Theoretical study of built-in-polarization effect on relaxation time and mean free path of phonons in AlxGa1−xN alloy

In this article we have investigated theoretically the effect of built-in-polarization field on various phonon scattering mechanisms in Al x Ga 1−x N alloy. The built-in-polarization field of Al x Ga 1−x N modifies the elastic constant, group velocity of phonons and Debye temperature. As a result, v...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Bulletin of materials science 2016-12, Vol.39 (7), p.1835-1841
Hauptverfasser: SAHOO, B K, PANSARI, A
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 1841
container_issue 7
container_start_page 1835
container_title Bulletin of materials science
container_volume 39
creator SAHOO, B K
PANSARI, A
description In this article we have investigated theoretically the effect of built-in-polarization field on various phonon scattering mechanisms in Al x Ga 1−x N alloy. The built-in-polarization field of Al x Ga 1−x N modifies the elastic constant, group velocity of phonons and Debye temperature. As a result, various phonon scattering mechanisms are changed. Important phonon scattering mechanisms such as normal scattering, Umklapp scattering, point defect scattering, dislocation scattering and phonon–electron scattering processes have been considered in the computation. The combined relaxation time due to above-mentioned scattering mechanisms has also been computed as a function of phonon frequency for various Al compositions at room temperature. It is found that combined relaxation time is enhanced due to built-in-polarization effect and makes phonon mean free path longer, which is required for higher optical, electrical and thermal transport processes. The result can be used to determine the effect of built-in-polarization field on optical and thermal properties of Al x Ga 1−x N and will be useful, particularly, for improvement of thermoelectric performance of Al x Ga 1−x N alloy through polarization engineering.
doi_str_mv 10.1007/s12034-016-1319-3
format Article
fullrecord <record><control><sourceid>proquest_sprin</sourceid><recordid>TN_cdi_proquest_journals_2919967059</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2919967059</sourcerecordid><originalsourceid>FETCH-LOGICAL-p1413-dc39be31bf9ec2ecfe525b47412a1387e2615a8c6a019d21398ed7b0e4e8f8aa3</originalsourceid><addsrcrecordid>eNpFkEFOwzAQRSMEEqVwAHaWWBs8dhLHy6qCglTBpqwjJxlTV6kdHEe0nIA1R-QkpCoSq_kaPf3RvCS5BnYLjMm7HjgTKWWQUxCgqDhJJkxJQWWeq9Mx84zRVDJ5nlz0_YYxUGkKk-RjtUYfMNpat6SPQ7Mn3pBqsG2k1tHOtzrYTx2tdwSNwTqSMQVs9e64jHaLRLuGbFE7YgIi6XRcH1q6tXfe9cQ6Mmt3Cw0_X9-7Z6Lb1u8vkzOj2x6v_uY0eX24X80f6fJl8TSfLWkHKQja1EJVKKAyCmuOtcGMZ1UqU-AaRCGR55Dpos71-FDDQagCG1kxTLEwhdZimtwce7vg3wfsY7nxQ3DjyZIrUCqXLFMjxY9U3wXr3jD8U8DKg-DyKLgcBZcHwaUQv9EScGk</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2919967059</pqid></control><display><type>article</type><title>Theoretical study of built-in-polarization effect on relaxation time and mean free path of phonons in AlxGa1−xN alloy</title><source>Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals</source><source>Indian Academy of Sciences</source><source>ProQuest Central UK/Ireland</source><source>Free Full-Text Journals in Chemistry</source><source>SpringerLink Journals - AutoHoldings</source><source>ProQuest Central</source><creator>SAHOO, B K ; PANSARI, A</creator><creatorcontrib>SAHOO, B K ; PANSARI, A</creatorcontrib><description>In this article we have investigated theoretically the effect of built-in-polarization field on various phonon scattering mechanisms in Al x Ga 1−x N alloy. The built-in-polarization field of Al x Ga 1−x N modifies the elastic constant, group velocity of phonons and Debye temperature. As a result, various phonon scattering mechanisms are changed. Important phonon scattering mechanisms such as normal scattering, Umklapp scattering, point defect scattering, dislocation scattering and phonon–electron scattering processes have been considered in the computation. The combined relaxation time due to above-mentioned scattering mechanisms has also been computed as a function of phonon frequency for various Al compositions at room temperature. It is found that combined relaxation time is enhanced due to built-in-polarization effect and makes phonon mean free path longer, which is required for higher optical, electrical and thermal transport processes. The result can be used to determine the effect of built-in-polarization field on optical and thermal properties of Al x Ga 1−x N and will be useful, particularly, for improvement of thermoelectric performance of Al x Ga 1−x N alloy through polarization engineering.