Microstructural, Mössbauer, thermal and dielectric studies of ZnFeCoO4 spinel oxide for optoelectronic applications

In this article, we have investigated the structural, Mossbauer, thermal and dielectric properties of the ZnFeCoO 4 spinel oxide elaborated using the sol–gel process. We have used X-ray diffraction (XRD) and scanning electron microscopy (SEM) to analyze the microstructural properties of our sample....

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Veröffentlicht in:	Journal of materials science. Materials in electronics 2023-06, Vol.34 (16), p.1298, Article 1298
Hauptverfasser:	Horchani, M., Seif Eddine, M., Omri, Aref, Benali, A., Taoufik, Mnasri, Dhahri, E., Valente, M. A., Costa, B. F. O., Ben Younes, Rached
Format:	Artikel
Sprache:	eng
Schlagworte:	Characterization and Evaluation of Materials Chemistry and Materials Science Current carriers Dielectric properties Electrical resistivity Equivalent circuits Grain boundaries Materials Science Nyquist plots Optical and Electronic Materials Optoelectronics Phase matching Photomicrographs Raman spectra Scanning electron microscopy Sol-gel processes Spinel Temperature dependence X-ray diffraction Zinc oxide
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