontrib>Qi, Dongdong</creatorcontrib><title>The thermochromic characteristics of ITO/VO2 composite films on SiO2 nanospheres</title><title>Journal of materials science. Materials in electronics</title><addtitle>J Mater Sci: Mater Electron</addtitle><description>As a promising thermochromic material for smart windows, VO 2 -based films have received extensive attention. To enhance the luminous transmittance ( T lum ) of thermochromic smart windows without seriously affecting the solar modulation efficiency (Δ T sol ), this paper prepared VO 2 films by rapid thermal annealing of sputtered vanadium thin films on an ordered SiO 2 nanosphere array, and then the ITO as antireflection layer was deposited on VO 2 film by reactive magnetron sputtering. The surface morphology, crystal structure and optical transmittance of the films were characterized by Scanning Electron Microscopy, X-ray diffraction and UV–VIS–NIR spectrophotometer, respectively. The SiO 2 nanospheres provide continuous refractive index gradient, while the deposition of the ITO antireflection layer creates conditions for thin film interference, thereby synergistically reducing surface reflection in the VO 2 -based smart window. Compared with the planar VO 2 thin film ( T lum , 39.1%), the ITO/VO 2 /SiO 2 composite structure can significantly increase the T lum from 39.1 to 55.5%, an increase of nearly 16.4%, while the Δ T sol is basically unchanged. The results provide an effective strategy for improving the performance of smart windows.</description><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Composite structures</subject><subject>Crystal structure</subject><subject>Magnetron sputtering</subject><subject>Materials Science</subject><subject>Nanospheres</subject><subject>Optical and Electronic Materials</subject><subject>Refractivity</subject><subject>Silicon dioxide</subject><subject>Smart materials</subject><subject>Thin films</subject><subject>Vanadium oxides</subject><subject>Windows (apertures)</subject><issn>0957-4522</issn><issn>1573-482X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><recordid>eNp9kM1Lw0AQxRdRsFb_AU8Bz7GT_chujlL8KBQqWMXbkk52TUqTjbvpIf-9qxG8eRp4896b4UfIdQa3GYBchAyU4ClQnmZUsCIdT8gsE5KlXNH3UzKDQsiUC0rPyUUIewDIOVMz8rytTTLUxrcOa-_aBhOsS1_iYHwThgZD4myy2m4WbxuaoGt7F5rBJLY5tHHVJS9N1Luyc6GPLSZckjNbHoK5-p1z8vpwv10-pevN42p5t06RShjiK4BId8wWOeWyxEIJAF6BUsh3FrmIkgDJpc2tUTyvDIWdEFWBlcgQFJuTm6m39-7zaMKg9-7ou3hSM2BSgmAKootOLvQuBG-s7n3Tln7UGehvcnoipyM5_UNOjzHEplCI5u7D-L_qf1Jf_UFxJw</recordid><startdate>20240401</startdate><enddate>20240401</enddate><creator>Zeng, Xiaofei</creator><creator>Zhou, Liwei</creator><creator>Mi, Wei</creator><creator>Wang, Di</creator><creator>He, Linan</creator><creator>Qi, Dongdong</creator><general>Springer US</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>JG9</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0001-5666-8315</orcidid></search><sort><creationdate>20240401</creationdate><title>The thermochromic characteristics of ITO/VO2 composite films on SiO2 nanospheres</title><author>Zeng, Xiaofei ; Zhou, Liwei ; Mi, Wei ; Wang, Di ; He, Linan ; Qi, Dongdong</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c270t-450cc2b3f96247ac985004d088c4bfc45ac950747f6fe846de20b55d9cd51c083</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Composite structures</topic><topic>Crystal structure</topic><topic>Magnetron sputtering</topic><topic>Materials Science</topic><topic>Nanospheres</topic><topic>Optical and Electronic Materials</topic><topic>Refractivity</topic><topic>Silicon dioxide</topic><topic>Smart materials</topic><topic>Thin films</topic><topic>Vanadium oxides</topic><topic>Windows (apertures)</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Zeng, Xiaofei</creatorcontrib><creatorcontrib>Zhou, Liwei</creatorcontrib><creatorcontrib>Mi, Wei</creatorcontrib><creatorcontrib>Wang, Di</creatorcontrib><creatorcontrib>He, Linan</creatorcontrib><creatorcontrib>Qi, Dongdong</creatorcontrib><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Engineering Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of materials science. Materials in electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Zeng, Xiaofei</au><au>Zhou, Liwei</au><au>Mi, Wei</au><au>Wang, Di</au><au>He, Linan</au><au>Qi, Dongdong</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>The thermochromic characteristics of ITO/VO2 composite films on SiO2 nanospheres</atitle><jtitle>Journal of materials science. Materials in electronics</jtitle><stitle>J Mater Sci: Mater Electron</stitle><date>2024-04-01</date><risdate>2024</risdate><volume>35</volume><issue>11</issue><spage>752</spage><pages>752-</pages><artnum>752</artnum><issn>0957-4522</issn><eissn>1573-482X</eissn><abstract>As a promising thermochromic material for smart windows, VO 2 -based films have received extensive attention. To enhance the luminous transmittance ( T lum ) of thermochromic smart windows without seriously affecting the solar modulation efficiency (Δ T sol ), this paper prepared VO 2 films by rapid thermal annealing of sputtered vanadium thin films on an ordered SiO 2 nanosphere array, and then the ITO as antireflection layer was deposited on VO 2 film by reactive magnetron sputtering. The surface morphology, crystal structure and optical transmittance of the films were characterized by Scanning Electron Microscopy, X-ray diffraction and UV–VIS–NIR spectrophotometer, respectively. The SiO 2 nanospheres provide continuous refractive index gradient, while the deposition of the ITO antireflection layer creates conditions for thin film interference, thereby synergistically reducing surface reflection in the VO 2 -based smart window. Compared with the planar VO 2 thin film ( T lum , 39.1%), the ITO/VO 2 /SiO 2 composite structure can significantly increase the T lum from 39.1 to 55.5%, an increase of nearly 16.4%, while the Δ T sol is basically unchanged. The results provide an effective strategy for improving the performance of smart windows.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s10854-024-12539-y</doi><orcidid>https://orcid.org/0000-0001-5666-8315</orcidid></addata></record>
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subjects Characterization and Evaluation of Materials
Chemistry and Materials Science
Composite structures
Crystal structure
Magnetron sputtering
Materials Science
Nanospheres
Optical and Electronic Materials
Refractivity
Silicon dioxide
Smart materials
Thin films
Vanadium oxides
Windows (apertures)
title The thermochromic characteristics of ITO/VO2 composite films on SiO2 nanospheres
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-14T22%3A38%3A21IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=The%20thermochromic%20characteristics%20of%20ITO/VO2%20composite%20films%20on%20SiO2%20nanospheres&rft.jtitle=Journal%20of%20materials%20science.%20Materials%20in%20electronics&rft.au=Zeng,%20Xiaofei&rft.date=2024-04-01&rft.volume=35&rft.issue=11&rft.spage=752&rft.pages=752-&rft.artnum=752&rft.issn=0957-4522&rft.eissn=1573-482X&rft_id=info:doi/10.1007/s10854-024-12539-y&rft_dat=%3Cproquest_cross%3E3037705380%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=3037705380&rft_id=info:pmid/&rfr_iscdi=true