Light emission processes in the context of optical beam profile monitors
Light emission from gas targets using heavy ion beam excitation is described. Typically 32 S beams with ≈90 MeV (2.8 MeV/amu) particle energy were used. This study was performed in context of optical beam profile measurements. Optical transitions from neutral and singly ionized rare gases are sugges...
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| Veröffentlicht in: | The European physical journal. D, Atomic, molecular, and optical physics Atomic, molecular, and optical physics, 2023-03, Vol.77 (3), Article 51 |
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| container_title | The European physical journal. D, Atomic, molecular, and optical physics |
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| creator | Hampf, Raphael Wieser, Jochen Ulrich, Andreas |
| description | Light emission from gas targets using heavy ion beam excitation is described. Typically
32
S beams with ≈90 MeV (2.8 MeV/amu) particle energy were used. This study was performed in context of optical beam profile measurements. Optical transitions from neutral and singly ionized rare gases are suggested for this application. Emission spectra and their line intensities are presented for a wide range of target pressures from about 10
–5
to 300 mbar. The effect of secondary electrons on the beam profiles is discussed. A comparison of ion beam and electron beam-induced spectra is shown and interpreted by a semi-quantitative model of the excitation mechanisms. Examples of beam profiles recorded with three different cameras through appropriate optical filters are presented. A comparison of projected profiles and radial profiles obtained by Abel inversion is given. Effective emission cross sections were measured for atomic and ionic lines at various target gas pressures and their pressure dependence interpreted by the excitation mechanisms. Examples of time-resolved measurements of light emission following pulsed excitation support the interpretation of the excitation mechanisms discussed in this overview of ion beam-induced light emission of gas targets.
Graphical Abstract |
| doi_str_mv | 10.1140/epjd/s10053-023-00624-6 |
| format | Article |
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32
S beams with ≈90 MeV (2.8 MeV/amu) particle energy were used. This study was performed in context of optical beam profile measurements. Optical transitions from neutral and singly ionized rare gases are suggested for this application. Emission spectra and their line intensities are presented for a wide range of target pressures from about 10
–5
to 300 mbar. The effect of secondary electrons on the beam profiles is discussed. A comparison of ion beam and electron beam-induced spectra is shown and interpreted by a semi-quantitative model of the excitation mechanisms. Examples of beam profiles recorded with three different cameras through appropriate optical filters are presented. A comparison of projected profiles and radial profiles obtained by Abel inversion is given. Effective emission cross sections were measured for atomic and ionic lines at various target gas pressures and their pressure dependence interpreted by the excitation mechanisms. Examples of time-resolved measurements of light emission following pulsed excitation support the interpretation of the excitation mechanisms discussed in this overview of ion beam-induced light emission of gas targets.
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32
S beams with ≈90 MeV (2.8 MeV/amu) particle energy were used. This study was performed in context of optical beam profile measurements. Optical transitions from neutral and singly ionized rare gases are suggested for this application. Emission spectra and their line intensities are presented for a wide range of target pressures from about 10
–5
to 300 mbar. The effect of secondary electrons on the beam profiles is discussed. A comparison of ion beam and electron beam-induced spectra is shown and interpreted by a semi-quantitative model of the excitation mechanisms. Examples of beam profiles recorded with three different cameras through appropriate optical filters are presented. A comparison of projected profiles and radial profiles obtained by Abel inversion is given. Effective emission cross sections were measured for atomic and ionic lines at various target gas pressures and their pressure dependence interpreted by the excitation mechanisms. Examples of time-resolved measurements of light emission following pulsed excitation support the interpretation of the excitation mechanisms discussed in this overview of ion beam-induced light emission of gas targets.
