Applying fully convolutional networks for beam profile and emittance measurements

The transverse cross-sectional size and emittance are critical beam parameters that characterize the performance of the accelerator and assess the state of the beam. Inspired by the success of machine learning in image processing tasks, we have crafted a bespoke measurement system with a primary foc...

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Veröffentlicht in:Journal of instrumentation 2023-10, Vol.18 (10), p.P10039
Hauptverfasser: Zhu, Wenchao, Wei, Zhengyu, Liang, Yu, Xie, Chunjie, Lu, Ping, Lu, Yalin, Wang, Lin, Li, Haohu, Zhou, Zeran
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container_end_page
container_issue 10
container_start_page P10039
container_title Journal of instrumentation
container_volume 18
creator Zhu, Wenchao
Wei, Zhengyu
Liang, Yu
Xie, Chunjie
Lu, Ping
Lu, Yalin
Wang, Lin
Li, Haohu
Zhou, Zeran
description The transverse cross-sectional size and emittance are critical beam parameters that characterize the performance of the accelerator and assess the state of the beam. Inspired by the success of machine learning in image processing tasks, we have crafted a bespoke measurement system with a primary focus on accurately determine the transverse cross-sectional size and emittance of the beam. The system utilizes a beam spot detector to convert the beam spot to a light spot image, which is then projected onto the CCD camera through the telecentric lens for the acquisition. The image data collected by the camera is subsequently imported into the EPICS database developed based on ADAravis software. We employ the Gaussian fitting technique on the collected images to accurately calculate the cross-sectional size of the beam. Furthermore, by incorporating the four-level iron scanning method, the lateral emittance of the beam is calculated in a comprehensive manner. To suppress the salt and pepper noise introduced due to the presence of dark current and beam shooting phenomena on the transmission line, we propose a novel fully convolutional neural network (FCN) design with preactivated residual units. The test conducted at HLS-II confirms that the measurement uncertainty of this system is superior to 27.5 μm. Moreover, when operating at an electron beam energy of 800 MeV, the measured emittance of the accelerator is found to be 38.515 nm·rad, a value closely aligning with the theoretical value of 36.2 nm·rad. These compelling results provide strong evidence supporting the reliability of the emittance measurement algorithm, making it suitable for deployment in the forthcoming terahertz accelerator.
doi_str_mv 10.1088/1748-0221/18/10/P10039
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fullrecord <record><control><sourceid>proquest_iop_j</sourceid><recordid>TN_cdi_proquest_journals_2884716124</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2884716124</sourcerecordid><originalsourceid>FETCH-LOGICAL-c361t-f6733ffc88dd327008e6e96da77d7499975290c00f02e4e81811cbc8b1ee7ec53</originalsourceid><addsrcrecordid>eNqFkNtKxDAQhoMouK6-ggS8E-pO0kPSy2XxBAsq6HXophPp2iY1aZV9e1squheCV3P65p_hJ-ScwRUDKRdMJDICztmCDQUsHhlAnB-Q2c_gcC8_JichbAHSPE1gRp6WbVvvKvtKTV_XO6qd_XB131XOFjW12H06_xaocZ5usGho652paqSFLSk2VdcVViNtsAi9xwZtF07JkSnqgGffcU5ebq6fV3fR-uH2frVcRzrOWBeZTMSxMVrKsoy5AJCYYZ6VhRClSPI8FynPQQMY4JigZJIxvdFywxAF6jSek4tJd3jpvcfQqa3r_fB1UFzKRLCM8WSgsonS3oXg0ajWV03hd4qBGu1TozNqdEYxOTYn-4bFy2mxcu2v8rayw6F9ULWlGWD-B_zPhS-984Dq</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2884716124</pqid></control><display><type>article</type><title>Applying fully convolutional networks for beam profile and emittance measurements</title><source>IOP Publishing Journals</source><source>Institute of Physics (IOP) Journals - HEAL-Link</source><creator>Zhu, Wenchao ; Wei, Zhengyu ; Liang, Yu ; Xie, Chunjie ; Lu, Ping ; Lu, Yalin ; Wang, Lin ; Li, Haohu ; Zhou, Zeran</creator><creatorcontrib>Zhu, Wenchao ; Wei, Zhengyu ; Liang, Yu ; Xie, Chunjie ; Lu, Ping ; Lu, Yalin ; Wang, Lin ; Li, Haohu ; Zhou, Zeran</creatorcontrib><description>The transverse cross-sectional size and emittance are critical beam parameters that characterize the performance of the accelerator and assess the state of the beam. Inspired by the success of machine learning in image processing tasks, we have crafted a bespoke measurement system with a primary focus on accurately determine the transverse cross-sectional size and emittance of the beam. The system utilizes a beam spot detector to convert the beam spot to a light spot image, which is then projected onto the CCD camera through the telecentric lens for the acquisition. The image data collected by the camera is subsequently imported into the EPICS database developed based on ADAravis software. We employ the Gaussian fitting technique on the collected images to accurately calculate the cross-sectional size of the beam. Furthermore, by incorporating the four-level iron scanning method, the lateral emittance of the beam is calculated in a comprehensive manner. To suppress the salt and pepper noise introduced due to the presence of dark current and beam shooting phenomena on the transmission line, we propose a novel fully convolutional neural network (FCN) design with preactivated residual units. The test conducted at HLS-II confirms that the measurement uncertainty of this system is superior to 27.5 μm. Moreover, when operating at an electron beam energy of 800 MeV, the measured emittance of the accelerator is found to be 38.515 nm·rad, a value closely aligning with the theoretical value of 36.2 nm·rad. These compelling results provide strong evidence supporting the reliability of the emittance measurement algorithm, making it suitable for deployment in the forthcoming terahertz accelerator.</description><identifier>ISSN: 1748-0221</identifier><identifier>EISSN: 1748-0221</identifier><identifier>DOI: 10.1088/1748-0221/18/10/P10039</identifier><language>eng</language><publisher>Bristol: IOP Publishing</publisher><subject>Accelerator Subsystems and Technologies ; Algorithms ; Beam-line instrumentation (beam position and profile monitors, beam-intensity monitors, bunch length monitors) ; CCD cameras ; Dark current ; Electron beams ; Emittance ; Hardware and accelerator control systems ; Image filtering ; Image processing ; Light spots ; Machine learning ; Mathematical analysis ; Neural networks ; Transmission lines</subject><ispartof>Journal of instrumentation, 2023-10, Vol.18 (10), p.P10039</ispartof><rights>2023 IOP Publishing Ltd and Sissa Medialab</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c361t-f6733ffc88dd327008e6e96da77d7499975290c00f02e4e81811cbc8b1ee7ec53</citedby><cites>FETCH-LOGICAL-c361t-f6733ffc88dd327008e6e96da77d7499975290c00f02e4e81811cbc8b1ee7ec53</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://iopscience.iop.org/article/10.1088/1748-0221/18/10/P10039/pdf$$EPDF$$P50$$Giop$$H</linktopdf><link.rule.ids>314,780,784,27923,27924,53845,53892</link.rule.ids></links><search><creatorcontrib>Zhu, Wenchao</creatorcontrib><creatorcontrib>Wei, Zhengyu</creatorcontrib><creatorcontrib>Liang, Yu</creatorcontrib><creatorcontrib>Xie, Chunjie</creatorcontrib><creatorcontrib>Lu, Ping</creatorcontrib><creatorcontrib>Lu, Yalin</creatorcontrib><creatorcontrib>Wang, Lin</creatorcontrib><creatorcontrib>Li, Haohu</creatorcontrib><creatorcontrib>Zhou, Zeran</creatorcontrib><title>Applying fully convolutional networks for beam profile and emittance measurements</title><title>Journal of instrumentation</title><addtitle>J. Instrum</addtitle><description>The transverse cross-sectional size and emittance are critical beam parameters that characterize the performance of the accelerator and assess the state of the beam. Inspired by the success of machine learning in image processing tasks, we have crafted a bespoke measurement system with a primary focus on accurately determine the transverse cross-sectional size and emittance of the beam. The system utilizes a beam spot detector to convert the beam