Application of Secondary Ion Mass Spectrometry for Iron and Steel Material Analysis
Time-of-flight secondary ion mass spectrometry with a focused ion beam system is a useful surface analysis to measure elemental mappings around 100 nm on a lateral resolution and trace element detections on a range of ppm in atomic concentration. With these advantages, TOF-SIMS has been frequently u...
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| Veröffentlicht in: | Journal of Surface Analysis 2022, Vol.29(1), pp.33-38 |
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| container_title | Journal of Surface Analysis |
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| creator | Kubota, Naoyoshi Hiragino, Yuto Sato, Riki |
| description | Time-of-flight secondary ion mass spectrometry with a focused ion beam system is a useful surface analysis to measure elemental mappings around 100 nm on a lateral resolution and trace element detections on a range of ppm in atomic concentration. With these advantages, TOF-SIMS has been frequently used for iron and steel material analysis. We have demonstrated some applications in this paper, that is the B distribution along the grain boundaries in the steel sample with a trace amount of B, the detection of tribofilm from the test piece surface after the sliding test, and so on. |
| doi_str_mv | 10.1384/jsa.29.33 |
| format | Article |
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With these advantages, TOF-SIMS has been frequently used for iron and steel material analysis. 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With these advantages, TOF-SIMS has been frequently used for iron and steel material analysis. We have demonstrated some applications in this paper, that is the B distribution along the grain boundaries in the steel sample with a trace amount of B, the detection of tribofilm from the test piece surface after the sliding test, and so on.</abstract><cop>Tokyo</cop><pub>The Surface Analysis Society of Japan</pub><doi>10.1384/jsa.29.33</doi><tpages>6</tpages><oa>free_for_read</oa></addata></record> |
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| ispartof | Journal of Surface Analysis, 2022, Vol.29(1), pp.33-38 |
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| subjects | Grain boundaries Ion beams Iron Secondary ion mass spectrometry Steels Surface analysis (chemical) Trace elements |
| title | Application of Secondary Ion Mass Spectrometry for Iron and Steel Material Analysis |
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