Effect of High Temperature on the Performance of AlGaN/GaN T-Gate High-Electron Mobility Transistors With ~140-nm Gate Length
High temperature (HT) electronics applications will require the development of a broad range of devices made using different materials. Among these devices, high-electron mobility transistors (HEMTs) made with GaN and its alloys are attractive for high-power radio frequency (RF) applications. In thi...
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Veröffentlicht in: | IEEE transactions on electron devices 2024-03, Vol.71 (3), p.1805-1811 |
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Hauptverfasser: | , , , , , , , , , , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
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