Real-Time External Compensation System With Error Correction Algorithm for High-Resolution Mobile Displays
This paper presents an external compensation system for QHD + (3040 \times 1224) mobile active-matrix organic light emitting diode (AMOLED) displays at a frame rate of 60 Hz. During vertical blank periods, current sensing AFE (CS-AFE) measures OLED currents to calculate threshold voltage ( V_{TH}...
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Veröffentlicht in: | IEEE transactions on circuits and systems. I, Regular papers Regular papers, 2023-03, Vol.70 (3), p.1-12 |
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description | This paper presents an external compensation system for QHD + (3040 \times 1224) mobile active-matrix organic light emitting diode (AMOLED) displays at a frame rate of 60 Hz. During vertical blank periods, current sensing AFE (CS-AFE) measures OLED currents to calculate threshold voltage ( V_{TH}) of driving thin-film transistors (TFTs). For precise V_{TH} calculation against panel ground noise, a differential sensing scheme with 5-bit programmable capacitor array (PCA) is employed. In addition, digital correlated double sampling (CDS) removes an offset of the CS-AFE. However, recent advances in high efficiency OLED technology have led to increase in pixel density as well as the driving TFTs to operate close to subthreshold region. Therefore, the V_{TH} calculation based on the quadratic model yields inaccurate results. To compensate for the modeling error, we propose an error correction algorithm, which establishes an error function using a relationship between the modeling error and calculated threshold voltage during the manufacturing process. The proposed external compensation system was verified using CMOS-modeled three transistors and one capacitor (3T1C) pixel circuit. The test chip, fabricated in a 0.18 \mu m BCD process, comprises 26 channels. Each channel consumes 78 \mu W and occupies 1350 \times 50 \mu m ^{2} . Measurement results show that current error at 64 ^{\mathrm{th}} gray level is reduced from 35.56 LSB to 6.03 LSB after error correction and four frames average. |
doi_str_mv | 10.1109/TCSI.2022.3223975 |
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During vertical blank periods, current sensing AFE (CS-AFE) measures OLED currents to calculate threshold voltage (<inline-formula> <tex-math notation="LaTeX">V_{TH})</tex-math> </inline-formula> of driving thin-film transistors (TFTs). For precise <inline-formula> <tex-math notation="LaTeX">V_{TH}</tex-math> </inline-formula> calculation against panel ground noise, a differential sensing scheme with 5-bit programmable capacitor array (PCA) is employed. In addition, digital correlated double sampling (CDS) removes an offset of the CS-AFE. However, recent advances in high efficiency OLED technology have led to increase in pixel density as well as the driving TFTs to operate close to subthreshold region. Therefore, the <inline-formula> <tex-math notation="LaTeX">V_{TH}</tex-math> </inline-formula> calculation based on the quadratic model yields inaccurate results. To compensate for the modeling error, we propose an error correction algorithm, which establishes an error function using a relationship between the modeling error and calculated threshold voltage during the manufacturing process. The proposed external compensation system was verified using CMOS-modeled three transistors and one capacitor (3T1C) pixel circuit. The test chip, fabricated in a 0.18 <inline-formula> <tex-math notation="LaTeX">\mu </tex-math> </inline-formula>m BCD process, comprises 26 channels. Each channel consumes 78 <inline-formula> <tex-math notation="LaTeX">\mu </tex-math> </inline-formula>W and occupies 1350 <inline-formula> <tex-math notation="LaTeX">\times</tex-math> </inline-formula> 50 <inline-formula> <tex-math notation="LaTeX">\mu </tex-math> </inline-formula>m<inline-formula> <tex-math notation="LaTeX">^{2}</tex-math> </inline-formula>. Measurement results show that current error at 64<inline-formula> <tex-math notation="LaTeX">^{\mathrm{th}}</tex-math> </inline-formula> gray level is reduced from 35.56 LSB to 6.03 LSB after error correction and four frames average.]]