Electrical properties of Li-doped Bi2/3Cu3Ti4O12 ceramics

Li-doped Bi 2/3 Cu 3 Ti 4 O 12 ceramics were successfully prepared using a conventional solid-state method. As the Li content increases, the lattice constant gradually decreased and the grain size increased. The analysis of energy-dispersive spectrometer and elemental mapping suggested that the grai...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of materials science. Materials in electronics 2023-10, Vol.34 (30), p.2026, Article 2026
Hauptverfasser: Yang, Longhai, Gao, Wenjie, Wang, Jiaxing, He, Chunxiang, Yue, Gaili, Zhang, Tao
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue 30
container_start_page 2026
container_title Journal of materials science. Materials in electronics
container_volume 34
creator Yang, Longhai
Gao, Wenjie
Wang, Jiaxing
He, Chunxiang
Yue, Gaili
Zhang, Tao
description Li-doped Bi 2/3 Cu 3 Ti 4 O 12 ceramics were successfully prepared using a conventional solid-state method. As the Li content increases, the lattice constant gradually decreased and the grain size increased. The analysis of energy-dispersive spectrometer and elemental mapping suggested that the grain boundaries are enriched with CuO. The frequency dependence of the dielectric constant and loss exhibited a two-stage step-like decline. Three different dielectric characteristics were observed in the low-, mid-, and high-frequency ranges. In the mid-frequency range from 5 to 100 kHz, the dielectric constant was effectively improved by Li doping, and the dielectric loss gradually decreased with increasing Li doping. The complex impedances of all compositions present three distinct semi-arcs. Combined with the analysis of dielectric and impedance properties under DC bias, it was concluded that the dielectric responses of all Li-doped Bi 2/3 Cu 3 Ti 4 O 12 ceramics at low, intermediate, and high frequencies originated from the electrode, grain boundary, and grain effects, respectively. The resistances of the different regions are calculated by impedance fitting. The study of the frequency dependence of dielectric properties, electric modulus, and impedance at various temperatures further verified the existence of electrode, grain boundary, and grain relaxations. X-ray photoelectron spectroscopy reveals that the increase in conductivity at high frequencies with increasing Li content was contributed to an jump of electrons between Cu + and Cu 2+ .
doi_str_mv 10.1007/s10854-023-11440-4
format Article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2881542480</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2881542480</sourcerecordid><originalsourceid>FETCH-LOGICAL-c270t-969cb4a4cd3e379ecc862e2b2adfa580a99300506183b1095d3cdb316b22cc433</originalsourceid><addsrcrecordid>eNp9kEFLAzEQhYMoWKt_wNOC59jJTHY3OWqpVSj0UsFbyGazktJ2a7I9-O-NruDN0_DgvTePj7FbAfcCoJ4lAaqUHJC4EFICl2dsIsqauFT4ds4moMuayxLxkl2ltAWASpKaML3YeTfE4OyuOMb-6OMQfCr6rlgF3mbdFo8BZzQ_0SbItcDC-Wj3waVrdtHZXfI3v3fKXp8Wm_kzX62XL_OHFXdYw8B1pV0jrXQteaq1d05V6LFB23a2VGC1JoASKqGoEXlmS65tSFQNonOSaMruxt487-Pk02C2_Ske8kuDSolSolSQXTi6XOxTir4zxxj2Nn4aAeYbkRkRmYzI_CAyModoDKVsPrz7-Ff9T-oLn8VmkA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2881542480</pqid></control><display><type>article</type><title>Electrical properties of Li-doped Bi2/3Cu3Ti4O12 ceramics</title><source>Springer Nature - Complete Springer Journals</source><creator>Yang, Longhai ; Gao, Wenjie ; Wang, Jiaxing ; He, Chunxiang ; Yue, Gaili ; Zhang, Tao</creator><creatorcontrib>Yang, Longhai ; Gao, Wenjie ; Wang, Jiaxing ; He, Chunxiang ; Yue, Gaili ; Zhang, Tao</creatorcontrib><description>Li-doped Bi 2/3 Cu 3 Ti 4 O 12 ceramics were successfully prepared using a conventional solid-state method. As the Li content increases, the lattice constant gradually decreased and the grain size increased. The analysis of energy-dispersive spectrometer and elemental mapping suggested that the grain boundaries are enriched with CuO. The frequency