An Integrated Surface Plasmonic TE-Pass Polarizer on a Silica-on-Silicon Waveguide
We report an integrated implementation of a surface plasmonic TE-pass polarizer on a silica-on-silicon waveguide. The effect of waveguide width and length on polarization extinction ratio (PER) were investigated. For a 10 mm device, PER in excess of 48 dB with TE mode loss of approximately 0.8 dB wa...
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| Veröffentlicht in: | IEEE photonics technology letters 2024-02, Vol.36 (4), p.278-281 |
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| container_title | IEEE photonics technology letters |
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| creator | Shen, Heliang She, Xuan Huang, Fei Fan, Wen Liu, Hongshuo Chen, Kan Bi, Ran Wang, Lei Shu, Xiaowu |
| description | We report an integrated implementation of a surface plasmonic TE-pass polarizer on a silica-on-silicon waveguide. The effect of waveguide width and length on polarization extinction ratio (PER) were investigated. For a 10 mm device, PER in excess of 48 dB with TE mode loss of approximately 0.8 dB was recorded. In addition, we experimentally demonstrate a wavelength dependence of PER smaller than 3 dB with a width of 5.5-[Formula Omitted] device over the C band from 1520–1580 nm. We also present a theoretical analysis and numerical simulation of this architecture that are in good agreement with each other and the experimental results. By improving the fabrication process and PER measurement method, over 60 dB PER and less 0.1 dB TE mode loss can be obtained for a 10 mm polarizer according to our model, which is expected to be widely applicated in sensors such as optical gyroscopes. |
| doi_str_mv | 10.1109/LPT.2024.3351698 |
| format | Article |
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The effect of waveguide width and length on polarization extinction ratio (PER) were investigated. For a 10 mm device, PER in excess of 48 dB with TE mode loss of approximately 0.8 dB was recorded. In addition, we experimentally demonstrate a wavelength dependence of PER smaller than 3 dB with a width of 5.5-[Formula Omitted] device over the C band from 1520–1580 nm. We also present a theoretical analysis and numerical simulation of this architecture that are in good agreement with each other and the experimental results. By improving the fabrication process and PER measurement method, over 60 dB PER and less 0.1 dB TE mode loss can be obtained for a 10 mm polarizer according to our model, which is expected to be widely applicated in sensors such as optical gyroscopes.</description><identifier>ISSN: 1041-1135</identifier><identifier>EISSN: 1941-0174</identifier><identifier>DOI: 10.1109/LPT.2024.3351698</identifier><language>eng</language><publisher>New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</publisher><subject>C band ; Mathematical models ; Measurement methods ; Optical gyroscopes ; Plasmonics ; Polarizers ; Silicon dioxide ; Waveguides</subject><ispartof>IEEE photonics technology letters, 2024-02, Vol.36 (4), p.278-281</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. 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The effect of waveguide width and length on polarization extinction ratio (PER) were investigated. For a 10 mm device, PER in excess of 48 dB with TE mode loss of approximately 0.8 dB was recorded. In addition, we experimentally demonstrate a wavelength dependence of PER smaller than 3 dB with a width of 5.5-[Formula Omitted] device over the C band from 1520–1580 nm. We also present a theoretical analysis and numerical simulation of this architecture that are in good agreement with each other and the experimental results. By improving the fabrication process and PER measurement method, over 60 dB PER and less 0.1 dB TE mode loss can be obtained for a 10 mm polarizer according to our model, which is expected to be widely applicated in sensors such as optical gyroscopes.