></description><identifier>ISSN: 1549-8328</identifier><identifier>EISSN: 1558-0806</identifier><identifier>DOI: 10.1109/TCSI.2022.3223975</identifier><identifier>CODEN: ITCSCH</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Active matrix displays ; Active matrix organic light-emitting diode (AMOLED) ; Algorithms ; bias stress instability ; Capacitors ; Circuits ; column driver ; Compensation ; current sensing AFE ; Displays ; Error analysis ; Error correction ; Error correction & detection ; error correction algorithm ; Error functions ; external compensation ; high-resolution and high frame rate displays ; Mathematical models ; Modelling ; Organic light emitting diodes ; Pixels ; Semiconductor devices ; Thin film transistors ; thin-film transistor (TFT) ; Threshold voltage ; Transistors</subject><ispartof>IEEE transactions on circuits and systems. I, Regular papers, 2023-03, Vol.70 (3), p.1-12</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2023</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c245t-3b727f4791098b80d80b8d1a5f2ae0f14f3e26ba6f33906730c0de74f4132b6f3</cites><orcidid>0000-0002-9582-295X ; 0000-0001-7576-8506 ; 0000-0001-5028-1750</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/9967376$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/9967376$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Park, Kyeongmin</creatorcontrib><creatorcontrib>Oh, Seunghun</creatorcontrib><creatorcontrib>Choi, Dongjin</creatorcontrib><creatorcontrib>Shin, Kyeonghan</creatorcontrib><creatorcontrib>Cho, Haewan</creatorcontrib><creatorcontrib>Bien, Franklin</creatorcontrib><title>Real-Time External Compensation System With Error Correction Algorithm for High-Resolution Mobile Displays</title><title>IEEE transactions on circuits and systems. I, Regular papers</title><addtitle>TCSI</addtitle><description><![CDATA[This paper presents an external compensation system for QHD<inline-formula> <tex-math notation="LaTeX">+</tex-math> </inline-formula> (3040 <inline-formula> <tex-math notation="LaTeX">\times</tex-math> </inline-formula> 1224) mobile active-matrix organic light emitting diode (AMOLED) displays at a frame rate of 60 Hz. During vertical blank periods, current sensing AFE (CS-AFE) measures OLED currents to calculate threshold voltage (<inline-formula> <tex-math notation="LaTeX">V_{TH})</tex-math> </inline-formula> of driving thin-film transistors (TFTs). For precise <inline-formula> <tex-math notation="LaTeX">V_{TH}</tex-math> </inline-formula> calculation against panel ground noise, a differential sensing scheme with 5-bit programmable capacitor array (PCA) is employed. In addition, digital correlated double sampling (CDS) removes an offset of the CS-AFE. However, recent advances in high efficiency OLED technology have led to increase in pixel density as well as the driving TFTs to operate close to subthreshold region. Therefore, the <inline-formula> <tex-math notation="LaTeX">V_{TH}</tex-math> </inline-formula> calculation based on the quadratic model yields inaccurate results. To compensate for the modeling error, we propose an error correction algorithm, which establishes an error function using a relationship between the modeling error and calculated threshold voltage during the manufacturing process. The proposed external compensation system was verified using CMOS-modeled three transistors and one capacitor (3T1C) pixel circuit. The test chip, fabricated in a 0.18 <inline-formula> <tex-math notation="LaTeX">\mu </tex-math> </inline-formula>m BCD process, comprises 26 channels. Each channel consumes 78 <inline-formula> <tex-math notation="LaTeX">\mu </tex-math> </inline-formula>W and occupies 1350 <inline-formula> <tex-math notation="LaTeX">\times</tex-math> </inline-formula> 50 <inline-formula> <tex-math notation="LaTeX">\mu </tex-math> </inline-formula>m<inline-formula> <tex-math notation="LaTeX">^{2}</tex-math> </inline-formula>. Measurement results show that current error at 64<inline-formula> <tex-math notation="LaTeX">^{\mathrm{th}}</tex-math> </inline-formula> gray level is reduced from 35.56 LSB to 6.03 LSB after error correction and four frames average.]]