dependence of the dielectric constant and loss exhibited a two-stage step-like decline. Three different dielectric characteristics were observed in the low-, mid-, and high-frequency ranges. In the mid-frequency range from 5 to 100 kHz, the dielectric constant was effectively improved by Li doping, and the dielectric loss gradually decreased with increasing Li doping. The complex impedances of all compositions present three distinct semi-arcs. Combined with the analysis of dielectric and impedance properties under DC bias, it was concluded that the dielectric responses of all Li-doped Bi 2/3 Cu 3 Ti 4 O 12 ceramics at low, intermediate, and high frequencies originated from the electrode, grain boundary, and grain effects, respectively. The resistances of the different regions are calculated by impedance fitting. The study of the frequency dependence of dielectric properties, electric modulus, and impedance at various temperatures further verified the existence of electrode, grain boundary, and grain relaxations. X-ray photoelectron spectroscopy reveals that the increase in conductivity at high frequencies with increasing Li content was contributed to an jump of electrons between Cu + and Cu 2+ .</description><identifier>ISSN: 0957-4522</identifier><identifier>EISSN: 1573-482X</identifier><identifier>DOI: 10.1007/s10854-023-11440-4</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Ceramics ; Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Dielectric loss ; Dielectric properties ; Doping ; Electric arcs ; Electrical properties ; Electrodes ; Frequency ranges ; Grain boundaries ; Grain size ; Impedance ; Lattice parameters ; Materials Science ; Optical and Electronic Materials ; Permittivity ; Photoelectrons ; X ray photoelectron spectroscopy</subject><ispartof>Journal of materials science. Materials in electronics, 2023-10, Vol.34 (30), p.2026, Article 2026</ispartof><rights>The Author(s), under exclusive licence to Springer Science+Business Media, LLC, part of Springer Nature 2023. Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c270t-969cb4a4cd3e379ecc862e2b2adfa580a99300506183b1095d3cdb316b22cc433</cites><orcidid>0000-0003-4638-7039</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s10854-023-11440-4$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s10854-023-11440-4$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,776,780,27903,27904,41467,42536,51298</link.rule.ids></links><search><creatorcontrib>Yang, Longhai</creatorcontrib><creatorcontrib>Gao, Wenjie</creatorcontrib><creatorcontrib>Wang, Jiaxing</creatorcontrib><creatorcontrib>He, Chunxiang</creatorcontrib><creatorcontrib>Yue, Gaili</creatorcontrib><creatorcontrib>Zhang, Tao</creatorcontrib><title>Electrical properties of Li-doped Bi2/3Cu3Ti4O12 ceramics</title><title>Journal of materials science. Materials in electronics</title><addtitle>J Mater Sci: Mater Electron</addtitle><description>Li-doped Bi 2/3 Cu 3 Ti 4 O 12 ceramics were successfully prepared using a conventional solid-state method. As the Li content increases, the lattice constant gradually decreased and the grain size increased. The analysis of energy-dispersive spectrometer and elemental mapping suggested that the grain boundaries are enriched with CuO. The frequency dependence of the dielectric constant and loss exhibited a two-stage step-like decline. Three different dielectric characteristics were observed in the low-, mid-, and high-frequency ranges. In the mid-frequency range from 5 to 100 kHz, the dielectric constant was effectively improved by Li doping, and the dielectric loss gradually decreased with increasing Li doping. The complex impedances of all compositions present three distinct semi-arcs. Combined with the analysis of dielectric and impedance properties under DC bias, it was concluded that the dielectric responses of all Li-doped Bi 2/3 Cu 3 Ti 4 O 12 ceramics at low, intermediate, and high frequencies originated from the electrode, grain boundary, and grain effects, respectively. The resistances of the different regions are calculated by impedance fitting. The study of the frequency dependence of dielectric properties, electric modulus, and impedance at various temperatures further verified the existence of electrode, grain boundary, and grain relaxations. X-ray photoelectron spectroscopy reveals that the increase in conductivity at high frequencies with increasing Li content was contributed to an jump of electrons between Cu + and Cu 2+ .