An Ab Initio, Fully Coherent, Semi-Analytical Model of Surface-Roughness-Induced Scattering

Integrated optics and silicon photonics is a rapidly maturing technology and is progressing in telecom, computation, and sensing. Surface-roughness-induced scattering is the primary source of optical loss in any photonic integrated circuit, and as such, ultimately limits the performance of any of it...

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Veröffentlicht in:Journal of lightwave technology 2023-03, Vol.41 (5), p.1-8
Hauptverfasser: Hormann, Samuel, Hinum-Wagner, Jakob W., Bergmann, Alexander
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Sprache:eng
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