Characteristics of Surface Charge Accumulation on Spacers and Its Influencing Factors
Charge accumulation usually happens on the surface of spacers under DC operation, which is susceptible to inducing surface flashover. In order to explore the surface charge accumulation mechanisms and the influences of dielectric conductivity, gas ion mobility, and temperature field on the surface c...
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Veröffentlicht in: | Electronics (Basel) 2024-04, Vol.13 (7), p.1294 |
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description | Charge accumulation usually happens on the surface of spacers under DC operation, which is susceptible to inducing surface flashover. In order to explore the surface charge accumulation mechanisms and the influences of dielectric conductivity, gas ion mobility, and temperature field on the surface charges, a time-varying charge density model at the gas–solid interface of spacers was established. The results of the simulation show that the discontinuity of the current density between the spacer bulk side and the gas ion flow is the fundamental reason for the charge accumulation on the spacer surface. Additionally, the value of current density fluxes at the interface continues to decrease with the change of the electric field, and the progress of charge transfer gradually stabilizes. Moreover, the dielectric conductivity directly affects the charge accumulation process, and there is a critical conductivity in which the effect of charge conduction in dielectrics counteracts that of gas-phase charge deposition, theoretically. When the conductivity is higher than the critical conductivity, the solid-side charge conduction is the main source of the surface charge accumulation, while the gas-phase charge deposition on the gas side plays a dominant role when the conductivity is lower than the critical conductivity. The charge accumulation is not significantly affected by gas ion mobility when the temperature is evenly distributed. However, under the temperature field with gradient distribution, the current density fluxes at the interface change, causing the polarity reverse of the accumulated charge. In the high-temperature region, the volume current density surges simultaneously with the conductivity, leading to a higher density of surface charge accumulation. Lastly, the design of spacers needs to keep the current densities on both sides of the interface as similar as possible in order to avoid excessive charge gathering in localized areas. |
doi_str_mv | 10.3390/electronics13071294 |
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In order to explore the surface charge accumulation mechanisms and the influences of dielectric conductivity, gas ion mobility, and temperature field on the surface charges, a time-varying charge density model at the gas–solid interface of spacers was established. The results of the simulation show that the discontinuity of the current density between the spacer bulk side and the gas ion flow is the fundamental reason for the charge accumulation on the spacer surface. Additionally, the value of current density fluxes at the interface continues to decrease with the change of the electric field, and the progress of charge transfer gradually stabilizes. Moreover, the dielectric conductivity directly affects the charge accumulation process, and there is a critical conductivity in which the effect of charge conduction in dielectrics counteracts that of gas-phase charge deposition, theoretically. When the conductivity is higher than the critical conductivity, the solid-side charge conduction is the main source of the surface charge accumulation, while the gas-phase charge deposition on the gas side plays a dominant role when the conductivity is lower than the critical conductivity. The charge accumulation is not significantly affected by gas ion mobility when the temperature is evenly distributed. However, under the temperature field with gradient distribution, the current density fluxes at the interface change, causing the polarity reverse of the accumulated charge. In the high-temperature region, the volume current density surges simultaneously with the conductivity, leading to a higher density of surface charge accumulation. Lastly, the design of spacers needs to keep the current densities on both sides of the interface as similar as possible in order to avoid excessive charge gathering in localized areas.