</description><subject>Ceramics</subject><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Dielectric loss</subject><subject>Dielectric properties</subject><subject>Doping</subject><subject>Electric arcs</subject><subject>Electrical properties</subject><subject>Electrodes</subject><subject>Frequency ranges</subject><subject>Grain boundaries</subject><subject>Grain size</subject><subject>Impedance</subject><subject>Lattice parameters</subject><subject>Materials Science</subject><subject>Optical and Electronic Materials</subject><subject>Permittivity</subject><subject>Photoelectrons</subject><subject>X ray photoelectron spectroscopy</subject><issn>0957-4522</issn><issn>1573-482X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2023</creationdate><recordtype>article</recordtype><sourceid>AFKRA</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNp9kEFLAzEQhYMoWKt_wNOC59jJTHY3OWqpVSj0UsFbyGazktJ2a7I9-O-NruDN0_DgvTePj7FbAfcCoJ4lAaqUHJC4EFICl2dsIsqauFT4ds4moMuayxLxkl2ltAWASpKaML3YeTfE4OyuOMb-6OMQfCr6rlgF3mbdFo8BZzQ_0SbItcDC-Wj3waVrdtHZXfI3v3fKXp8Wm_kzX62XL_OHFXdYw8B1pV0jrXQteaq1d05V6LFB23a2VGC1JoASKqGoEXlmS65tSFQNonOSaMruxt487-Pk02C2_Ske8kuDSolSolSQXTi6XOxTir4zxxj2Nn4aAeYbkRkRmYzI_CAyModoDKVsPrz7-Ff9T-oLn8VmkA</recordid><startdate>20231001</startdate><enddate>20231001</enddate><creator>Yang, Longhai</creator><creator>Gao, Wenjie</creator><creator>Wang, Jiaxing</creator><creator>He, Chunxiang</creator><creator>Yue, Gaili</creator><creator>Zhang, Tao</creator><general>Springer US</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>F28</scope><scope>FR3</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>KB.</scope><scope>L7M</scope><scope>P5Z</scope><scope>P62</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>S0W</scope><orcidid>https://orcid.org/0000-0003-4638-7039</orcidid></search><sort><creationdate>20231001</creationdate><title>Electrical properties of Li-doped Bi2/3Cu3Ti4O12 ceramics</title><author>Yang, Longhai ; Gao, Wenjie ; Wang, Jiaxing ; He, Chunxiang ; Yue, Gaili ; Zhang, Tao</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c270t-969cb4a4cd3e379ecc862e2b2adfa580a99300506183b1095d3cdb316b22cc433</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2023</creationdate><topic>Ceramics</topic><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Dielectric loss</topic><topic>Dielectric properties</topic><topic>Doping</topic><topic>Electric arcs</topic><topic>Electrical properties</topic><topic>Electrodes</topic><topic>Frequency ranges</topic><topic>Grain boundaries</topic><topic>Grain size</topic><topic>Impedance</topic><topic>Lattice parameters</topic><topic>Materials Science</topic><topic>Optical and Electronic Materials</topic><topic>Permittivity</topic><topic>Photoelectrons</topic><topic>X ray photoelectron spectroscopy</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Yang, Longhai</creatorcontrib><creatorcontrib>Gao, Wenjie</creatorcontrib><creatorcontrib>Wang, Jiaxing</creatorcontrib><creatorcontrib>He, Chunxiang</creatorcontrib><creatorcontrib>Yue, Gaili</creatorcontrib><creatorcontrib>Zhang, Tao</creatorcontrib><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science &amp; Engineering Collection</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Engineering Research Database</collection><collection>SciTech Premium Collection</collection><collection>Materials Research Database</collection><collection>Materials