Ultralow H2O content analysis with a large-geometry secondary ion mass spectrometer

Large-geometry secondary ion mass spectrometry (LG-SIMS) is routinely used to determine the elemental and isotopic compositions, thanks to its high sensitivity and in situ micro-analysis capability. Its large volumes of transfer and coupling column, however, might bring low vacuum and high backgroun...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Journal of analytical atomic spectrometry 2024-04, Vol.39 (4), p.1070-1076
Hauptverfasser:	Cui, Zexian, Xiao-Ping, Xia, Yang, Qing, Zhang, Kai, Yang, Xiaozhi, Chun-Kit Lai, Wan-Feng, Zhang, Yan-Qiang, Zhang, Yang, Ya-Nan
Format:	Artikel
Sprache:	eng
Schlagworte:	Bismuth Content analysis Control equipment Hydrogen isotopes Low vacuum Moisture content Secondary ion mass spectrometry Tin base alloys
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!