Does Circulation in Individual Current States Survive in the Total Current Density?
We describe the two-dimensional simulation of a bent resonant tunneling diode structure which displays vortices in its total current density pattern over a range of applied bias. In contrast, a double gate n-MOSFET is shown where such circulation exists in individual subband states but does not surv...
Gespeichert in:
Veröffentlicht in: | Journal of computational electronics 2003-12, Vol.2 (2-4), p.105-108 |
---|---|
Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 108 |
---|---|
container_issue | 2-4 |
container_start_page | 105 |
container_title | Journal of computational electronics |
container_volume | 2 |
creator | Laux, S.E. Kumar, A. Fischetti, M.V. |
description | We describe the two-dimensional simulation of a bent resonant tunneling diode structure which displays vortices in its total current density pattern over a range of applied bias. In contrast, a double gate n-MOSFET is shown where such circulation exists in individual subband states but does not survive in the total current density solution. Both devices are simulated assuming ballistic quantum transport in Si at 300 K. |
doi_str_mv | 10.1023/B:JCEL.0000011407.24435.d9 |
format | Article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2918257435</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2918257435</sourcerecordid><originalsourceid>FETCH-LOGICAL-c289t-fb0a53375c8d7c831db66e692316700c5e12478b88f583c58291baab4ac511a23</originalsourceid><addsrcrecordid>eNpN0EFLwzAUwPEgCs7pdyh6bs1LmibdRVw3dTLwsHkOaZpixmxnkhb27W2doLm8HH68B3-EbgEngAm9n89ei-U6weMDSDFPSJpSllT5GZoA4yQWQPn5-M_yWGDCLtGV9zuMCSYpTNBm0RofFdbpbq-CbZvINtGqqWxvq07to6JzzjQh2gQVBrjpXG97M6LwYaJtG_6ZhWm8DceHa3RRq703N79zit6fltviJV6_Pa-Kx3WsichDXJdYMUo506LiWlCoyiwzWU4oZBxjzQyQlItSiJoJqpkgOZRKlanSDEAROkV3p70H1351xge5azvXDCflQAVhfEgxqNlJadd670wtD85-KneUgOUYUc7lGFH-RZQ_EWWV029C02Uw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2918257435</pqid></control><display><type>article</type><title>Does Circulation in Individual Current States Survive in the Total Current Density?</title><source>Springer Nature - Complete Springer Journals</source><source>ProQuest Central</source><creator>Laux, S.E. ; Kumar, A. ; Fischetti, M.V.</creator><creatorcontrib>Laux, S.E. ; Kumar, A. ; Fischetti, M.V.</creatorcontrib><description>We describe the two-dimensional simulation of a bent resonant tunneling diode structure which displays vortices in its total current density pattern over a range of applied bias. In contrast, a double gate n-MOSFET is shown where such circulation exists in individual subband states but does not survive in the total current density solution. Both devices are simulated assuming ballistic quantum transport in Si at 300 K.</description><identifier>ISSN: 1569-8025</identifier><identifier>EISSN: 1572-8137</identifier><identifier>DOI: 10.1023/B:JCEL.0000011407.24435.d9</identifier><language>eng</language><publisher>Dordrecht: Springer Nature B.V</publisher><subject>Current density ; Quantum transport ; Resonant tunneling ; Tunnel diodes</subject><ispartof>Journal of computational electronics, 2003-12, Vol.2 (2-4), p.105-108</ispartof><rights>Kluwer Academic Publishers 2003.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c289t-fb0a53375c8d7c831db66e692316700c5e12478b88f583c58291baab4ac511a23</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.proquest.com/docview/2918257435?pq-origsite=primo$$EHTML$$P50$$Gproquest$$H</linktohtml><link.rule.ids>314,776,780,21367,27901,27902,33721,43781</link.rule.ids></links><search><creatorcontrib>Laux, S.E.</creatorcontrib><creatorcontrib>Kumar, A.</creatorcontrib><creatorcontrib>Fischetti, M.V.</creatorcontrib><title>Does Circulation in Individual Current States Survive in the Total Current Density?</title><title>Journal of computational electronics</title><description>We describe the two-dimensional simulation of a bent resonant tunneling diode structure which displays vortices in its total current density pattern over a range of applied bias. In contrast, a double gate n-MOSFET is shown where such circulation exists in individual subband states but does not survive in the total current density solution. Both devices are simulated assuming ballistic quantum transport in Si at 300 K.