spot to a light spot image, which is then projected onto the CCD camera through the telecentric lens for the acquisition. The image data collected by the camera is subsequently imported into the EPICS database developed based on ADAravis software. We employ the Gaussian fitting technique on the collected images to accurately calculate the cross-sectional size of the beam. Furthermore, by incorporating the four-level iron scanning method, the lateral emittance of the beam is calculated in a comprehensive manner. To suppress the salt and pepper noise introduced due to the presence of dark current and beam shooting phenomena on the transmission line, we propose a novel fully convolutional neural network (FCN) design with preactivated residual units. The test conducted at HLS-II confirms that the measurement uncertainty of this system is superior to 27.5 μm. Moreover, when operating at an electron beam energy of 800 MeV, the measured emittance of the accelerator is found to be 38.515 nm·rad, a value closely aligning with the theoretical value of 36.2 nm·rad. These compelling results provide strong evidence supporting the reliability of the emittance measurement algorithm, making it suitable for deployment in the forthcoming terahertz accelerator.</description><subject>Accelerator Subsystems and Technologies</subject><subject>Algorithms</subject><subject>Beam-line instrumentation (beam position and profile monitors, beam-intensity monitors, bunch length monitors)</subject><subject>CCD cameras</subject><subject>Dark current</subject><subject>Electron beams</subject><subject>Emittance</subject><subject>Hardware and accelerator control systems</subject><subject>Image filtering</subject><subject>Image processing</subject><subject>Light spots</subject><subject>Machine learning</subject><subject>Mathematical analysis</subject><subject>Neural networks</subject><subject>Transmission lines</subject><issn>1748-0221</issn><issn>1748-0221</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2023</creationdate><recordtype>article</recordtype><recordid>eNqFkNtKxDAQhoMouK6-ggS8E-pO0kPSy2XxBAsq6HXophPp2iY1aZV9e1squheCV3P65p_hJ-ScwRUDKRdMJDICztmCDQUsHhlAnB-Q2c_gcC8_JichbAHSPE1gRp6WbVvvKvtKTV_XO6qd_XB131XOFjW12H06_xaocZ5usGho652paqSFLSk2VdcVViNtsAi9xwZtF07JkSnqgGffcU5ebq6fV3fR-uH2frVcRzrOWBeZTMSxMVrKsoy5AJCYYZ6VhRClSPI8FynPQQMY4JigZJIxvdFywxAF6jSek4tJd3jpvcfQqa3r_fB1UFzKRLCM8WSgsonS3oXg0ajWV03hd4qBGu1TozNqdEYxOTYn-4bFy2mxcu2v8rayw6F9ULWlGWD-B_zPhS-984Dq</recordid><startdate>20231001</startdate><enddate>20231001</enddate><creator>Zhu, Wenchao</creator><creator>Wei, Zhengyu</creator><creator>Liang, Yu</creator><creator>Xie, Chunjie</creator><creator>Lu, Ping</creator><creator>Lu, Yalin</creator><creator>Wang, Lin</creator><creator>Li, Haohu</creator><creator>Zhou, Zeran</creator><general>IOP Publishing</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20231001</creationdate><title>Applying fully convolutional networks for beam profile and emittance measurements</title><author>Zhu, Wenchao ; Wei, Zhengyu ; Liang, Yu ; Xie, Chunjie ; Lu, Ping ; Lu, Yalin ; Wang, Lin ; Li, Haohu ; Zhou, Zeran</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c361t-f6733ffc88dd327008e6e96da77d7499975290c00f02e4e81811cbc8b1ee7ec53</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2023</creationdate><topic>Accelerator Subsystems and Technologies</topic><topic>Algorithms</topic><topic>Beam-line instrumentation (beam position and profile monitors, beam-intensity monitors, bunch length monitors)</topic><topic>CCD cameras</topic><topic>Dark current</topic><topic>Electron beams</topic><topic>Emittance</topic><topic>Hardware and accelerator control systems</topic><topic>Image filtering</topic><topic>Image processing</topic><topic>Light spots</topic><topic>Machine learning</topic><topic>Mathematical analysis</topic><topic>Neural networks</topic><topic>Transmission