Graphical Abstract</description><subject>Applications of Nonlinear Dynamics and Chaos Theory</subject><subject>Atomic</subject><subject>Context</subject><subject>Electron beams</subject><subject>Emission spectra</subject><subject>Excitation</subject><subject>Gases</subject><subject>Heavy ions</subject><subject>Ion beams</subject><subject>Light emission</subject><subject>Line spectra</subject><subject>Molecular</subject><subject>Optical and Plasma Physics</subject><subject>Optical filters</subject><subject>Particle beams</subject><subject>Particle energy</subject><subject>Physical Chemistry</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><subject>Pressure dependence</subject><subject>Quantum Information Technology</subject><subject>Quantum Physics</subject><subject>Rare gases</subject><subject>Regular Article – Plasma Physics</subject><subject>Spectroscopy/Spectrometry</subject><subject>Spintronics</subject><issn>1434-6060</issn><issn>1434-6079</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2023</creationdate><recordtype>article</recordtype><sourceid>C6C</sourceid><recordid>eNqFkE1LAzEQhoMoWD9-gwHPaycfm909SlErFLzoOWyzkzalu1mTFPTfm7qiRw_DvAPvOzM8hNwwuGNMwhzHXTePDKAUBfBcoLgs1AmZMSmygKo5_dUKzslFjDsA4KVUM7Jcuc02UexdjM4PdAzeYIwYqRto2iI1fkj4kai31I_JmXZP19j2R6N1e6S9H1zyIV6RM9vuI17_9Evy9vjwulgWq5en58X9qjCCN6koVakAWQ1qbaBSWVvgzBguwHKpGrRVxxtbI8pKijzZjhvRdl1TWewAxSW5nfbmB94PGJPe-UMY8knNq0ZIoXjNsquaXCb4GANaPQbXt-FTM9BHbPqITU_YdMamv7FplZP1lIw5MWww_O3_L_oFuMR0Xg</recordid><startdate>20230301</startdate><enddate>20230301</enddate><creator>Hampf, Raphael</creator><creator>Wieser, Jochen</creator><creator>Ulrich, Andreas</creator><general>Springer Berlin Heidelberg</general><general>Springer Nature B.V</general><scope>C6C</scope><scope>AAYXX</scope><scope>CITATION</scope><orcidid>https://orcid.org/0000-0001-8167-7387</orcidid></search><sort><creationdate>20230301</creationdate><title>Light emission processes in the context of optical beam profile monitors</title><author>Hampf, Raphael ; Wieser, Jochen ; Ulrich, Andreas</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c329t-56560e1806bc07660ef021cc230f2469ef7d29f8ee4743ef7fd2c3add97fed0e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2023</creationdate><topic>Applications of Nonlinear Dynamics and Chaos Theory</topic><topic>Atomic</topic><topic>Context</topic><topic>Electron beams</topic><topic>Emission spectra</topic><topic>Excitation</topic><topic>Gases</topic><topic>Heavy ions</topic><topic>Ion beams</topic><topic>Light emission</topic><topic>Line spectra</topic><topic>Molecular</topic><topic>Optical and Plasma Physics</topic><topic>Optical filters</topic><topic>Particle beams</topic><topic>Particle energy</topic><topic>Physical Chemistry</topic><topic>Physics</topic><topic>Physics and Astronomy</topic><topic>Pressure dependence</topic><topic>Quantum Information Technology</topic><topic>Quantum Physics</topic><topic>Rare gases</topic><topic>Regular Article – Plasma Physics</topic><topic>Spectroscopy/Spectrometry</topic><topic>Spintronics</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Hampf, Raphael</creatorcontrib><creatorcontrib>Wieser, Jochen</creatorcontrib><creatorcontrib>Ulrich, Andreas</creatorcontrib><collection>Springer Nature OA Free Journals</collection><collection>CrossRef</collection><jtitle>The European physical journal. D, Atomic, molecular, and optical physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Hampf, Raphael</au><au>Wieser, Jochen</au><au>Ulrich, Andreas</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Light emission processes in the context of optical beam profile monitors</atitle><jtitle>The European physical journal. D, Atomic, molecular, and optical physics</jtitle><stitle>Eur. Phys. J. D</stitle><date>2023-03-01</date><risdate>2023</risdate><volume>77</volume><issue>3</issue><artnum>51</artnum><issn>1434-6060</issn><eissn>1434-6079</eissn><abstract>Light emission from gas targets using heavy ion beam excitation is described. Typically
32
S beams with ≈90 MeV (2.8 MeV/amu) particle energy were used. This study was performed in context of optical beam profile measurements. Optical transitions from neutral and singly ionized rare gases are suggested for this application. Emission spectra and their line intensities are presented for a wide range of target pressures from about 10
–5
to 300 mbar. The effect of secondary electrons on the beam profiles is discussed. A comparison of ion beam and electron beam-induced spectra is shown and interpreted by a semi-quantitative model of the excitation mechanisms. Examples of beam profiles recorded with three different cameras through appropriate optical filters are presented. A comparison of projected profiles and radial profiles obtained by Abel inversion is given. Effective emission cross sections were measured for atomic and ionic lines at various target gas pressures and their pressure dependence interpreted by the excitation mechanisms. Examples of time-resolved measurements of light emission following pulsed excitation support the interpretation of the excitation mechanisms discussed in this overview of ion beam-induced light emission of gas targets.
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| subjects | Applications of Nonlinear Dynamics and Chaos Theory Atomic Context Electron beams Emission spectra Excitation Gases Heavy ions Ion beams Light emission Line spectra Molecular Optical and Plasma Physics Optical filters Particle beams Particle energy Physical Chemistry Physics Physics and Astronomy Pressure dependence Quantum Information Technology Quantum Physics Rare gases Regular Article – Plasma Physics Spectroscopy/Spectrometry Spintronics |
| title | Light emission processes in the context of optical beam profile monitors |
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