></description><subject>Active matrix displays</subject><subject>Active matrix organic light-emitting diode (AMOLED)</subject><subject>Algorithms</subject><subject>bias stress instability</subject><subject>Capacitors</subject><subject>Circuits</subject><subject>column driver</subject><subject>Compensation</subject><subject>current sensing AFE</subject><subject>Displays</subject><subject>Error analysis</subject><subject>Error correction</subject><subject>Error correction & detection</subject><subject>error correction algorithm</subject><subject>Error functions</subject><subject>external compensation</subject><subject>high-resolution and high frame rate displays</subject><subject>Mathematical models</subject><subject>Modelling</subject><subject>Organic light emitting diodes</subject><subject>Pixels</subject><subject>Semiconductor devices</subject><subject>Thin film transistors</subject><subject>thin-film transistor (TFT)</subject><subject>Threshold voltage</subject><subject>Transistors</subject><issn>1549-8328</issn><issn>1558-0806</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2023</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kE9PwkAQxTdGExH9AMZLE8_F_dN2d4-kopBgTADjsdmWWVjSsnW3JPLt3QLxNJP5vZnMewg9EjwiBMuXVb6cjSimdMQoZZKnV2hA0lTEWODsuu8TGQtGxS26836HMZWYkQHaLUDV8co0EE1-O3B7VUe5bVrYe9UZu4-WR99BE32bbhtNnLMuYOegOsFxvbEukCbSAUzNZhsvwNv6cKIftjQ1RK_Gt7U6-nt0o1Xt4eFSh-jrbbLKp_H8832Wj-dxRZO0i1nJKdcJl8GWKAVeC1yKNVGppgqwJolmQLNSZZoxiTPOcIXXwBOdEEbLMB2i5_Pd1tmfA_iu2NlDb8wXlHOZZUJwGlTkrKqc9d6BLlpnGuWOBcFFH2nRR1r0kRaXSMPO03nHAMC_XsrwBM_YHz4McvE</recordid><startdate>20230301</startdate><enddate>20230301</enddate><creator>Park, Kyeongmin</creator><creator>Oh, Seunghun</creator><creator>Choi, Dongjin</creator><creator>Shin, Kyeonghan</creator><creator>Cho, Haewan</creator><creator>Bien, Franklin</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0002-9582-295X</orcidid><orcidid>https://orcid.org/0000-0001-7576-8506</orcidid><orcidid>https://orcid.org/0000-0001-5028-1750</orcidid></search><sort><creationdate>20230301</creationdate><title>Real-Time External Compensation System With Error Correction Algorithm for High-Resolution Mobile Displays</title><author>Park, Kyeongmin ; Oh, Seunghun ; Choi, Dongjin ; Shin, Kyeonghan ; Cho, Haewan ; Bien, Franklin</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c245t-3b727f4791098b80d80b8d1a5f2ae0f14f3e26ba6f33906730c0de74f4132b6f3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2023</creationdate><topic>Active matrix displays</topic><topic>Active matrix organic light-emitting diode (AMOLED)</topic><topic>Algorithms</topic><topic>bias stress instability</topic><topic>Capacitors</topic><topic>Circuits</topic><topic>column driver</topic><topic>Compensation</topic><topic>current sensing AFE</topic><topic>Displays</topic><topic>Error analysis</topic><topic>Error correction</topic><topic>Error correction & detection</topic><topic>error correction algorithm</topic><topic>Error functions</topic><topic>external compensation</topic><topic>high-resolution and high frame rate displays</topic><topic>Mathematical models</topic><topic>Modelling</topic><topic>Organic light emitting diodes</topic><topic>Pixels</topic><topic>Semiconductor devices</topic><topic>Thin film transistors</topic><topic>thin-film transistor (TFT)</topic><topic>Threshold voltage</topic><topic>Transistors</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Park, Kyeongmin</creatorcontrib><creatorcontrib>Oh, Seunghun</creatorcontrib><creatorcontrib>Choi, Dongjin</creatorcontrib><creatorcontrib>Shin, Kyeonghan</creatorcontrib><creatorcontrib>Cho, Haewan</creatorcontrib><creatorcontrib>Bien, Franklin</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on circuits and