Surface Structure Analysis of Powder Catalysts by Means of XAFS
XAFS is a fine structure that appears after the absorption edge of the X-ray absorption spectrum, and is known to reflect the local structure and electronic state of X-ray absorbing atoms. XAFS is an extremely powerful method for structural analysis of materials without crystallinity, and is current...
Gespeichert in:
| Veröffentlicht in: | Funtai Kogakkaishi Japan, 2023/12/10, Vol.60(12), pp.760-767 |
|---|---|
| 1. Verfasser: | |
| Format: | Artikel |
| Sprache: | eng ; jpn |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 767 |
|---|---|
| container_issue | 12 |
| container_start_page | 760 |
| container_title | Funtai Kogakkaishi |
| container_volume | 60 |
| creator | Kubota, Takeshi |
| description | XAFS is a fine structure that appears after the absorption edge of the X-ray absorption spectrum, and is known to reflect the local structure and electronic state of X-ray absorbing atoms. XAFS is an extremely powerful method for structural analysis of materials without crystallinity, and is currently widely used for the characterization of nanoparticles, catalytically active species, and trace elements in glasses. In this review, I briefly explain the principle and measurement method of XAFS, and introduce examples of its application to heterogeneous solid powder catalysts and metal nanoclusters, centering on the author's research results. |
| doi_str_mv | 10.4164/sptj.60.760 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2957003708</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2957003708</sourcerecordid><originalsourceid>FETCH-LOGICAL-c193t-6ec88347290de5d7e043a25791e1fe248c635878f8e83716f67d23d0d76737683</originalsourceid><addsrcrecordid>eNo9kEFLw0AQhRdRsNSe_AMBj5I6u5vsbE5Si1VBUaiCt2W7mWhKberuBum_NzHSyzyY983weIydc5hmXGVXYRfXUwVTVHDERlxrmaKQxTEbgdQqVTzHUzYJoV4BQIFCFGLErpetr6yjZBl962LrKZlt7WYf6pA0VfLS_JTkk7mN_S6GZLVPnshu_8z32WJ5xk4quwk0-dcxe1vcvs7v08fnu4f57DF1vJAxVeS6PBmKAkrKSyTIpBU5Fpx4RSLTTslco640aYlcVQpLIUsoUaFEpeWYXQx_d775bilEs25a3yUNRhQ5AkiEnrocKOebEDxVZufrL-v3hoPpSzJ9SUaB6Urq6JuBXodoP-jAWh9rt6EDy0U_h6OD6T6tN7SVv95cb-Y</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2957003708</pqid></control><display><type>article</type><title>Surface Structure Analysis of Powder Catalysts by Means of XAFS</title><source>J-STAGE Free</source><source>EZB-FREE-00999 freely available EZB journals</source><creator>Kubota, Takeshi</creator><creatorcontrib>Kubota, Takeshi</creatorcontrib><description>XAFS is a fine structure that appears after the absorption edge of the X-ray absorption spectrum, and is known to reflect the local structure and electronic state of X-ray absorbing atoms. XAFS is an extremely powerful method for structural analysis of materials without crystallinity, and is currently widely used for the characterization of nanoparticles, catalytically active species, and trace elements in glasses. In this review, I briefly explain the principle and measurement method of XAFS, and introduce examples of its application to heterogeneous solid powder catalysts and metal nanoclusters, centering on the author's research results.</description><identifier>ISSN: 0386-6157</identifier><identifier>EISSN: 1883-7239</identifier><identifier>DOI: 10.4164/sptj.60.760</identifier><language>eng ; jpn</language><publisher>Kyoto: The Society of Powder Technology, Japan</publisher><subject>Absorption spectra ; Catalyst ; Catalysts ; Electron states ; EXAFS ; Fine structure ; Measurement methods ; Nanoclusters ; Structural analysis ; Surface structure ; Trace elements ; X ray absorption ; X-ray ; XAFS ; XANES</subject><ispartof>Journal of the Society of Powder Technology, Japan, 2023/12/10, Vol.60(12), pp.760-767</ispartof><rights>2023 The Society of Powder Technology, Japan</rights><rights>Copyright Japan Science and Technology Agency 2023</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c193t-6ec88347290de5d7e043a25791e1fe248c635878f8e83716f67d23d0d76737683</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,1881,27923,27924</link.rule.ids></links><search><creatorcontrib>Kubota, Takeshi</creatorcontrib><title>Surface Structure Analysis of Powder Catalysts by Means of XAFS</title><title>Funtai Kogakkaishi</title><addtitle>J. Soc. Powder Technol., Japan</addtitle><description>XAFS is a fine structure that appears after the absorption edge of the X-ray absorption spectrum, and is known to reflect the local structure and electronic state of X-ray absorbing atoms. XAFS is an extremely powerful method for structural analysis of materials without crystallinity, and is currently widely used for the characterization of nanoparticles, catalytically active species, and trace elements in glasses. In this review, I briefly explain the principle and measurement method of XAFS, and introduce examples of its application to heterogeneous solid powder catalysts and metal nanoclusters, centering on the author's research results.