Science Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Advanced Technologies &amp; Aerospace Database</collection><collection>ProQuest Advanced Technologies &amp; Aerospace Collection</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>DELNET Engineering &amp; Technology Collection</collection><jtitle>Journal of materials science. Materials in electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Yang, Longhai</au><au>Gao, Wenjie</au><au>Wang, Jiaxing</au><au>He, Chunxiang</au><au>Yue, Gaili</au><au>Zhang, Tao</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Electrical properties of Li-doped Bi2/3Cu3Ti4O12 ceramics</atitle><jtitle>Journal of materials science. Materials in electronics</jtitle><stitle>J Mater Sci: Mater Electron</stitle><date>2023-10-01</date><risdate>2023</risdate><volume>34</volume><issue>30</issue><spage>2026</spage><pages>2026-</pages><artnum>2026</artnum><issn>0957-4522</issn><eissn>1573-482X</eissn><abstract>Li-doped Bi 2/3 Cu 3 Ti 4 O 12 ceramics were successfully prepared using a conventional solid-state method. As the Li content increases, the lattice constant gradually decreased and the grain size increased. The analysis of energy-dispersive spectrometer and elemental mapping suggested that the grain boundaries are enriched with CuO. The frequency dependence of the dielectric constant and loss exhibited a two-stage step-like decline. Three different dielectric characteristics were observed in the low-, mid-, and high-frequency ranges. In the mid-frequency range from 5 to 100 kHz, the dielectric constant was effectively improved by Li doping, and the dielectric loss gradually decreased with increasing Li doping. The complex impedances of all compositions present three distinct semi-arcs. Combined with the analysis of dielectric and impedance properties under DC bias, it was concluded that the dielectric responses of all Li-doped Bi 2/3 Cu 3 Ti 4 O 12 ceramics at low, intermediate, and high frequencies originated from the electrode, grain boundary, and grain effects, respectively. The resistances of the different regions are calculated by impedance fitting. The study of the frequency dependence of dielectric properties, electric modulus, and impedance at various temperatures further verified the existence of electrode, grain boundary, and grain relaxations. X-ray photoelectron spectroscopy reveals that the increase in conductivity at high frequencies with increasing Li content was contributed to an jump of electrons between Cu + and Cu 2+ .</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s10854-023-11440-4</doi><orcidid>https://orcid.org/0000-0003-4638-7039</orcidid></addata></record>
fulltext fulltext
identifier ISSN: 0957-4522
ispartof Journal of materials science. Materials in electronics, 2023-10, Vol.34 (30), p.2026, Article 2026
issn 0957-4522
1573-482X
language eng
recordid cdi_proquest_journals_2881542480
source Springer Nature - Complete Springer Journals
subjects Ceramics
Characterization and Evaluation of Materials
Chemistry and Materials Science
Dielectric loss
Dielectric properties
Doping
Electric arcs
Electrical properties
Electrodes
Frequency ranges
Grain boundaries
Grain size
Impedance
Lattice parameters
Materials Science
Optical and Electronic Materials
Permittivity
Photoelectrons
X ray photoelectron spectroscopy
title Electrical properties of Li-doped Bi2/3Cu3Ti4O12 ceramics
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-23T04%3A23%3A21IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Electrical%20properties%20of%20Li-doped%20Bi2/3Cu3Ti4O12%20ceramics&rft.jtitle=Journal%20of%20materials%20science.%20Materials%20in%20electronics&rft.au=Yang,%20Longhai&rft.date=2023-10-01&rft.volume=34&rft.issue=30&rft.spage=2026&rft.pages=2026-&rft.artnum=2026&rft.issn=0957-4522&rft.eissn=1573-482X&rft_id=info:doi/10.1007/s10854-023-11440-4&rft_dat=%3Cproquest_cross%3E2881542480%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2881542480&rft_id=info:pmid/&rfr_iscdi=true