systems. I, Regular papers</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Park, Kyeongmin</au><au>Oh, Seunghun</au><au>Choi, Dongjin</au><au>Shin, Kyeonghan</au><au>Cho, Haewan</au><au>Bien, Franklin</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Real-Time External Compensation System With Error Correction Algorithm for High-Resolution Mobile Displays</atitle><jtitle>IEEE transactions on circuits and systems. I, Regular papers</jtitle><stitle>TCSI</stitle><date>2023-03-01</date><risdate>2023</risdate><volume>70</volume><issue>3</issue><spage>1</spage><epage>12</epage><pages>1-12</pages><issn>1549-8328</issn><eissn>1558-0806</eissn><coden>ITCSCH</coden><abstract><![CDATA[This paper presents an external compensation system for QHD<inline-formula> <tex-math notation="LaTeX">+</tex-math> </inline-formula> (3040 <inline-formula> <tex-math notation="LaTeX">\times</tex-math> </inline-formula> 1224) mobile active-matrix organic light emitting diode (AMOLED) displays at a frame rate of 60 Hz. During vertical blank periods, current sensing AFE (CS-AFE) measures OLED currents to calculate threshold voltage (<inline-formula> <tex-math notation="LaTeX">V_{TH})</tex-math> </inline-formula> of driving thin-film transistors (TFTs). For precise <inline-formula> <tex-math notation="LaTeX">V_{TH}</tex-math> </inline-formula> calculation against panel ground noise, a differential sensing scheme with 5-bit programmable capacitor array (PCA) is employed. In addition, digital correlated double sampling (CDS) removes an offset of the CS-AFE. However, recent advances in high efficiency OLED technology have led to increase in pixel density as well as the driving TFTs to operate close to subthreshold region. Therefore, the <inline-formula> <tex-math notation="LaTeX">V_{TH}</tex-math> </inline-formula> calculation based on the quadratic model yields inaccurate results. To compensate for the modeling error, we propose an error correction algorithm, which establishes an error function using a relationship between the modeling error and calculated threshold voltage during the manufacturing process. The proposed external compensation system was verified using CMOS-modeled three transistors and one capacitor (3T1C) pixel circuit. The test chip, fabricated in a 0.18 <inline-formula> <tex-math notation="LaTeX">\mu </tex-math> </inline-formula>m BCD process, comprises 26 channels. Each channel consumes 78 <inline-formula> <tex-math notation="LaTeX">\mu </tex-math> </inline-formula>W and occupies 1350 <inline-formula> <tex-math notation="LaTeX">\times</tex-math> </inline-formula> 50 <inline-formula> <tex-math notation="LaTeX">\mu </tex-math> </inline-formula>m<inline-formula> <tex-math notation="LaTeX">^{2}</tex-math> </inline-formula>. Measurement results show that current error at 64<inline-formula> <tex-math notation="LaTeX">^{\mathrm{th}}</tex-math> </inline-formula> gray level is reduced from 35.56 LSB to 6.03 LSB after error correction and four frames average.]]></abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TCSI.2022.3223975</doi><tpages>12</tpages><orcidid>https://orcid.org/0000-0002-9582-295X</orcidid><orcidid>https://orcid.org/0000-0001-7576-8506</orcidid><orcidid>https://orcid.org/0000-0001-5028-1750</orcidid></addata></record> |
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subjects | Active matrix displays Active matrix organic light-emitting diode (AMOLED) Algorithms bias stress instability Capacitors Circuits column driver Compensation current sensing AFE Displays Error analysis Error correction Error correction & detection error correction algorithm Error functions external compensation high-resolution and high frame rate displays Mathematical models Modelling Organic light emitting diodes Pixels Semiconductor devices Thin film transistors thin-film transistor (TFT) Threshold voltage Transistors |
title | Real-Time External Compensation System With Error Correction Algorithm for High-Resolution Mobile Displays |
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