Screen Printing Strategy for Investigation of Spectrophotometric Properties of Modified Thick Films of Zirconium Oxide (ZrO2): Tin Oxide (SnO2) Composites
There are numerous methods has been investigated and developed for the preparation of thin and thick films. Thick film technology is utilized for the production of electronic devices like surface mount devices, in the preparation of hybrid integrated circuit, in the formulation of heating elements,...
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Veröffentlicht in: | Oriental journal of chemistry 2021-10, Vol.37 (5), p.1117-1124 |
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description | There are numerous methods has been investigated and developed for the preparation of thin and thick films. Thick film technology is utilized for the production of electronic devices like surface mount devices, in the preparation of hybrid integrated circuit, in the formulation of heating elements, in the construction of integrated passive devices and sensors. Pure tin oxide (SnO2) and composite 1%, 3%, 5%, 7% and 9 % zirconium oxide (ZrO2) thick films of dimensions 2 cm×1 cm incorporated into pure tin oxide (SnO2) were prepared with standard screen printing method. All samples were fabricated on glass support. The thick films were subjected to drying and firing at 5000C at 5 hours in muffle furnace. Thick films of tin oxide (SnO2) and composite 1%, 3%, 5%, 7% and 9 % zirconium oxide (ZrO2) incorporated into pure tin oxide (SnO2) were checked for Scanning Electron Microscopy (S.E.M), Energy Dispersive X-ray Spectroscopy (E.D.A.X), X-ray diffraction (X.R.D), Fourier Transform infra-Red (F.T.I.R) and Ultra-Violet-Visible spectroscopy (U.V) for surface morphology, elemental analysis, crystalline phases of films, vibrational and spectrophotometric study respectively. In this research paper the spectrophotometric parameters such as absorbance and absorption coefficient with pure and compositional thick films were a part of investigation and surveillance. |
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M. ; Patil, A. P. ; Kapadnis, K. H. ; Ahirrao, A. D. ; Borse, R.Y.</creator><creatorcontrib>Nikam, R. M. ; Patil, A. P. ; Kapadnis, K. H. ; Ahirrao, A. D. ; Borse, R.Y.</creatorcontrib><description>There are numerous methods has been investigated and developed for the preparation of thin and thick films. Thick film technology is utilized for the production of electronic devices like surface mount devices, in the preparation of hybrid integrated circuit, in the formulation of heating elements, in the construction of integrated passive devices and sensors. Pure tin oxide (SnO2) and composite 1%, 3%, 5%, 7% and 9 % zirconium oxide (ZrO2) thick films of dimensions 2 cm×1 cm incorporated into pure tin oxide (SnO2) were prepared with standard screen printing method. All samples were fabricated on glass support. The thick films were subjected to drying and firing at 5000C at 5 hours in muffle furnace. Thick films of tin oxide (SnO2) and composite 1%, 3%, 5%, 7% and 9 % zirconium oxide (ZrO2) incorporated into pure tin oxide (SnO2) were checked for Scanning Electron Microscopy (S.E.M), Energy Dispersive X-ray Spectroscopy (E.D.A.X), X-ray diffraction (X.R.D), Fourier Transform infra-Red (F.T.I.R) and Ultra-Violet-Visible spectroscopy (U.V) for surface morphology, elemental analysis, crystalline phases of films, vibrational and spectrophotometric study respectively. In this research paper the spectrophotometric parameters such as absorbance and absorption coefficient with pure and compositional thick films were a part of investigation and surveillance.</description><identifier>ISSN: 0970-020X</identifier><identifier>EISSN: 2231-5039</identifier><identifier>DOI: 10.13005/ojc/370515</identifier><language>eng</language><publisher>Bhopal: Oriental Scientific Publishing Company</publisher><subject>Absorptivity ; Cellulose ; Electronic devices ; Fourier transforms ; Glass substrates ; Integrated circuits ; Morphology ; Muffle furnaces ; Nanomaterials ; Nanoparticles ; Potassium ; Scanning electron microscopy ; Screen printing ; Sensors ; Spectrophotometry ; Spectrum analysis ; Surface-mounted devices ; Thick films ; Thin films ; Tin ; Tin dioxide ; Tin oxides ; Transistors ; Zinc oxides ; Zirconium ; Zirconium dioxide ; Zirconium oxides</subject><ispartof>Oriental journal of chemistry, 2021-10, Vol.37 (5), p.1117-1124</ispartof><rights>2021. 