Compact and Wideband Flat Negative Group Delay Circuit Investigation
This paper introduces a dual transmission structure with bandpass (BP) negative group delay (NGD) wideband flat behavior. The flat BP-NGD topology is analytically modelled from equivalent circuit composed of transmission line (TL) and stepped-impedance resonator connected by two resistors. As proof...
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Veröffentlicht in: | IEEE transactions on circuits and systems. II, Express briefs Express briefs, 2023-06, Vol.70 (6), p.1-1 |
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creator | Gu, Taochen Wan, Fayu Chen, Jiahui Ravelo, Blaise Zhao, Xing |
description | This paper introduces a dual transmission structure with bandpass (BP) negative group delay (NGD) wideband flat behavior. The flat BP-NGD topology is analytically modelled from equivalent circuit composed of transmission line (TL) and stepped-impedance resonator connected by two resistors. As proof of concept (POC), by tuning TL characteristic impedances, the influences of circuit physical variables on NGD flatness are illustrated by parametric study. The flat BP-NGD POC circuit with a size of 48.2 mm×90.8 mm (0.2λg 0.38λg) is designed, fabricated, and measured. A very good agreement is confirmed by simulation and experimentation results of 680 MHz over 290 MHz (42.6%) NGD bandwidth (BW) around 0.7 GHz NGD center frequency. Also, the flat BP-NGD BW reaches 223 MHz (31.8%) over 569 MHz to 792 MHz with ±0.05 ns group-delay fluctuation with insertion and reflection losses better than 14 dB. |
doi_str_mv | 10.1109/TCSII.2022.3233620 |
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The flat BP-NGD topology is analytically modelled from equivalent circuit composed of transmission line (TL) and stepped-impedance resonator connected by two resistors. As proof of concept (POC), by tuning TL characteristic impedances, the influences of circuit physical variables on NGD flatness are illustrated by parametric study. The flat BP-NGD POC circuit with a size of 48.2 mm×90.8 mm (0.2λg 0.38λg) is designed, fabricated, and measured. A very good agreement is confirmed by simulation and experimentation results of 680 MHz over 290 MHz (42.6%) NGD bandwidth (BW) around 0.7 GHz NGD center frequency. Also, the flat BP-NGD BW reaches 223 MHz (31.8%) over 569 MHz to 792 MHz with ±0.05 ns group-delay fluctuation with insertion and reflection losses better than 14 dB.</description><identifier>ISSN: 1549-7747</identifier><identifier>EISSN: 1558-3791</identifier><identifier>DOI: 10.1109/TCSII.2022.3233620</identifier><identifier>CODEN: ITCSFK</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Broadband ; Delay circuits ; Delays ; Design method ; Equivalent circuits ; Fluctuations ; Group delay ; group delay (GD) flatness ; Integrated circuit modeling ; Mathematical models ; negative group delay (NGD) ; Resonant frequency ; Topology ; transmission line (TL) ; Transmission lines ; Wideband</subject><ispartof>IEEE transactions on circuits and systems. II, Express briefs, 2023-06, Vol.70 (6), p.1-1</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2023</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c296t-341e5f103236ece1269d682403ec88a51d2540b14d6e3d32b1c6ac8d7739bffa3</citedby><cites>FETCH-LOGICAL-c296t-341e5f103236ece1269d682403ec88a51d2540b14d6e3d32b1c6ac8d7739bffa3</cites><orcidid>0000-0001-7613-226X ; 0000-0001-7334-5016 ; 0000-0002-5626-6065</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/10005003$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,777,781,793,27905,27906,54739</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/10005003$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Gu, Taochen</creatorcontrib><creatorcontrib>Wan, Fayu</creatorcontrib><creatorcontrib>Chen, Jiahui</creatorcontrib><creatorcontrib>Ravelo, Blaise</creatorcontrib><creatorcontrib>Zhao, Xing</creatorcontrib><title>Compact and Wideband Flat Negative Group Delay Circuit Investigation</title><title>IEEE transactions on circuits and systems. II, Express briefs</title><addtitle>TCSII</addtitle><description>This paper introduces a dual transmission structure with bandpass (BP) negative group delay (NGD) wideband flat behavior. The flat BP-NGD topology is analytically modelled from equivalent circuit composed of transmission line (TL) and stepped-impedance resonator connected by two resistors. As proof of concept (POC), by tuning TL characteristic impedances, the influences of circuit physical variables on NGD flatness are illustrated by parametric study. The flat BP-NGD POC circuit with a size of 48.2 mm×90.8 mm (0.2λg 0.38λg) is designed, fabricated, and measured. A very good agreement is confirmed by simulation and experimentation results of 680 MHz over 290 MHz (42.6%) NGD bandwidth (BW) around 0.7 GHz NGD center frequency. Also, the flat BP-NGD BW reaches 223 MHz (31.8%) over 569 MHz to 792 MHz with ±0.05 ns group-delay fluctuation with insertion and reflection losses better than 14 dB.