CMOS Scaling Challenges for High Performance and Low Power applications facing Reliability Criteria towards the Decananometer range

The huge improvements in integrated circuits manufacturing has faced great challenges between process optimization, performance requirements and the trade-off between low power operation and reliability for long term use. Both the variability at time zero and the time variability due to external con...

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Veröffentlicht in:	Journal of physics. Conference series 2023-07, Vol.2548 (1), p.12003
Hauptverfasser:	Bravaix, A, Hamparsoumian, G, Sonzogni, J, Pitard, H, Garba-Seybou, T, Kussener, E, Federspiel, X, Cacho, F
Format:	Artikel
Sprache:	eng
Schlagworte:	CMOS Engineering Sciences Integrated circuits Nodes Optimization Physics Power consumption Power management Reliability Robustness
Online-Zugang:	Volltext
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