Screen Printing Strategy for Investigation of Spectrophotometric Properties of Modified Thick Films of Zirconium Oxide (ZrO2): Tin Oxide (SnO2) Composites

There are numerous methods has been investigated and developed for the preparation of thin and thick films. Thick film technology is utilized for the production of electronic devices like surface mount devices, in the preparation of hybrid integrated circuit, in the formulation of heating elements,...

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Veröffentlicht in:Oriental journal of chemistry 2021-10, Vol.37 (5), p.1117-1124
Hauptverfasser: Nikam, R. M., Patil, A. P., Kapadnis, K. H., Ahirrao, A. D., Borse, R.Y.
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container_issue 5
container_start_page 1117
container_title Oriental journal of chemistry
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creator Nikam, R. M.
Patil, A. P.
Kapadnis, K. H.
Ahirrao, A. D.
Borse, R.Y.
description There are numerous methods has been investigated and developed for the preparation of thin and thick films. Thick film technology is utilized for the production of electronic devices like surface mount devices, in the preparation of hybrid integrated circuit, in the formulation of heating elements, in the construction of integrated passive devices and sensors. Pure tin oxide (SnO2) and composite 1%, 3%, 5%, 7% and 9 % zirconium oxide (ZrO2) thick films of dimensions 2 cm×1 cm incorporated into pure tin oxide (SnO2) were prepared with standard screen printing method. All samples were fabricated on glass support. The thick films were subjected to drying and firing at 5000C at 5 hours in muffle furnace. Thick films of tin oxide (SnO2) and composite 1%, 3%, 5%, 7% and 9 % zirconium oxide (ZrO2) incorporated into pure tin oxide (SnO2) were checked for Scanning Electron Microscopy (S.E.M), Energy Dispersive X-ray Spectroscopy (E.D.A.X), X-ray diffraction (X.R.D), Fourier Transform infra-Red (F.T.I.R) and Ultra-Violet-Visible spectroscopy (U.V) for surface morphology, elemental analysis, crystalline phases of films, vibrational and spectrophotometric study respectively. In this research paper the spectrophotometric parameters such as absorbance and absorption coefficient with pure and compositional thick films were a part of investigation and surveillance.
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2807982959</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2807982959</sourcerecordid><originalsourceid>FETCH-LOGICAL-c228t-c1e6e83bd6f05c933e68216c2a59644cb533859c0b1127251cd9d0fe755f451e3</originalsourceid><addsrcrecordid>eNo1kM9Kw0AQhxdRsGhPvsCCF0Vi9082yXqTYrVQqZAK0ktIN5N2a7Mbd7diX8WnNbY6l4GPb2aYH0IXlNxSTogY2LUa8JQIKo5QjzFOI0G4PEY9IlMSEUbeTlHf-zXpSsY8oaKHvnPlAAx-cdoEbZY4D64MsNzh2jo8Np_gg16WQVuDbY3zFlRwtl3ZYBsITqtu0rbgggb_KzzbStcaKjxbafWOR3rT7PlcO2WN3jZ4-qUrwFdzN2XXd3imzT_JTUfw0Dat9TqAP0cndbnx0P_rZ-h19DAbPkWT6eN4eD-JFGNZiBSFBDK-qJKaCCU5hyRjNFGsFDKJY7UQnGdCKrKglKVMUFXJitSQClHHggI_Q5eHva2zH9vu32Jtt850JwuWkVRmTArZWTcHSznrvYO6aJ1uSrcrKCn2-Rdd_sUhf_4D7DR46w</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2807982959</pqid></control><display><type>article</type><title>Screen Printing Strategy for Investigation of Spectrophotometric Properties of Modified Thick Films of Zirconium Oxide (ZrO2): Tin Oxide (SnO2) Composites</title><source>Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals</source><source>Free Full-Text Journals in Chemistry</source><creator>Nikam, R. M. ; Patil, A. P. ; Kapadnis, K. H. ; Ahirrao, A. D. ; Borse, R.Y.</creator><creatorcontrib>Nikam, R. M. ; Patil, A. P. ; Kapadnis, K. H. ; Ahirrao, A. D. ; Borse, R.Y.