</description><subject>Broadband</subject><subject>Delay circuits</subject><subject>Delays</subject><subject>Design method</subject><subject>Equivalent circuits</subject><subject>Fluctuations</subject><subject>Group delay</subject><subject>group delay (GD) flatness</subject><subject>Integrated circuit modeling</subject><subject>Mathematical models</subject><subject>negative group delay (NGD)</subject><subject>Resonant frequency</subject><subject>Topology</subject><subject>transmission line (TL)</subject><subject>Transmission lines</subject><subject>Wideband</subject><issn>1549-7747</issn><issn>1558-3791</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2023</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpNkEFPg0AQhTdGE2v1DxgPJJ7B2VnYhaOhtpI0erDG42ZZBkPTAi7QpP9esD14mnd437zkY-yeQ8A5JE-b9CPLAgTEQKAQEuGCzXgUxb5QCb-ccpj4SoXqmt103RYAExA4Y4u02bfG9p6pC--rKiifwnJneu-Nvk1fHchbuWZovQXtzNFLK2eHqvey-kBdX02Npr5lV6XZdXR3vnP2uXzZpK_--n2Vpc9r32Iie1-EnKKSj7tCkiWOMilkjCEIsnFsIl5gFELOw0KSKATm3Epj40IpkeRlacScPZ7-tq75GcZ9vW0GV4-TGmPkoCJQ4djCU8u6pusclbp11d64o-agJ1v6z5aebOmzrRF6OEEVEf0DACIAIX4B0Qtk8A</recordid><startdate>20230601</startdate><enddate>20230601</enddate><creator>Gu, Taochen</creator><creator>Wan, Fayu</creator><creator>Chen, Jiahui</creator><creator>Ravelo, Blaise</creator><creator>Zhao, Xing</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0001-7613-226X</orcidid><orcidid>https://orcid.org/0000-0001-7334-5016</orcidid><orcidid>https://orcid.org/0000-0002-5626-6065</orcidid></search><sort><creationdate>20230601</creationdate><title>Compact and Wideband Flat Negative Group Delay Circuit Investigation</title><author>Gu, Taochen ; Wan, Fayu ; Chen, Jiahui ; Ravelo, Blaise ; Zhao, Xing</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c296t-341e5f103236ece1269d682403ec88a51d2540b14d6e3d32b1c6ac8d7739bffa3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2023</creationdate><topic>Broadband</topic><topic>Delay circuits</topic><topic>Delays</topic><topic>Design method</topic><topic>Equivalent circuits</topic><topic>Fluctuations</topic><topic>Group delay</topic><topic>group delay (GD) flatness</topic><topic>Integrated circuit modeling</topic><topic>Mathematical models</topic><topic>negative group delay (NGD)</topic><topic>Resonant frequency</topic><topic>Topology</topic><topic>transmission line (TL)</topic><topic>Transmission lines</topic><topic>Wideband</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Gu, Taochen</creatorcontrib><creatorcontrib>Wan, Fayu</creatorcontrib><creatorcontrib>Chen, Jiahui</creatorcontrib><creatorcontrib>Ravelo, Blaise</creatorcontrib><creatorcontrib>Zhao, Xing</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on circuits and systems. II, Express briefs</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Gu, Taochen</au><au>Wan, Fayu</au><au>Chen, Jiahui</au><au>Ravelo, Blaise</au><au>Zhao, Xing</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Compact and Wideband Flat Negative Group Delay Circuit Investigation</atitle><jtitle>IEEE transactions on circuits and systems. II, Express briefs</jtitle><stitle>TCSII</stitle><date>2023-06-01</date><risdate>2023</risdate><volume>70</volume><issue>6</issue><spage>1</spage><epage>1</epage><pages>1-1</pages><issn>1549-7747</issn><eissn>1558-3791</eissn><coden>ITCSFK</coden><abstract>This paper introduces a dual transmission structure with bandpass (BP) negative group delay (NGD) wideband flat behavior. The flat BP-NGD topology is analytically modelled from equivalent circuit composed of transmission line (TL) and stepped-impedance resonator connected by two resistors. As proof of concept (POC), by tuning TL characteristic impedances, the influences of circuit physical variables on NGD flatness are illustrated by parametric study. The flat BP-NGD POC circuit with a size of 48.2 mm×90.8 mm (0.2λg 0.38λg) is designed, fabricated, and measured. A very good agreement is confirmed by simulation and experimentation results of 680 MHz over 290 MHz (42.6%) NGD bandwidth (BW) around 0.7 GHz NGD center frequency. Also, the flat BP-NGD BW reaches 223 MHz (31.8%) over 569 MHz to 792 MHz with ±0.05 ns group-delay fluctuation with insertion and reflection losses better than 14 dB.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TCSII.2022.3233620</doi><tpages>1</tpages><orcidid>https://orcid.org/0000-0001-7613-226X</orcidid><orcidid>https://orcid.org/0000-0001-7334-5016</orcidid><orcidid>https://orcid.org/0000-0002-5626-6065</orcidid></addata></record> |
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subjects | Broadband Delay circuits Delays Design method Equivalent circuits Fluctuations Group delay group delay (GD) flatness Integrated circuit modeling Mathematical models negative group delay (NGD) Resonant frequency Topology transmission line (TL) Transmission lines Wideband |
title | Compact and Wideband Flat Negative Group Delay Circuit Investigation |
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