Real-time study of imaging electron current density on metal filament evolution in SiO2 during in situ TEM

Conductive-bridging random access memory devices are a candidate for artificial synapses for neuromorphic computing. However, there is still an incomplete understanding of the fundamentals of the filament evolution process. In this work, we study the effect of three imaging electron current densitie...

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Veröffentlicht in:Applied physics letters 2023-05, Vol.122 (21)
Hauptverfasser: Pandey, Saurabh, Hull, Robert
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Sprache:eng
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