</creatorcontrib><description>There are numerous methods has been investigated and developed for the preparation of thin and thick films. Thick film technology is utilized for the production of electronic devices like surface mount devices, in the preparation of hybrid integrated circuit, in the formulation of heating elements, in the construction of integrated passive devices and sensors. Pure tin oxide (SnO2) and composite 1%, 3%, 5%, 7% and 9 % zirconium oxide (ZrO2) thick films of dimensions 2 cm×1 cm incorporated into pure tin oxide (SnO2) were prepared with standard screen printing method. All samples were fabricated on glass support. The thick films were subjected to drying and firing at 5000C at 5 hours in muffle furnace. Thick films of tin oxide (SnO2) and composite 1%, 3%, 5%, 7% and 9 % zirconium oxide (ZrO2) incorporated into pure tin oxide (SnO2) were checked for Scanning Electron Microscopy (S.E.M), Energy Dispersive X-ray Spectroscopy (E.D.A.X), X-ray diffraction (X.R.D), Fourier Transform infra-Red (F.T.I.R) and Ultra-Violet-Visible spectroscopy (U.V) for surface morphology, elemental analysis, crystalline phases of films, vibrational and spectrophotometric study respectively. In this research paper the spectrophotometric parameters such as absorbance and absorption coefficient with pure and compositional thick films were a part of investigation and surveillance.</description><identifier>ISSN: 0970-020X</identifier><identifier>EISSN: 2231-5039</identifier><identifier>DOI: 10.13005/ojc/370515</identifier><language>eng</language><publisher>Bhopal: Oriental Scientific Publishing Company</publisher><subject>Absorptivity ; Cellulose ; Electronic devices ; Fourier transforms ; Glass substrates ; Integrated circuits ; Morphology ; Muffle furnaces ; Nanomaterials ; Nanoparticles ; Potassium ; Scanning electron microscopy ; Screen printing ; Sensors ; Spectrophotometry ; Spectrum analysis ; Surface-mounted devices ; Thick films ; Thin films ; Tin ; Tin dioxide ; Tin oxides ; Transistors ; Zinc oxides ; Zirconium ; Zirconium dioxide ; Zirconium oxides</subject><ispartof>Oriental journal of chemistry, 2021-10, Vol.37 (5), p.1117-1124</ispartof><rights>2021. This work is published under http://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c228t-c1e6e83bd6f05c933e68216c2a59644cb533859c0b1127251cd9d0fe755f451e3</citedby><cites>FETCH-LOGICAL-c228t-c1e6e83bd6f05c933e68216c2a59644cb533859c0b1127251cd9d0fe755f451e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,777,781,27905,27906</link.rule.ids></links><search><creatorcontrib>Nikam, R. M.</creatorcontrib><creatorcontrib>Patil, A. P.</creatorcontrib><creatorcontrib>Kapadnis, K. H.</creatorcontrib><creatorcontrib>Ahirrao, A. D.</creatorcontrib><creatorcontrib>Borse, R.Y.</creatorcontrib><title>Screen Printing Strategy for Investigation of Spectrophotometric Properties of Modified Thick Films of Zirconium Oxide (ZrO2): Tin Oxide (SnO2) Composites</title><title>Oriental journal of chemistry</title><description>There are numerous methods has been investigated and developed for the preparation of thin and thick films. Thick film technology is utilized for the production of electronic devices like surface mount devices, in the preparation of hybrid integrated circuit, in the formulation of heating elements, in the construction of integrated passive devices and sensors. Pure tin oxide (SnO2) and composite 1%, 3%, 5%, 7% and 9 % zirconium oxide (ZrO2) thick films of dimensions 2 cm×1 cm incorporated into pure tin oxide (SnO2) were prepared with standard screen printing method. All samples were fabricated on glass support. The thick films were subjected to drying and firing at 5000C at 5 hours in muffle furnace. Thick films of tin oxide (SnO2) and composite 1%, 3%, 5%, 7% and 9 % zirconium oxide (ZrO2) incorporated into pure tin oxide (SnO2) were checked for Scanning Electron Microscopy (S.E.M), Energy Dispersive X-ray Spectroscopy (E.D.A.X), X-ray diffraction (X.R.D), Fourier Transform infra-Red (F.T.I.R) and Ultra-Violet-Visible spectroscopy (U.V) for surface morphology, elemental analysis, crystalline phases of films, vibrational and spectrophotometric study respectively. In this research paper the spectrophotometric parameters such as absorbance and absorption coefficient with pure and compositional thick films were a part of investigation and surveillance.