</description><identifier>ISSN: 0250-4707</identifier><identifier>EISSN: 0973-7669</identifier><identifier>DOI: 10.1007/s12034-016-1319-3</identifier><language>eng</language><publisher>Bangalore, India: Indian Academy of Sciences</publisher><subject>Alloys ; Chemistry and Materials Science ; Debye temperature ; Efficiency ; Elastic properties ; Electric fields ; Engineering ; Group velocity ; Heat conductivity ; Influence ; Interfaces ; Lasers ; Light emitting diodes ; Materials Science ; Mean free path ; Microwave communications ; Optical properties ; Phonons ; Point defects ; Polarization ; Relaxation time ; Room temperature ; Scattering ; Semiconductors ; Thermodynamic properties ; Transistors ; Velocity</subject><ispartof>Bulletin of materials science, 2016-12, Vol.39 (7), p.1835-1841</ispartof><rights>Indian Academy of Sciences 2016</rights><rights>Indian Academy of Sciences 2016.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://www.proquest.com/docview/2919967059/fulltextPDF?pq-origsite=primo$$EPDF$$P50$$Gproquest$$H</linktopdf><linktohtml>$$Uhttps://www.proquest.com/docview/2919967059?pq-origsite=primo$$EHTML$$P50$$Gproquest$$H</linktohtml><link.rule.ids>314,780,784,21388,27924,27925,33744,41488,42557,43805,51319,64385,64389,72469,74302</link.rule.ids></links><search><creatorcontrib>SAHOO, B K</creatorcontrib><creatorcontrib>PANSARI, A</creatorcontrib><title>Theoretical study of built-in-polarization effect on relaxation time and mean free path of phonons in AlxGa1−xN alloy</title><title>Bulletin of materials science</title><addtitle>Bull Mater Sci</addtitle><description>In this article we have investigated theoretically the effect of built-in-polarization field on various phonon scattering mechanisms in Al x Ga 1−x N alloy. The built-in-polarization field of Al x Ga 1−x N modifies the elastic constant, group velocity of phonons and Debye temperature. As a result, various phonon scattering mechanisms are changed. Important phonon scattering mechanisms such as normal scattering, Umklapp scattering, point defect scattering, dislocation scattering and phonon–electron scattering processes have been considered in the computation. The combined relaxation time due to above-mentioned scattering mechanisms has also been computed as a function of phonon frequency for various Al compositions at room temperature. It is found that combined relaxation time is enhanced due to built-in-polarization effect and makes phonon mean free path longer, which is required for higher optical, electrical and thermal transport processes. The result can be used to determine the effect of built-in-polarization field on optical and thermal properties of Al x Ga 1−x N and will be useful, particularly, for improvement of thermoelectric performance of Al x Ga 1−x N alloy through polarization engineering.</description><subject>Alloys</subject><subject>Chemistry and Materials Science</subject><subject>Debye temperature</subject><subject>Efficiency</subject><subject>Elastic properties</subject><subject>Electric fields</subject><subject>Engineering</subject><subject>Group velocity</subject><subject>Heat conductivity</subject><subject>Influence</subject><subject>Interfaces</subject><subject>Lasers</subject><subject>Light emitting diodes</subject><subject>Materials Science</subject><subject>Mean free path</subject><subject>Microwave communications</subject><subject>Optical properties</subject><subject>Phonons</subject><subject>Point defects</subject><subject>Polarization</subject><subject>Relaxation time</subject><subject>Room temperature</subject><subject>Scattering</subject><subject>Semiconductors</subject><subject>Thermodynamic properties</subject><subject>Transistors</subject><subject>Velocity</subject><issn>0250-4707</issn><issn>0973-7669</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><sourceid>AFKRA</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNpFkEFOwzAQRSMEEqVwAHaWWBs8dhLHy6qCglTBpqwjJxlTV6kdHEe0nIA1R-QkpCoSq_kaPf3RvCS5BnYLjMm7HjgTKWWQUxCgqDhJJkxJQWWeq9Mx84zRVDJ5nlz0_YYxUGkKk-RjtUYfMNpat6SPQ7Mn3pBqsG2k1tHOtzrYTx2tdwSNwTqSMQVs9e64jHaLRLuGbFE7YgIi6XRcH1q6tXfe9cQ6Mmt3Cw0_X9-7Z6Lb1u8vkzOj2x6v_uY0eX24X80f6fJl8TSfLWkHKQja1EJVKKAyCmuOtcGMZ1UqU-AaRCGR55Dpos71-FDDQagCG1kxTLEwhdZimtwce7vg3wfsY7nxQ3DjyZIrUCqXLFMjxY9U3wXr3jD8U8DKg-DyKLgcBZcHwaUQv9EScGk</recordid><startdate>20161201</startdate><enddate>20161201</enddate><creator>SAHOO, B K</creator><creator>PANSARI, A</creator><general>Indian Academy of Sciences</general><general>Springer Nature B.V</general><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>KB.