Effect of oxalic acid (complexing agent) on anodic dissolution of Cobalt in hydrogen peroxide solutions: mechanism and kinetic analysis by electrochemical impedance spectroscopy

The anodic dissolution of Cobalt in H 2 O 2 solution is investigated in the presence and absence of a complexing agent, oxalic acid, using various techniques including electrochemical impedance spectroscopy (EIS). Anodic polarization measurements of both the solutions show that active dissolution oc...

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Veröffentlicht in:Journal of solid state electrochemistry 2023-04, Vol.27 (4), p.895-909
Hauptverfasser: Hazarika, Jenasree, Talukdar, Anusuya, Rajaraman, Prasanna Venkatesh
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Talukdar, Anusuya
Rajaraman, Prasanna Venkatesh
description The anodic dissolution of Cobalt in H 2 O 2 solution is investigated in the presence and absence of a complexing agent, oxalic acid, using various techniques including electrochemical impedance spectroscopy (EIS). Anodic polarization measurements of both the solutions show that active dissolution occurs in the potential range of 0 to 600 mV w.r.t open circuit potential (OCP) and the addition of oxalic acid enhances the dissolution of Co by forming highly soluble Cobalt complexes. The mechanistic reaction pathway of Co dissolution at metal-solution interface is investigated by performing EIS measurements at various overpotentials under anodic conditions. EIS spectra exhibit two loops; capacitance (higher frequency) followed by inductance (lower frequency) at all the overpotentials and it was modeled by a multi-step mechanism with 3 intermediate adsorbed species. The dissolution via both chemical and electrochemical steps is considered in the proposed model. From the parameters obtained, dominance of C o ad 2 + species on the Co metal surface is observed for both the systems. The oxides/hydroxides formed on the Co surface on the addition of oxalic acid to H 2 O 2 are higher than using only H 2 O 2 , thus properly justifying the role of a complexing agent in a CMP slurry. Products formed on exposure of Co to H 2 O 2 and H 2 O 2 -oxalic acid solution at pH 9 are analyzed using X-ray photoelectron spectroscopy (XPS) analysis. The results confirm the formation and dominance of Co-oxalate complexes in H 2 O 2 —oxalic acid system. Graphical abstract
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Anodic polarization measurements of both the solutions show that active dissolution occurs in the potential range of 0 to 600 mV w.r.t open circuit potential (OCP) and the addition of oxalic acid enhances the dissolution of Co by forming highly soluble Cobalt complexes. The mechanistic reaction pathway of Co dissolution at metal-solution interface is investigated by performing EIS measurements at various overpotentials under anodic conditions. EIS spectra exhibit two loops; capacitance (higher frequency) followed by inductance (lower frequency) at all the overpotentials and it was modeled by a multi-step mechanism with 3 intermediate adsorbed species. The dissolution via both chemical and electrochemical steps is considered in the proposed model. From the parameters obtained, dominance of C o ad 2 + species on the Co metal surface is observed for both the systems. The oxides/hydroxides formed on the Co surface on the addition of oxalic acid to H 2 O 2 are higher than using only H 2 O 2 , thus properly justifying the role of a complexing agent in a CMP slurry. Products formed on exposure of Co to H 2 O 2 and H 2 O 2 -oxalic acid solution at pH 9 are analyzed using X-ray photoelectron spectroscopy (XPS) analysis. The results confirm the formation and dominance of Co-oxalate complexes in H 2 O 2 —oxalic acid system. 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Anodic polarization measurements of both the solutions show that active dissolution occurs in the potential range of 0 to 600 mV w.r.t open circuit potential (OCP) and the addition of oxalic acid enhances the dissolution of Co by forming highly soluble Cobalt complexes. The mechanistic reaction pathway of Co dissolution at metal-solution interface is investigated by performing EIS measurements at various overpotentials under anodic conditions. EIS spectra exhibit two loops; capacitance (higher frequency) followed by inductance (lower frequency) at all the overpotentials and it was modeled by a multi-step mechanism with 3 intermediate adsorbed species. The dissolution via both chemical and electrochemical steps is considered in the proposed model. From the parameters obtained, dominance of C o ad 2 + species on the Co metal surface is observed for both the systems. The oxides/hydroxides formed on the Co surface on the addition of oxalic acid to H 2 O 2 are higher than using only H 2 O 2 , thus properly justifying the role of a complexing agent in a CMP slurry. Products formed on exposure of Co to H 2 O 2 and H 2 O 2 -oxalic acid solution at pH 9 are analyzed using X-ray photoelectron spectroscopy (XPS) analysis. The results confirm the formation and dominance of Co-oxalate complexes in H 2 O 2 —oxalic acid system. 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Anodic polarization measurements of both the solutions show that active dissolution occurs in the potential range of 0 to 600 mV w.r.t open circuit potential (OCP) and the addition of oxalic acid enhances the dissolution of Co by forming highly soluble Cobalt complexes. The mechanistic reaction pathway of Co dissolution at metal-solution interface is investigated by performing EIS measurements at various overpotentials under anodic conditions. EIS spectra exhibit two loops; capacitance (higher frequency) followed by inductance (lower frequency) at all the overpotentials and it was modeled by a multi-step mechanism with 3 intermediate adsorbed species. The dissolution via both chemical and electrochemical steps is considered in the proposed model. From the parameters obtained, dominance of C o ad 2 + species on the Co metal surface is observed for both the systems. The oxides/hydroxides formed on the Co surface on the addition of oxalic acid to H 2 O 2 are higher than using only H 2 O 2 , thus properly justifying the role of a complexing agent in a CMP slurry. Products formed on exposure of Co to H 2 O 2 and H 2 O 2 -oxalic acid solution at pH 9 are analyzed using X-ray photoelectron spectroscopy (XPS) analysis. The results confirm the formation and dominance of Co-oxalate complexes in H 2 O 2 —oxalic acid system. Graphical abstract</abstract><cop>Berlin/Heidelberg</cop><pub>Springer Berlin Heidelberg</pub><doi>10.1007/s10008-023-05379-z</doi><tpages>15</tpages><orcidid>https://orcid.org/0000-0003-4510-018X</orcidid></addata></record>
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subjects Acids
Analytical Chemistry
Anodic dissolution
Anodic polarization
Characterization and Evaluation of Materials
Chemistry
Chemistry and Materials Science
Cobalt compounds
Condensed Matter Physics
Dissolution
Electrochemical impedance spectroscopy
Electrochemistry
Electrode polarization
Energy Storage
Hydrogen peroxide
Hydroxides
Inductance
Metal surfaces
Open circuit voltage
Original Paper
Oxalic acid
Photoelectrons
Physical Chemistry
Spectroscopic analysis
Spectrum analysis
X ray photoelectron spectroscopy
title Effect of oxalic acid (complexing agent) on anodic dissolution of Cobalt in hydrogen peroxide solutions: mechanism and kinetic analysis by electrochemical impedance spectroscopy
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