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D.</creatorcontrib><creatorcontrib>Borse, R.Y.</creatorcontrib><title>Screen Printing Strategy for Investigation of Spectrophotometric Properties of Modified Thick Films of Zirconium Oxide (ZrO2): Tin Oxide (SnO2) Composites</title><title>Oriental journal of chemistry</title><description>There are numerous methods has been investigated and developed for the preparation of thin and thick films. Thick film technology is utilized for the production of electronic devices like surface mount devices, in the preparation of hybrid integrated circuit, in the formulation of heating elements, in the construction of integrated passive devices and sensors. Pure tin oxide (SnO2) and composite 1%, 3%, 5%, 7% and 9 % zirconium oxide (ZrO2) thick films of dimensions 2 cm×1 cm incorporated into pure tin oxide (SnO2) were prepared with standard screen printing method. All samples were fabricated on glass support. The thick films were subjected to drying and firing at 5000C at 5 hours in muffle furnace. Thick films of tin oxide (SnO2) and composite 1%, 3%, 5%, 7% and 9 % zirconium oxide (ZrO2) incorporated into pure tin oxide (SnO2) were checked for Scanning Electron Microscopy (S.E.M), Energy Dispersive X-ray Spectroscopy (E.D.A.X), X-ray diffraction (X.R.D), Fourier Transform infra-Red (F.T.I.R) and Ultra-Violet-Visible spectroscopy (U.V) for surface morphology, elemental analysis, crystalline phases of films, vibrational and spectrophotometric study respectively. In this research paper the spectrophotometric parameters such as absorbance and absorption coefficient with pure and compositional thick films were a part of investigation and surveillance.</description><subject>Absorptivity</subject><subject>Cellulose</subject><subject>Electronic devices</subject><subject>Fourier transforms</subject><subject>Glass substrates</subject><subject>Integrated circuits</subject><subject>Morphology</subject><subject>Muffle furnaces</subject><subject>Nanomaterials</subject><subject>Nanoparticles</subject><subject>Potassium</subject><subject>Scanning electron microscopy</subject><subject>Screen printing</subject><subject>Sensors</subject><subject>Spectrophotometry</subject><subject>Spectrum analysis</subject><subject>Surface-mounted devices</subject><subject>Thick films</subject><subject>Thin films</subject><subject>Tin</subject><subject>Tin dioxide</subject><subject>Tin oxides</subject><subject>Transistors</subject><subject>Zinc oxides</subject><subject>Zirconium</subject><subject>Zirconium dioxide</subject><subject>Zirconium oxides</subject><issn>0970-020X</issn><issn>2231-5039</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNo1kM9Kw0AQhxdRsGhPvsCCF0Vi9082yXqTYrVQqZAK0ktIN5N2a7Mbd7diX8WnNbY6l4GPb2aYH0IXlNxSTogY2LUa8JQIKo5QjzFOI0G4PEY9IlMSEUbeTlHf-zXpSsY8oaKHvnPlAAx-cdoEbZY4D64MsNzh2jo8Np_gg16WQVuDbY3zFlRwtl3ZYBsITqtu0rbgggb_KzzbStcaKjxbafWOR3rT7PlcO2WN3jZ4-qUrwFdzN2XXd3imzT_JTUfw0Dat9TqAP0cndbnx0P_rZ-h19DAbPkWT6eN4eD-JFGNZiBSFBDK-qJKaCCU5hyRjNFGsFDKJY7UQnGdCKrKglKVMUFXJitSQClHHggI_Q5eHva2zH9vu32Jtt850JwuWkVRmTArZWTcHSznrvYO6aJ1uSrcrKCn2-Rdd_sUhf_4D7DR46w</recordid><startdate>20211030</startdate><enddate>20211030</enddate><creator>Nikam, R. 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subjects | Absorptivity Cellulose Electronic devices Fourier transforms Glass substrates Integrated circuits Morphology Muffle furnaces Nanomaterials Nanoparticles Potassium Scanning electron microscopy Screen printing Sensors Spectrophotometry Spectrum analysis Surface-mounted devices Thick films Thin films Tin Tin dioxide Tin oxides Transistors Zinc oxides Zirconium Zirconium dioxide Zirconium oxides |
title | Screen Printing Strategy for Investigation of Spectrophotometric Properties of Modified Thick Films of Zirconium Oxide (ZrO2): Tin Oxide (SnO2) Composites |
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