Titanium dioxide ion-sensitive extended gate field effect transistor (ISEGFET): selective detection of potassium ions in artificial blood serum
Potassium ions ( K + ) are crucial for many physiological processes. Here we report on the use of a titanium dioxide (TiO 2 ) extended gate field effect transistor as an ion sensor (ISEGFET). We tested within its critical concentration range in artificial blood serum for this. The TiO 2 thin films w...
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creator | Al-Hardan, Naif H. Hamid, Muhammad Azmi Abdul Firdaus-Raih, Mohd Jalar, Azman Kamaruddin, Ain Zafirah Keng, Lim Kar AL-Khalqi, Ensaf Mohammed Ahmed, Naser M. |
description | Potassium ions (
K
+
) are crucial for many physiological processes. Here we report on the use of a titanium dioxide (TiO
2
) extended gate field effect transistor as an ion sensor (ISEGFET). We tested within its critical concentration range in artificial blood serum for this. The TiO
2
thin films were prepared via a solvothermal process over the conductive glass (coated with indium-tin oxide (ITO)). The prepared samples were tested by X-ray diffraction, Raman spectroscopy, for their phase structures, electron scanning microscopy, and X-ray photoelectron spectroscopy for their morphology and surface element contents. The TiO
2
/ITO samples were prepared as electrodes, and the threshold voltage and the drain – source current measurements were recorded against a reference electrode. The potential sensitivity of the electrodes was in the range 42 mV/pK – 47 mV/pK, and its current sensitivity was in the range 0.50–0.71 mA
1/2
/pK with K
+
concentration covers the range between 100 µM and 100 mM. The lower limit of detection was approximately 100 µM. The devices were tested in the concentration range of 3.5 mM–10 mM, where the potential sensitivity was recorded between 7.5 mV/mM and 10 mV/mM in artificial blood serum. The devices reveal a stable performance within two months. |
doi_str_mv | 10.1007/s10854-024-12068-8 |
format | Article |
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K
+
) are crucial for many physiological processes. Here we report on the use of a titanium dioxide (TiO
2
) extended gate field effect transistor as an ion sensor (ISEGFET). We tested within its critical concentration range in artificial blood serum for this. The TiO
2
thin films were prepared via a solvothermal process over the conductive glass (coated with indium-tin oxide (ITO)). The prepared samples were tested by X-ray diffraction, Raman spectroscopy, for their phase structures, electron scanning microscopy, and X-ray photoelectron spectroscopy for their morphology and surface element contents. The TiO
2
/ITO samples were prepared as electrodes, and the threshold voltage and the drain – source current measurements were recorded against a reference electrode. The potential sensitivity of the electrodes was in the range 42 mV/pK – 47 mV/pK, and its current sensitivity was in the range 0.50–0.71 mA
1/2
/pK with K
+
concentration covers the range between 100 µM and 100 mM. The lower limit of detection was approximately 100 µM. The devices were tested in the concentration range of 3.5 mM–10 mM, where the potential sensitivity was recorded between 7.5 mV/mM and 10 mV/mM in artificial blood serum. The devices reveal a stable performance within two months.</description><identifier>ISSN: 0957-4522</identifier><identifier>EISSN: 1573-482X</identifier><identifier>DOI: 10.1007/s10854-024-12068-8</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Blood ; Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Electrodes ; Field effect transistors ; Indium tin oxides ; Materials Science ; Optical and Electronic Materials ; Photoelectrons ; Potassium ; Raman spectroscopy ; Scanning microscopy ; Semiconductor devices ; Sensitivity ; Spectrum analysis ; Thin films ; Threshold voltage ; Titanium ; Titanium dioxide ; Transistors ; X ray photoelectron spectroscopy</subject><ispartof>Journal of materials science. Materials in electronics, 2024-02, Vol.35 (5), p.321, Article 321</ispartof><rights>The Author(s), under exclusive licence to Springer Science+Business Media, LLC, part of Springer Nature 2024. Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c270t-13cddfe1b6ecd41a1842bbb19982a00cce0b66bc24e88202df125621b85f4e2e3</cites><orcidid>0000-0001-7309-9660</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s10854-024-12068-8$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s10854-024-12068-8$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,41488,42557,51319</link.rule.ids></links><search><creatorcontrib>Al-Hardan, Naif H.</creatorcontrib><creatorcontrib>Hamid, Muhammad Azmi Abdul</creatorcontrib><creatorcontrib>Firdaus-Raih, Mohd</creatorcontrib><creatorcontrib>Jalar, Azman</creatorcontrib><creatorcontrib>Kamaruddin, Ain Zafirah</creatorcontrib><creatorcontrib>Keng, Lim Kar</creatorcontrib><creatorcontrib>AL-Khalqi, Ensaf Mohammed</creatorcontrib><creatorcontrib>Ahmed, Naser M.</creatorcontrib><title>Titanium dioxide ion-sensitive extended gate field effect transistor (ISEGFET): selective detection of potassium ions in artificial blood serum</title><title>Journal of materials science. Materials in electronics</title><addtitle>J Mater Sci: Mater Electron</addtitle><description>Potassium ions (
K
+
) are crucial for many physiological processes. Here we report on the use of a titanium dioxide (TiO
2
) extended gate field effect transistor as an ion sensor (ISEGFET). We tested within its critical concentration range in artificial blood serum for this. The TiO
2
thin films were prepared via a solvothermal process over the conductive glass (coated with indium-tin oxide (ITO)). The prepared samples were tested by X-ray diffraction, Raman spectroscopy, for their phase structures, electron scanning microscopy, and X-ray photoelectron spectroscopy for their morphology and surface element contents. The TiO
2
/ITO samples were prepared as electrodes, and the threshold voltage and the drain – source current measurements were recorded against a reference electrode. The potential sensitivity of the electrodes was in the range 42 mV/pK – 47 mV/pK, and its current sensitivity was in the range 0.50–0.71 mA
1/2
/pK with K
+
concentration covers the range between 100 µM and 100 mM. The lower limit of detection was approximately 100 µM. The devices were tested in the concentration range of 3.5 mM–10 mM, where the potential sensitivity was recorded between 7.5 mV/mM and 10 mV/mM in artificial blood serum. The devices reveal a stable performance within two months.</description><subject>Blood</subject><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Electrodes</subject><subject>Field effect transistors</subject><subject>Indium tin oxides</subject><subject>Materials Science</subject><subject>Optical and Electronic Materials</subject><subject>Photoelectrons</subject><subject>Potassium</subject><subject>Raman spectroscopy</subject><subject>Scanning microscopy</subject><subject>Semiconductor devices</subject><subject>Sensitivity</subject><subject>Spectrum analysis</subject><subject>Thin films</subject><subject>Threshold voltage</subject><subject>Titanium</subject><subject>Titanium dioxide</subject><subject>Transistors</subject><subject>X ray photoelectron spectroscopy</subject><issn>0957-4522</issn><issn>1573-482X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><recordid>eNp9kMFqHDEQREVwIGsnP5CTIJfkILvVo5nV5BaMYxsMPsSB3IRGahmZ2dFG0gb7K_LL1mYDvvnUTXe9KijGPko4lQDrsyJB90oAKiERBi30G7aS_boTSuOvI7aCsV8L1SO-Y8elPADAoDq9Yn_vYrVL3G24j-kxeuIxLaLQUmKNf4jTY6XFk-f3thIPkWbPKQRylddsm6rUlPnn6x8Xl98v7r585YXm9tyjnup-SwtPgW9TtaXsc9qh8Lhwm2sM0UU782lOyTcy7zbv2dtg50If_s8T9rP5nl-Jm9vL6_NvN8LhGqqQnfM-kJwGcl5JK7XCaZrkOGq0AM4RTMMwOVSkNQL6ILEfUE66D4qQuhP26eC7zen3jko1D2mXlxZpcMS-1xrGoanwoHI5lZIpmG2OG5ufjASzL94cijetePOveKMb1B2g0sTLPeUX61eoZ8mFiOo</recordid><startdate>20240201</startdate><enddate>20240201</enddate><creator>Al-Hardan, Naif H.</creator><creator>Hamid, Muhammad Azmi Abdul</creator><creator>Firdaus-Raih, Mohd</creator><creator>Jalar, Azman</creator><creator>Kamaruddin, Ain Zafirah</creator><creator>Keng, Lim Kar</creator><creator>AL-Khalqi, Ensaf Mohammed</creator><creator>Ahmed, Naser M.