</description><subject>C band</subject><subject>Mathematical models</subject><subject>Measurement methods</subject><subject>Optical gyroscopes</subject><subject>Plasmonics</subject><subject>Polarizers</subject><subject>Silicon dioxide</subject><subject>Waveguides</subject><issn>1041-1135</issn><issn>1941-0174</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><recordid>eNotkE1LAzEURYMoWKt7lwHXqfmadLIspWqh4GArLsNLmilTppOazAj66422q3e4XO6Dg9A9oxPGqH5cVZsJp1xOhCiY0uUFGjEtGaFsKi8z08yMieIa3aS0p5TJQsgRept1eNn1fheh91u8HmINzuOqhXQIXePwZkEqSAlXoYXY_PiIQ4cBr5u2cUBCR_4pZx_w5XdDs_W36KqGNvm78x2j96fFZv5CVq_Py_lsRRznsieKclVa67ykToHVWgnplQIxVSCtB-lcra2CUhUsRyApL7itraunTm2FEmP0cNo9xvA5-NSbfRhil18arllJeamZyC16arkYUoq-NsfYHCB-G0bNnzmTzZk_c-ZsTvwCpl1gZg</recordid><startdate>20240215</startdate><enddate>20240215</enddate><creator>Shen, Heliang</creator><creator>She, Xuan</creator><creator>Huang, Fei</creator><creator>Fan, Wen</creator><creator>Liu, Hongshuo</creator><creator>Chen, Kan</creator><creator>Bi, Ran</creator><creator>Wang, Lei</creator><creator>Shu, Xiaowu</creator><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0002-2098-5631</orcidid><orcidid>https://orcid.org/0000-0002-0102-2012</orcidid><orcidid>https://orcid.org/0000-0002-9335-3598</orcidid><orcidid>https://orcid.org/0000-0002-4839-1691</orcidid><orcidid>https://orcid.org/0000-0002-9378-2165</orcidid></search><sort><creationdate>20240215</creationdate><title>An Integrated Surface Plasmonic TE-Pass Polarizer on a Silica-on-Silicon Waveguide</title><author>Shen, Heliang ; She, Xuan ; Huang, Fei ; Fan, Wen ; Liu, Hongshuo ; Chen, Kan ; Bi, Ran ; Wang, Lei ; Shu, Xiaowu</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c224t-60268bbce40c6ab99634e66a376a4bea4ccf9b6a865176aa40252bfbcf7c6d363</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><topic>C band</topic><topic>Mathematical models</topic><topic>Measurement methods</topic><topic>Optical gyroscopes</topic><topic>Plasmonics</topic><topic>Polarizers</topic><topic>Silicon dioxide</topic><topic>Waveguides</topic><toplevel>online_resources</toplevel><creatorcontrib>Shen, Heliang</creatorcontrib><creatorcontrib>She, Xuan</creatorcontrib><creatorcontrib>Huang, Fei</creatorcontrib><creatorcontrib>Fan, Wen</creatorcontrib><creatorcontrib>Liu, Hongshuo</creatorcontrib><creatorcontrib>Chen, Kan</creatorcontrib><creatorcontrib>Bi, Ran</creatorcontrib><creatorcontrib>Wang, Lei</creatorcontrib><creatorcontrib>Shu, Xiaowu</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE photonics technology letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Shen, Heliang</au><au>She, Xuan</au><au>Huang, Fei</au><au>Fan, Wen</au><au>Liu, Hongshuo</au><au>Chen, Kan</au><au>Bi, Ran</au><au>Wang, Lei</au><au>Shu, Xiaowu</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>An Integrated Surface Plasmonic TE-Pass Polarizer on a Silica-on-Silicon Waveguide</atitle><jtitle>IEEE photonics technology letters</jtitle><date>2024-02-15</date><risdate>2024</risdate><volume>36</volume><issue>4</issue><spage>278</spage><epage>281</epage><pages>278-281</pages><issn>1041-1135</issn><eissn>1941-0174</eissn><abstract>We report an integrated implementation of a surface plasmonic TE-pass polarizer on a silica-on-silicon waveguide. The effect of waveguide width and length on polarization extinction ratio (PER) were investigated. For a 10 mm device, PER in excess of 48 dB with TE mode loss of approximately 0.8 dB was recorded. In addition, we experimentally demonstrate a wavelength dependence of PER smaller than 3 dB with a width of 5.5-[Formula Omitted] device over the C band from 1520–1580 nm. We also present a theoretical analysis and numerical simulation of this architecture that are in good agreement with each other and the experimental results. By improving the fabrication process and PER measurement method, over 60 dB PER and less 0.1 dB TE mode loss can be obtained for a 10 mm polarizer according to our model, which is expected to be widely applicated in sensors such as optical gyroscopes.</abstract><cop>New York</cop><pub>The Institute of Electrical and Electronics Engineers, Inc. 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| source | IEEE Electronic Library (IEL) |
| subjects | C band Mathematical models Measurement methods Optical gyroscopes Plasmonics Polarizers Silicon dioxide Waveguides |
| title | An Integrated Surface Plasmonic TE-Pass Polarizer on a Silica-on-Silicon Waveguide |
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