</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope></search><sort><creationdate>20161201</creationdate><title>Theoretical study of built-in-polarization effect on relaxation time and mean free path of phonons in AlxGa1−xN alloy</title><author>SAHOO, B K ; PANSARI, A</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p1413-dc39be31bf9ec2ecfe525b47412a1387e2615a8c6a019d21398ed7b0e4e8f8aa3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><topic>Alloys</topic><topic>Chemistry and Materials Science</topic><topic>Debye temperature</topic><topic>Efficiency</topic><topic>Elastic properties</topic><topic>Electric fields</topic><topic>Engineering</topic><topic>Group velocity</topic><topic>Heat conductivity</topic><topic>Influence</topic><topic>Interfaces</topic><topic>Lasers</topic><topic>Light emitting diodes</topic><topic>Materials Science</topic><topic>Mean free path</topic><topic>Microwave communications</topic><topic>Optical properties</topic><topic>Phonons</topic><topic>Point defects</topic><topic>Polarization</topic><topic>Relaxation time</topic><topic>Room temperature</topic><topic>Scattering</topic><topic>Semiconductors</topic><topic>Thermodynamic properties</topic><topic>Transistors</topic><topic>Velocity</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>SAHOO, B K</creatorcontrib><creatorcontrib>PANSARI, A</creatorcontrib><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science &amp; Engineering Collection</collection><collection>ProQuest Central UK/Ireland</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>SciTech Premium Collection</collection><collection>Materials Research Database</collection><collection>Materials Science Database</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><jtitle>Bulletin of materials science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>SAHOO, B K</au><au>PANSARI, A</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Theoretical study of built-in-polarization effect on relaxation time and mean free path of phonons in AlxGa1−xN alloy</atitle><jtitle>Bulletin of materials science</jtitle><stitle>Bull Mater Sci</stitle><date>2016-12-01</date><risdate>2016</risdate><volume>39</volume><issue>7</issue><spage>1835</spage><epage>1841</epage><pages>1835-1841</pages><issn>0250-4707</issn><eissn>0973-7669</eissn><abstract>In this article we have investigated theoretically the effect of built-in-polarization field on various phonon scattering mechanisms in Al x Ga 1−x N alloy. The built-in-polarization field of Al x Ga 1−x N modifies the elastic constant, group velocity of phonons and Debye temperature. As a result, various phonon scattering mechanisms are changed. Important phonon scattering mechanisms such as normal scattering, Umklapp scattering, point defect scattering, dislocation scattering and phonon–electron scattering processes have been considered in the computation. The combined relaxation time due to above-mentioned scattering mechanisms has also been computed as a function of phonon frequency for various Al compositions at room temperature. It is found that combined relaxation time is enhanced due to built-in-polarization effect and makes phonon mean free path longer, which is required for higher optical, electrical and thermal transport processes. The result can be used to determine the effect of built-in-polarization field on optical and thermal properties of Al x Ga 1−x N and will be useful, particularly, for improvement of thermoelectric performance of Al x Ga 1−x N alloy through polarization engineering.</abstract><cop>Bangalore, India</cop><pub>Indian Academy of Sciences</pub><doi>10.1007/s12034-016-1319-3</doi><tpages>7</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0250-4707
ispartof Bulletin of materials science, 2016-12, Vol.39 (7), p.1835-1841
issn 0250-4707
0973-7669
language eng
recordid cdi_proquest_journals_2919967059
source Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals; Indian Academy of Sciences; ProQuest Central UK/Ireland; Free Full-Text Journals in Chemistry; SpringerLink Journals - AutoHoldings; ProQuest Central
subjects Alloys
Chemistry and Materials Science
Debye temperature
Efficiency
Elastic properties
Electric fields
Engineering
Group velocity
Heat conductivity
Influence
Interfaces
Lasers
Light emitting diodes
Materials Science
Mean free path
Microwave communications
Optical properties
Phonons
Point defects
Polarization
Relaxation time
Room temperature
Scattering
Semiconductors
Thermodynamic properties
Transistors
Velocity
title Theoretical study of built-in-polarization effect on relaxation time and mean free path of phonons in AlxGa1−xN alloy
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-06T14%3A11%3A26IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_sprin&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Theoretical%20study%20of%20built-in-polarization%20effect%20on%20relaxation%20time%20and%20mean%20free%20path%20of%20phonons%20in%20AlxGa1%E2%88%92xN%20alloy&rft.jtitle=Bulletin%20of%20materials%20science&rft.au=SAHOO,%20B%20K&rft.date=2016-12-01&rft.volume=39&rft.issue=7&rft.spage=1835&rft.epage=1841&rft.pages=1835-1841&rft.issn=0250-4707&rft.eissn=0973-7669&rft_id=info:doi/10.1007/s12034-016-1319-3&rft_dat=%3Cproquest_sprin%3E2919967059%3C/proquest_sprin%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2919967059&rft_id=info:pmid/&rfr_iscdi=true