</description><identifier>ISSN: 2079-9292</identifier><identifier>EISSN: 2079-9292</identifier><identifier>DOI: 10.3390/electronics13071294</identifier><language>eng</language><publisher>Basel: MDPI AG</publisher><subject>Accumulation ; Analysis ; Bulk density ; Charge density ; Charge deposition ; Charge transfer ; Current density ; Dielectrics ; Electric fields ; Electric properties ; Fluxes ; Genetic algorithms ; Geometry ; High temperature ; Ionic mobility ; Optimization ; Radiation ; Simulation ; Spacers ; Surface charge ; Surface flashover ; Temperature distribution</subject><ispartof>Electronics (Basel), 2024-04, Vol.13 (7), p.1294</ispartof><rights>COPYRIGHT 2024 MDPI AG</rights><rights>2024 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c311t-b07f0ec9090438d57a3d2b7c4f2c8f91b45f3aba87a2992139c82779345ab5623</cites><orcidid>0000-0002-7516-446X</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27903,27904</link.rule.ids></links><search><creatorcontrib>Lai, Yundong</creatorcontrib><creatorcontrib>Jiang, Hui</creatorcontrib><creatorcontrib>Han, Yufei</creatorcontrib><creatorcontrib>Tang, Jinyu</creatorcontrib><title>Characteristics of Surface Charge Accumulation on Spacers and Its Influencing Factors</title><title>Electronics (Basel)</title><description>Charge accumulation usually happens on the surface of spacers under DC operation, which is susceptible to inducing surface flashover. In order to explore the surface charge accumulation mechanisms and the influences of dielectric conductivity, gas ion mobility, and temperature field on the surface charges, a time-varying charge density model at the gas–solid interface of spacers was established. The results of the simulation show that the discontinuity of the current density between the spacer bulk side and the gas ion flow is the fundamental reason for the charge accumulation on the spacer surface. Additionally, the value of current density fluxes at the interface continues to decrease with the change of the electric field, and the progress of charge transfer gradually stabilizes. Moreover, the dielectric conductivity directly affects the charge accumulation process, and there is a critical conductivity in which the effect of charge conduction in dielectrics counteracts that of gas-phase charge deposition, theoretically. When the conductivity is higher than the critical conductivity, the solid-side charge conduction is the main source of the surface charge accumulation, while the gas-phase charge deposition on the gas side plays a dominant role when the conductivity is lower than the critical conductivity. The charge accumulation is not significantly affected by gas ion mobility when the temperature is evenly distributed. However, under the temperature field with gradient distribution, the current density fluxes at the interface change, causing the polarity reverse of the accumulated charge. In the high-temperature region, the volume current density surges simultaneously with the conductivity, leading to a higher density of surface charge accumulation. Lastly, the design of spacers needs to keep the current densities on both sides of the interface as similar as possible in order to avoid excessive charge gathering in localized areas.</description><subject>Accumulation</subject><subject>Analysis</subject><subject>Bulk density</subject><subject>Charge density</subject><subject>Charge deposition</subject><subject>Charge transfer</subject><subject>Current density</subject><subject>Dielectrics</subject><subject>Electric fields</subject><subject>Electric properties</subject><subject>Fluxes</subject><subject>Genetic algorithms</subject><subject>Geometry</subject><subject>High temperature</subject><subject>Ionic mobility</subject><subject>Optimization</subject><subject>Radiation</subject><subject>Simulation</subject><subject>Spacers</subject><subject>Surface charge</subject><subject>Surface flashover</subject><subject>Temperature distribution</subject><issn>2079-9292</issn><issn>2079-9292</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNptUE1LAzEQDaJgqf0FXgKetyaZ3SY5lmK1UPBQe16y2aSmbJOaZA_-e1PqwYMzAzPMxxveQ-iRkjmAJM9mMDrH4J1OFAinTNY3aMIIl5Vkkt3-qe_RLKUjKSYpCCATtF99qqh0NtGlXBBwsHg3Rqu0wZfRweCl1uNpHFR2weMSu3MZxoSV7_EmJ7zxdhiN184f8LpAhZge0J1VQzKz3zxF-_XLx-qt2r6_blbLbaWB0lx1hFtitCSS1CD6hivoWcd1bZkWVtKubiyoTgmumJSMgtSCcS6hblTXLBhM0dMV9xzD12hSbo9hjL68bIEAbwrPWpSt-XXroAbTOm9DLpSL9-bkdPDGutJfckkIFYQuygFcD3QMKUVj23N0JxW_W0rai-btP5rDD3iHdss</recordid><startdate>20240401</startdate><enddate>20240401</enddate><creator>Lai, Yundong</creator><creator>Jiang, Hui</creator><creator>Han, Yufei</creator><creator>Tang, Jinyu</creator><general>MDPI AG</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>L7M</scope><scope>P5Z</scope><scope>P62</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><orcidid>https://orcid.org/0000-0002-7516-446X</orcidid></search><sort><creationdate>20240401</creationdate><title>Characteristics