</description><subject>Absorption spectra</subject><subject>Catalyst</subject><subject>Catalysts</subject><subject>Electron states</subject><subject>EXAFS</subject><subject>Fine structure</subject><subject>Measurement methods</subject><subject>Nanoclusters</subject><subject>Structural analysis</subject><subject>Surface structure</subject><subject>Trace elements</subject><subject>X ray absorption</subject><subject>X-ray</subject><subject>XAFS</subject><subject>XANES</subject><issn>0386-6157</issn><issn>1883-7239</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2023</creationdate><recordtype>article</recordtype><recordid>eNo9kEFLw0AQhRdRsNSe_AMBj5I6u5vsbE5Si1VBUaiCt2W7mWhKberuBum_NzHSyzyY983weIydc5hmXGVXYRfXUwVTVHDERlxrmaKQxTEbgdQqVTzHUzYJoV4BQIFCFGLErpetr6yjZBl962LrKZlt7WYf6pA0VfLS_JTkk7mN_S6GZLVPnshu_8z32WJ5xk4quwk0-dcxe1vcvs7v08fnu4f57DF1vJAxVeS6PBmKAkrKSyTIpBU5Fpx4RSLTTslco640aYlcVQpLIUsoUaFEpeWYXQx_d775bilEs25a3yUNRhQ5AkiEnrocKOebEDxVZufrL-v3hoPpSzJ9SUaB6Urq6JuBXodoP-jAWh9rt6EDy0U_h6OD6T6tN7SVv95cb-Y</recordid><startdate>20231210</startdate><enddate>20231210</enddate><creator>Kubota, Takeshi</creator><general>The Society of Powder Technology, Japan</general><general>Japan Science and Technology Agency</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>20231210</creationdate><title>Surface Structure Analysis of Powder Catalysts by Means of XAFS</title><author>Kubota, Takeshi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c193t-6ec88347290de5d7e043a25791e1fe248c635878f8e83716f67d23d0d76737683</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng ; jpn</language><creationdate>2023</creationdate><topic>Absorption spectra</topic><topic>Catalyst</topic><topic>Catalysts</topic><topic>Electron states</topic><topic>EXAFS</topic><topic>Fine structure</topic><topic>Measurement methods</topic><topic>Nanoclusters</topic><topic>Structural analysis</topic><topic>Surface structure</topic><topic>Trace elements</topic><topic>X ray absorption</topic><topic>X-ray</topic><topic>XAFS</topic><topic>XANES</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kubota, Takeshi</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Funtai Kogakkaishi</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kubota, Takeshi</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Surface Structure Analysis of Powder Catalysts by Means of XAFS</atitle><jtitle>Funtai Kogakkaishi</jtitle><addtitle>J. Soc. Powder Technol., Japan</addtitle><date>2023-12-10</date><risdate>2023</risdate><volume>60</volume><issue>12</issue><spage>760</spage><epage>767</epage><pages>760-767</pages><artnum>60.760</artnum><issn>0386-6157</issn><eissn>1883-7239</eissn><abstract>XAFS is a fine structure that appears after the absorption edge of the X-ray absorption spectrum, and is known to reflect the local structure and electronic state of X-ray absorbing atoms. XAFS is an extremely powerful method for structural analysis of materials without crystallinity, and is currently widely used for the characterization of nanoparticles, catalytically active species, and trace elements in glasses. In this review, I briefly explain the principle and measurement method of XAFS, and introduce examples of its application to heterogeneous solid powder catalysts and metal nanoclusters, centering on the author's research results.</abstract><cop>Kyoto</cop><pub>The Society of Powder Technology, Japan</pub><doi>10.4164/sptj.60.760</doi><tpages>8</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0386-6157 |
| ispartof | Journal of the Society of Powder Technology, Japan, 2023/12/10, Vol.60(12), pp.760-767 |
| issn | 0386-6157 1883-7239 |
| language | eng ; jpn |
| recordid | cdi_proquest_journals_2957003708 |
| source | J-STAGE Free; EZB-FREE-00999 freely available EZB journals |
| subjects | Absorption spectra Catalyst Catalysts Electron states EXAFS Fine structure Measurement methods Nanoclusters Structural analysis Surface structure Trace elements X ray absorption X-ray XAFS XANES |
| title | Surface Structure Analysis of Powder Catalysts by Means of XAFS |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-13T06%3A55%3A25IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Surface%20Structure%20Analysis%20of%20Powder%20Catalysts%20by%20Means%20of%20XAFS&rft.jtitle=Funtai%20Kogakkaishi&rft.au=Kubota,%20Takeshi&rft.date=2023-12-10&rft.volume=60&rft.issue=12&rft.spage=760&rft.epage=767&rft.pages=760-767&rft.artnum=60.760&rft.issn=0386-6157&rft.eissn=1883-7239&rft_id=info:doi/10.4164/sptj.60.760&rft_dat=%3Cproquest_cross%3E2957003708%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2957003708&rft_id=info:pmid/&rfr_iscdi=true |