</description><subject>Current density</subject><subject>Quantum transport</subject><subject>Resonant tunneling</subject><subject>Tunnel diodes</subject><issn>1569-8025</issn><issn>1572-8137</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2003</creationdate><recordtype>article</recordtype><sourceid>BENPR</sourceid><recordid>eNpN0EFLwzAUwPEgCs7pdyh6bs1LmibdRVw3dTLwsHkOaZpixmxnkhb27W2doLm8HH68B3-EbgEngAm9n89ei-U6weMDSDFPSJpSllT5GZoA4yQWQPn5-M_yWGDCLtGV9zuMCSYpTNBm0RofFdbpbq-CbZvINtGqqWxvq07to6JzzjQh2gQVBrjpXG97M6LwYaJtG_6ZhWm8DceHa3RRq703N79zit6fltviJV6_Pa-Kx3WsichDXJdYMUo506LiWlCoyiwzWU4oZBxjzQyQlItSiJoJqpkgOZRKlanSDEAROkV3p70H1351xge5azvXDCflQAVhfEgxqNlJadd670wtD85-KneUgOUYUc7lGFH-RZQ_EWWV029C02Uw</recordid><startdate>200312</startdate><enddate>200312</enddate><creator>Laux, S.E.</creator><creator>Kumar, A.</creator><creator>Fischetti, M.V.</creator><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>JQ2</scope><scope>K7-</scope><scope>L6V</scope><scope>M7S</scope><scope>P5Z</scope><scope>P62</scope><scope>PHGZM</scope><scope>PHGZT</scope><scope>PKEHL</scope><scope>PQEST</scope><scope>PQGLB</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PTHSS</scope></search><sort><creationdate>200312</creationdate><title>Does Circulation in Individual Current States Survive in the Total Current Density?</title><author>Laux, S.E. ; Kumar, A. ; Fischetti, M.V.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c289t-fb0a53375c8d7c831db66e692316700c5e12478b88f583c58291baab4ac511a23</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2003</creationdate><topic>Current density</topic><topic>Quantum transport</topic><topic>Resonant tunneling</topic><topic>Tunnel diodes</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Laux, S.E.</creatorcontrib><creatorcontrib>Kumar, A.</creatorcontrib><creatorcontrib>Fischetti, M.V.</creatorcontrib><collection>CrossRef</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Computer Science Collection</collection><collection>Computer Science Database</collection><collection>ProQuest Engineering Collection</collection><collection>Engineering Database</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central (New)</collection><collection>ProQuest One Academic (New)</collection><collection>ProQuest One Academic Middle East (New)</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Applied & Life Sciences</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>Engineering Collection</collection><jtitle>Journal of computational electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Laux, S.E.</au><au>Kumar, A.</au><au>Fischetti, M.V.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Does Circulation in Individual Current States Survive in the Total Current Density?</atitle><jtitle>Journal of computational electronics</jtitle><date>2003-12</date><risdate>2003</risdate><volume>2</volume><issue>2-4</issue><spage>105</spage><epage>108</epage><pages>105-108</pages><issn>1569-8025</issn><eissn>1572-8137</eissn><abstract>We describe the two-dimensional simulation of a bent resonant tunneling diode structure which displays vortices in its total current density pattern over a range of applied bias. In contrast, a double gate n-MOSFET is shown where such circulation exists in individual subband states but does not survive in the total current density solution. Both devices are simulated assuming ballistic quantum transport in Si at 300 K.</abstract><cop>Dordrecht</cop><pub>Springer Nature B.V</pub><doi>10.1023/B:JCEL.0000011407.24435.d9</doi><tpages>4</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 1569-8025 |
ispartof | Journal of computational electronics, 2003-12, Vol.2 (2-4), p.105-108 |
issn | 1569-8025 1572-8137 |
language | eng |
recordid | cdi_proquest_journals_2918257435 |
source | Springer Nature - Complete Springer Journals; ProQuest Central |
subjects | Current density Quantum transport Resonant tunneling Tunnel diodes |
title | Does Circulation in Individual Current States Survive in the Total Current Density? |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-21T17%3A10%3A53IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Does%20Circulation%20in%20Individual%20Current%20States%20Survive%20in%20the%20Total%20Current%20Density?&rft.jtitle=Journal%20of%20computational%20electronics&rft.au=Laux,%20S.E.&rft.date=2003-12&rft.volume=2&rft.issue=2-4&rft.spage=105&rft.epage=108&rft.pages=105-108&rft.issn=1569-8025&rft.eissn=1572-8137&rft_id=info:doi/10.1023/B:JCEL.0000011407.24435.d9&rft_dat=%3Cproquest_cross%3E2918257435%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2918257435&rft_id=info:pmid/&rfr_iscdi=true |