</description><subject>Absorptivity</subject><subject>Cellulose</subject><subject>Electronic devices</subject><subject>Fourier transforms</subject><subject>Glass substrates</subject><subject>Integrated circuits</subject><subject>Morphology</subject><subject>Muffle furnaces</subject><subject>Nanomaterials</subject><subject>Nanoparticles</subject><subject>Potassium</subject><subject>Scanning electron microscopy</subject><subject>Screen printing</subject><subject>Sensors</subject><subject>Spectrophotometry</subject><subject>Spectrum analysis</subject><subject>Surface-mounted devices</subject><subject>Thick films</subject><subject>Thin films</subject><subject>Tin</subject><subject>Tin dioxide</subject><subject>Tin oxides</subject><subject>Transistors</subject><subject>Zinc oxides</subject><subject>Zirconium</subject><subject>Zirconium dioxide</subject><subject>Zirconium oxides</subject><issn>0970-020X</issn><issn>2231-5039</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNo1kM9Kw0AQhxdRsGhPvsCCF0Vi9082yXqTYrVQqZAK0ktIN5N2a7Mbd7diX8WnNbY6l4GPb2aYH0IXlNxSTogY2LUa8JQIKo5QjzFOI0G4PEY9IlMSEUbeTlHf-zXpSsY8oaKHvnPlAAx-cdoEbZY4D64MsNzh2jo8Np_gg16WQVuDbY3zFlRwtl3ZYBsITqtu0rbgggb_KzzbStcaKjxbafWOR3rT7PlcO2WN3jZ4-qUrwFdzN2XXd3imzT_JTUfw0Dat9TqAP0cndbnx0P_rZ-h19DAbPkWT6eN4eD-JFGNZiBSFBDK-qJKaCCU5hyRjNFGsFDKJY7UQnGdCKrKglKVMUFXJitSQClHHggI_Q5eHva2zH9vu32Jtt850JwuWkVRmTArZWTcHSznrvYO6aJ1uSrcrKCn2-Rdd_sUhf_4D7DR46w</recordid><startdate>20211030</startdate><enddate>20211030</enddate><creator>Nikam, R. M.</creator><creator>Patil, A. P.</creator><creator>Kapadnis, K. H.</creator><creator>Ahirrao, A. D.</creator><creator>Borse, R.Y.</creator><general>Oriental Scientific Publishing Company</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>KB.</scope><scope>PDBOC</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope></search><sort><creationdate>20211030</creationdate><title>Screen Printing Strategy for Investigation of Spectrophotometric Properties of Modified Thick Films of Zirconium Oxide (ZrO2): Tin Oxide (SnO2) Composites</title><author>Nikam, R. M. ; Patil, A. P. ; Kapadnis, K. H. ; Ahirrao, A. D. ; Borse, R.Y.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c228t-c1e6e83bd6f05c933e68216c2a59644cb533859c0b1127251cd9d0fe755f451e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><topic>Absorptivity</topic><topic>Cellulose</topic><topic>Electronic devices</topic><topic>Fourier transforms</topic><topic>Glass substrates</topic><topic>Integrated circuits</topic><topic>Morphology</topic><topic>Muffle furnaces</topic><topic>Nanomaterials</topic><topic>Nanoparticles</topic><topic>Potassium</topic><topic>Scanning electron microscopy</topic><topic>Screen printing</topic><topic>Sensors</topic><topic>Spectrophotometry</topic><topic>Spectrum analysis</topic><topic>Surface-mounted devices</topic><topic>Thick films</topic><topic>Thin films</topic><topic>Tin</topic><topic>Tin dioxide</topic><topic>Tin oxides</topic><topic>Transistors</topic><topic>Zinc oxides</topic><topic>Zirconium</topic><topic>Zirconium dioxide</topic><topic>Zirconium oxides</topic><toplevel>online_resources</toplevel><creatorcontrib>Nikam, R. M.</creatorcontrib><creatorcontrib>Patil, A. P.</creatorcontrib><creatorcontrib>Kapadnis, K. H.</creatorcontrib><creatorcontrib>Ahirrao, A. D.</creatorcontrib><creatorcontrib>Borse, R.Y.