Real-time study of imaging electron current density on metal filament evolution in SiO2 during in situ TEM
Conductive-bridging random access memory devices are a candidate for artificial synapses for neuromorphic computing. However, there is still an incomplete understanding of the fundamentals of the filament evolution process. In this work, we study the effect of three imaging electron current densitie...
Gespeichert in:
Veröffentlicht in: | Applied physics letters 2023-05, Vol.122 (21) |
---|---|
Hauptverfasser: | , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Schreiben Sie den ersten Kommentar!