of Surface Charge Accumulation on Spacers and Its Influencing Factors</title><author>Lai, Yundong ; Jiang, Hui ; Han, Yufei ; Tang, Jinyu</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c311t-b07f0ec9090438d57a3d2b7c4f2c8f91b45f3aba87a2992139c82779345ab5623</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><topic>Accumulation</topic><topic>Analysis</topic><topic>Bulk density</topic><topic>Charge density</topic><topic>Charge deposition</topic><topic>Charge transfer</topic><topic>Current density</topic><topic>Dielectrics</topic><topic>Electric fields</topic><topic>Electric properties</topic><topic>Fluxes</topic><topic>Genetic algorithms</topic><topic>Geometry</topic><topic>High temperature</topic><topic>Ionic mobility</topic><topic>Optimization</topic><topic>Radiation</topic><topic>Simulation</topic><topic>Spacers</topic><topic>Surface charge</topic><topic>Surface flashover</topic><topic>Temperature distribution</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Lai, Yundong</creatorcontrib><creatorcontrib>Jiang, Hui</creatorcontrib><creatorcontrib>Han, Yufei</creatorcontrib><creatorcontrib>Tang, Jinyu</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni)</collection><collection>ProQuest Central</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central</collection><collection>SciTech Premium Collection (Proquest) (PQ_SDU_P3)</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><jtitle>Electronics (Basel)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Lai, Yundong</au><au>Jiang, Hui</au><au>Han, Yufei</au><au>Tang, Jinyu</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Characteristics of Surface Charge Accumulation on Spacers and Its Influencing Factors</atitle><jtitle>Electronics (Basel)</jtitle><date>2024-04-01</date><risdate>2024</risdate><volume>13</volume><issue>7</issue><spage>1294</spage><pages>1294-</pages><issn>2079-9292</issn><eissn>2079-9292</eissn><abstract>Charge accumulation usually happens on the surface of spacers under DC operation, which is susceptible to inducing surface flashover. In order to explore the surface charge accumulation mechanisms and the influences of dielectric conductivity, gas ion mobility, and temperature field on the surface charges, a time-varying charge density model at the gas–solid interface of spacers was established. The results of the simulation show that the discontinuity of the current density between the spacer bulk side and the gas ion flow is the fundamental reason for the charge accumulation on the spacer surface. Additionally, the value of current density fluxes at the interface continues to decrease with the change of the electric field, and the progress of charge transfer gradually stabilizes. Moreover, the dielectric conductivity directly affects the charge accumulation process, and there is a critical conductivity in which the effect of charge conduction in dielectrics counteracts that of gas-phase charge deposition, theoretically. When the conductivity is higher than the critical conductivity, the solid-side charge conduction is the main source of the surface charge accumulation, while the gas-phase charge deposition on the gas side plays a dominant role when the conductivity is lower than the critical conductivity. The charge accumulation is not significantly affected by gas ion mobility when the temperature is evenly distributed. However, under the temperature field with gradient distribution, the current density fluxes at the interface change, causing the polarity reverse of the accumulated charge. In the high-temperature region, the volume current density surges simultaneously with the conductivity, leading to a higher density of surface charge accumulation. Lastly, the design of spacers needs to keep the current densities on both sides of the interface as similar as possible in order to avoid excessive charge gathering in localized areas.</abstract><cop>Basel</cop><pub>MDPI AG</pub><doi>10.3390/electronics13071294</doi><orcidid>https://orcid.org/0000-0002-7516-446X</orcidid><oa>free_for_read</oa></addata></record> |
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subjects | Accumulation Analysis Bulk density Charge density Charge deposition Charge transfer Current density Dielectrics Electric fields Electric properties Fluxes Genetic algorithms Geometry High temperature Ionic mobility Optimization Radiation Simulation Spacers Surface charge Surface flashover Temperature distribution |
title | Characteristics of Surface Charge Accumulation on Spacers and Its Influencing Factors |
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