</creatorcontrib><collection>CrossRef</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science &amp; Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>SciTech Premium Collection</collection><collection>Materials Science Database</collection><collection>Materials Science Collection</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><jtitle>Oriental journal of chemistry</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Nikam, R. M.</au><au>Patil, A. P.</au><au>Kapadnis, K. H.</au><au>Ahirrao, A. D.</au><au>Borse, R.Y.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Screen Printing Strategy for Investigation of Spectrophotometric Properties of Modified Thick Films of Zirconium Oxide (ZrO2): Tin Oxide (SnO2) Composites</atitle><jtitle>Oriental journal of chemistry</jtitle><date>2021-10-30</date><risdate>2021</risdate><volume>37</volume><issue>5</issue><spage>1117</spage><epage>1124</epage><pages>1117-1124</pages><issn>0970-020X</issn><eissn>2231-5039</eissn><abstract>There are numerous methods has been investigated and developed for the preparation of thin and thick films. Thick film technology is utilized for the production of electronic devices like surface mount devices, in the preparation of hybrid integrated circuit, in the formulation of heating elements, in the construction of integrated passive devices and sensors. Pure tin oxide (SnO2) and composite 1%, 3%, 5%, 7% and 9 % zirconium oxide (ZrO2) thick films of dimensions 2 cm×1 cm incorporated into pure tin oxide (SnO2) were prepared with standard screen printing method. All samples were fabricated on glass support. The thick films were subjected to drying and firing at 5000C at 5 hours in muffle furnace. Thick films of tin oxide (SnO2) and composite 1%, 3%, 5%, 7% and 9 % zirconium oxide (ZrO2) incorporated into pure tin oxide (SnO2) were checked for Scanning Electron Microscopy (S.E.M), Energy Dispersive X-ray Spectroscopy (E.D.A.X), X-ray diffraction (X.R.D), Fourier Transform infra-Red (F.T.I.R) and Ultra-Violet-Visible spectroscopy (U.V) for surface morphology, elemental analysis, crystalline phases of films, vibrational and spectrophotometric study respectively. In this research paper the spectrophotometric parameters such as absorbance and absorption coefficient with pure and compositional thick films were a part of investigation and surveillance.</abstract><cop>Bhopal</cop><pub>Oriental Scientific Publishing Company</pub><doi>10.13005/ojc/370515</doi><tpages>8</tpages><oa>free_for_read</oa></addata></record>
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subjects Absorptivity
Cellulose
Electronic devices
Fourier transforms
Glass substrates
Integrated circuits
Morphology
Muffle furnaces
Nanomaterials
Nanoparticles
Potassium
Scanning electron microscopy
Screen printing
Sensors
Spectrophotometry
Spectrum analysis
Surface-mounted devices
Thick films
Thin films
Tin
Tin dioxide
Tin oxides
Transistors
Zinc oxides
Zirconium
Zirconium dioxide
Zirconium oxides
title Screen Printing Strategy for Investigation of Spectrophotometric Properties of Modified Thick Films of Zirconium Oxide (ZrO2): Tin Oxide (SnO2) Composites
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-18T07%3A12%3A20IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Screen%20Printing%20Strategy%20for%20Investigation%20of%20Spectrophotometric%20Properties%20of%20Modified%20Thick%20Films%20of%20Zirconium%20Oxide%20(ZrO2):%20Tin%20Oxide%20(SnO2)%20Composites&rft.jtitle=Oriental%20journal%20of%20chemistry&rft.au=Nikam,%20R.%20M.&rft.date=2021-10-30&rft.volume=37&rft.issue=5&rft.spage=1117&rft.epage=1124&rft.pages=1117-1124&rft.issn=0970-020X&rft.eissn=2231-5039&rft_id=info:doi/10.13005/ojc/370515&rft_dat=%3Cproquest_cross%3E2807982959%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2807982959&rft_id=info:pmid/&rfr_iscdi=true