Role of S/Se replacement on the structure of Ge20Se80-xSx glasses

The effect of S-content on the medium-and short-range order structure of Ge 20 Se 80− x S x x = 0 , 15 , 30 at % , has been investigated by using high-energy X-ray diffraction. Medium-range order changes, as illustrated by the parameters of the first sharp diffraction peak, were discussed in the light of the microcrystalline model. The short-range order parameters have been obtained by the analysis of the first two peaks in the curve of the total radial distribution function. The current results indicate that S-atoms enter the host network of the stiffness composition (Ge 20 Se 80 ) as compensation of Se-atoms.