Mechanistic exploration of charge transport and photosensitivity of metal/polymer/semiconductor (MPS) junction for sensitive light detection applications

Herein, PVA: PVP@Ni(OAc) 2 nanocomposite spin-coated thin films have been fabricated as a barrier modifier interlayer in a metal/polymer/semiconductor configuration for light detection applications. The nanostructure, as well as the surface roughness profile of the deposited thin films, have been in...

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Veröffentlicht in:	Journal of materials science. Materials in electronics 2023-12, Vol.34 (36), p.2313, Article 2313
Hauptverfasser:	El-Mahalawy, Ahmed M., Abdrabou, Mahmoud M., Mansour, S. A., Ali, Fayez M.
Format:	Artikel
Sprache:	eng
Schlagworte:	Characterization and Evaluation of Materials Charge transport Chemistry and Materials Science Electrical properties Electron microscopes Energy gap Field emission microscopy Interlayers Materials Science Nanocomposites Optical and Electronic Materials Photosensitivity Polymers Silicon Spin coating Surface roughness Thermionic emission Thin films
Online-Zugang:	Volltext
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