lines</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Zhu, Wenchao</creatorcontrib><creatorcontrib>Wei, Zhengyu</creatorcontrib><creatorcontrib>Liang, Yu</creatorcontrib><creatorcontrib>Xie, Chunjie</creatorcontrib><creatorcontrib>Lu, Ping</creatorcontrib><creatorcontrib>Lu, Yalin</creatorcontrib><creatorcontrib>Wang, Lin</creatorcontrib><creatorcontrib>Li, Haohu</creatorcontrib><creatorcontrib>Zhou, Zeran</creatorcontrib><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of instrumentation</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Zhu, Wenchao</au><au>Wei, Zhengyu</au><au>Liang, Yu</au><au>Xie, Chunjie</au><au>Lu, Ping</au><au>Lu, Yalin</au><au>Wang, Lin</au><au>Li, Haohu</au><au>Zhou, Zeran</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Applying fully convolutional networks for beam profile and emittance measurements</atitle><jtitle>Journal of instrumentation</jtitle><addtitle>J. Instrum</addtitle><date>2023-10-01</date><risdate>2023</risdate><volume>18</volume><issue>10</issue><spage>P10039</spage><pages>P10039-</pages><issn>1748-0221</issn><eissn>1748-0221</eissn><abstract>The transverse cross-sectional size and emittance are critical beam parameters that characterize the performance of the accelerator and assess the state of the beam. Inspired by the success of machine learning in image processing tasks, we have crafted a bespoke measurement system with a primary focus on accurately determine the transverse cross-sectional size and emittance of the beam. The system utilizes a beam spot detector to convert the beam spot to a light spot image, which is then projected onto the CCD camera through the telecentric lens for the acquisition. The image data collected by the camera is subsequently imported into the EPICS database developed based on ADAravis software. We employ the Gaussian fitting technique on the collected images to accurately calculate the cross-sectional size of the beam. Furthermore, by incorporating the four-level iron scanning method, the lateral emittance of the beam is calculated in a comprehensive manner. To suppress the salt and pepper noise introduced due to the presence of dark current and beam shooting phenomena on the transmission line, we propose a novel fully convolutional neural network (FCN) design with preactivated residual units. The test conducted at HLS-II confirms that the measurement uncertainty of this system is superior to 27.5 μm. Moreover, when operating at an electron beam energy of 800 MeV, the measured emittance of the accelerator is found to be 38.515 nm·rad, a value closely aligning with the theoretical value of 36.2 nm·rad. These compelling results provide strong evidence supporting the reliability of the emittance measurement algorithm, making it suitable for deployment in the forthcoming terahertz accelerator.</abstract><cop>Bristol</cop><pub>IOP Publishing</pub><doi>10.1088/1748-0221/18/10/P10039</doi><tpages>16</tpages></addata></record>
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subjects Accelerator Subsystems and Technologies
Algorithms
Beam-line instrumentation (beam position and profile monitors, beam-intensity monitors, bunch length monitors)
CCD cameras
Dark current
Electron beams
Emittance
Hardware and accelerator control systems
Image filtering
Image processing
Light spots
Machine learning
Mathematical analysis
Neural networks
Transmission lines
title Applying fully convolutional networks for beam profile and emittance measurements
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-12T19%3A10%3A25IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_iop_j&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Applying%20fully%20convolutional%20networks%20for%20beam%20profile%20and%20emittance%20measurements&rft.jtitle=Journal%20of%20instrumentation&rft.au=Zhu,%20Wenchao&rft.date=2023-10-01&rft.volume=18&rft.issue=10&rft.spage=P10039&rft.pages=P10039-&rft.issn=1748-0221&rft.eissn=1748-0221&rft_id=info:doi/10.1088/1748-0221/18/10/P10039&rft_dat=%3Cproquest_iop_j%3E2884716124%3C/proquest_iop_j%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2884716124&rft_id=info:pmid/&rfr_iscdi=true