</creator><general>Springer US</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>JG9</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0001-7309-9660</orcidid></search><sort><creationdate>20240201</creationdate><title>Titanium dioxide ion-sensitive extended gate field effect transistor (ISEGFET): selective detection of potassium ions in artificial blood serum</title><author>Al-Hardan, Naif H. ; Hamid, Muhammad Azmi Abdul ; Firdaus-Raih, Mohd ; Jalar, Azman ; Kamaruddin, Ain Zafirah ; Keng, Lim Kar ; AL-Khalqi, Ensaf Mohammed ; Ahmed, Naser M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c270t-13cddfe1b6ecd41a1842bbb19982a00cce0b66bc24e88202df125621b85f4e2e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><topic>Blood</topic><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Electrodes</topic><topic>Field effect transistors</topic><topic>Indium tin oxides</topic><topic>Materials Science</topic><topic>Optical and Electronic Materials</topic><topic>Photoelectrons</topic><topic>Potassium</topic><topic>Raman spectroscopy</topic><topic>Scanning microscopy</topic><topic>Semiconductor devices</topic><topic>Sensitivity</topic><topic>Spectrum analysis</topic><topic>Thin films</topic><topic>Threshold voltage</topic><topic>Titanium</topic><topic>Titanium dioxide</topic><topic>Transistors</topic><topic>X ray photoelectron spectroscopy</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Al-Hardan, Naif H.</creatorcontrib><creatorcontrib>Hamid, Muhammad Azmi Abdul</creatorcontrib><creatorcontrib>Firdaus-Raih, Mohd</creatorcontrib><creatorcontrib>Jalar, Azman</creatorcontrib><creatorcontrib>Kamaruddin, Ain Zafirah</creatorcontrib><creatorcontrib>Keng, Lim Kar</creatorcontrib><creatorcontrib>AL-Khalqi, Ensaf Mohammed</creatorcontrib><creatorcontrib>Ahmed, Naser M.</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of materials science. Materials in electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Al-Hardan, Naif H.</au><au>Hamid, Muhammad Azmi Abdul</au><au>Firdaus-Raih, Mohd</au><au>Jalar, Azman</au><au>Kamaruddin, Ain Zafirah</au><au>Keng, Lim Kar</au><au>AL-Khalqi, Ensaf Mohammed</au><au>Ahmed, Naser M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Titanium dioxide ion-sensitive extended gate field effect transistor (ISEGFET): selective detection of potassium ions in artificial blood serum</atitle><jtitle>Journal of materials science. Materials in electronics</jtitle><stitle>J Mater Sci: Mater Electron</stitle><date>2024-02-01</date><risdate>2024</risdate><volume>35</volume><issue>5</issue><spage>321</spage><pages>321-</pages><artnum>321</artnum><issn>0957-4522</issn><eissn>1573-482X</eissn><abstract>Potassium ions (
K
+
) are crucial for many physiological processes. Here we report on the use of a titanium dioxide (TiO
2
) extended gate field effect transistor as an ion sensor (ISEGFET). We tested within its critical concentration range in artificial blood serum for this. The TiO
2
thin films were prepared via a solvothermal process over the conductive glass (coated with indium-tin oxide (ITO)). The prepared samples were tested by X-ray diffraction, Raman spectroscopy, for their phase structures, electron scanning microscopy, and X-ray photoelectron spectroscopy for their morphology and surface element contents. The TiO
2
/ITO samples were prepared as electrodes, and the threshold voltage and the drain – source current measurements were recorded against a reference electrode. The potential sensitivity of the electrodes was in the range 42 mV/pK – 47 mV/pK, and its current sensitivity was in the range 0.50–0.71 mA
1/2
/pK with K
+
concentration covers the range between 100 µM and 100 mM. The lower limit of detection was approximately 100 µM. The devices were tested in the concentration range of 3.5 mM–10 mM, where the potential sensitivity was recorded between 7.5 mV/mM and 10 mV/mM in artificial blood serum. The devices reveal a stable performance within two months.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s10854-024-12068-8</doi><orcidid>https://orcid.org/0000-0001-7309-9660</orcidid></addata></record> |
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subjects | Blood Characterization and Evaluation of Materials Chemistry and Materials Science Electrodes Field effect transistors Indium tin oxides Materials Science Optical and Electronic Materials Photoelectrons Potassium Raman spectroscopy Scanning microscopy Semiconductor devices Sensitivity Spectrum analysis Thin films Threshold voltage Titanium Titanium dioxide Transistors X ray photoelectron spectroscopy |
title | Titanium dioxide ion-sensitive extended gate field effect transistor (ISEGFET): selective detection of potassium ions in artificial blood serum |
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