PWB Manufacturing Variability Effects on High Speed SerDes Links: Statistical Insights from Thousands of 4-Port SParameter Measurements

Variability analysis is important in successfully deploying multi-gigabit backplane printed wiring boards (PWBs) with growing numbers of high-speed SerDes links. We discuss the need for large sample sizes to obtain accurate variability estimates of SI metrics (eye height, phase skew, etc). Using a d...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:arXiv.org 2023-01
Hauptverfasser: McCoy, Bart O, Techentin, Robert W, Buhrow, Benjamin R, Buchs, Kevin, Lin, How, Gilbert, Barry K, Daniel, Erik S
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title arXiv.org
container_volume
creator McCoy, Bart O
Techentin, Robert W
Buhrow, Benjamin R
Buchs, Kevin
Lin, How
Gilbert, Barry K
Daniel, Erik S
description Variability analysis is important in successfully deploying multi-gigabit backplane printed wiring boards (PWBs) with growing numbers of high-speed SerDes links. We discuss the need for large sample sizes to obtain accurate variability estimates of SI metrics (eye height, phase skew, etc). Using a dataset of 11,961 S-parameters, we demonstrate statistical techniques to extract accurate estimates of PWB SI performance variations. We cite numerical examples illustrating how these variations may contribute to underestimated or overestimated design criteria, causing unnecessary design expense. Tabular summaries of performance variation and key findings of broad interest to the general SI community are highlighted.
format Article
fullrecord <record><control><sourceid>proquest</sourceid><recordid>TN_cdi_proquest_journals_2769438098</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2769438098</sourcerecordid><originalsourceid>FETCH-proquest_journals_27694380983</originalsourceid><addsrcrecordid>eNqNi8FKw0AQQBdBsGj_YcBzIO6mbepRrVSwEEjRYxnT2XZrsltnZg9-gb9tDn6Ap3d4712YiXXurqgra6_MVORUlqWdL-xs5ibmp3l_gA3G7LHTzCEe4A054Efog37DynvqVCBFWIfDEdoz0R5a4icSeA3xU-6hVdQgGjrs4SXKmI2D5zTA9piyYNyPv4eqaBIrtA0yDqTEsCGUzDRQVLkxlx57oekfr83t82r7uC7OnL4yie5OKXMc1c4u5svK1eWydv-rfgEOyFLL</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2769438098</pqid></control><display><type>article</type><title>PWB Manufacturing Variability Effects on High Speed SerDes Links: Statistical Insights from Thousands of 4-Port SParameter Measurements</title><source>Free E- Journals</source><creator>McCoy, Bart O ; Techentin, Robert W ; Buhrow, Benjamin R ; Buchs, Kevin ; Lin, How ; Gilbert, Barry K ; Daniel, Erik S</creator><creatorcontrib>McCoy, Bart O ; Techentin, Robert W ; Buhrow, Benjamin R ; Buchs, Kevin ; Lin, How ; Gilbert, Barry K ; Daniel, Erik S</creatorcontrib><description>Variability analysis is important in successfully deploying multi-gigabit backplane printed wiring boards (PWBs) with growing numbers of high-speed SerDes links. We discuss the need for large sample sizes to obtain accurate variability estimates of SI metrics (eye height, phase skew, etc). Using a dataset of 11,961 S-parameters, we demonstrate statistical techniques to extract accurate estimates of PWB SI performance variations. We cite numerical examples illustrating how these variations may contribute to underestimated or overestimated design criteria, causing unnecessary design expense. Tabular summaries of performance variation and key findings of broad interest to the general SI community are highlighted.</description><identifier>EISSN: 2331-8422</identifier><language>eng</language><publisher>Ithaca: Cornell University Library, arXiv.org</publisher><subject>Backplanes ; Circuit boards ; Design criteria ; Estimates ; Printed circuits ; Variability</subject><ispartof>arXiv.org, 2023-01</ispartof><rights>2023. This work is published under http://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>776,780</link.rule.ids></links><search><creatorcontrib>McCoy, Bart O</creatorcontrib><creatorcontrib>Techentin, Robert W</creatorcontrib><creatorcontrib>Buhrow, Benjamin R</creatorcontrib><creatorcontrib>Buchs, Kevin</creatorcontrib><creatorcontrib>Lin, How</creatorcontrib><creatorcontrib>Gilbert, Barry K</creatorcontrib><creatorcontrib>Daniel, Erik S</creatorcontrib><title>PWB Manufacturing Variability Effects on High Speed SerDes Links: Statistical Insights from Thousands of 4-Port SParameter Measurements</title><title>arXiv.org</title><description>Variability analysis is important in successfully deploying multi-gigabit backplane printed wiring boards (PWBs) with growing numbers of high-speed SerDes links. We discuss the need for large sample sizes to obtain accurate variability estimates of SI metrics (eye height, phase skew, etc). Using a dataset of 11,961 S-parameters, we demonstrate statistical techniques to extract accurate estimates of PWB SI performance variations. We cite numerical examples illustrating how these variations may contribute to underestimated or overestimated design criteria, causing unnecessary design expense. Tabular summaries of performance variation and key findings of broad interest to the general SI community are highlighted.</description><subject>Backplanes</subject><subject>Circuit boards</subject><subject>Design criteria</subject><subject>Estimates</subject><subject>Printed circuits</subject><subject>Variability</subject><issn>2331-8422</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2023</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNqNi8FKw0AQQBdBsGj_YcBzIO6mbepRrVSwEEjRYxnT2XZrsltnZg9-gb9tDn6Ap3d4712YiXXurqgra6_MVORUlqWdL-xs5ibmp3l_gA3G7LHTzCEe4A054Efog37DynvqVCBFWIfDEdoz0R5a4icSeA3xU-6hVdQgGjrs4SXKmI2D5zTA9piyYNyPv4eqaBIrtA0yDqTEsCGUzDRQVLkxlx57oekfr83t82r7uC7OnL4yie5OKXMc1c4u5svK1eWydv-rfgEOyFLL</recordid><startdate>20230117</startdate><enddate>20230117</enddate><creator>McCoy, Bart O</creator><creator>Techentin, Robert W</creator><creator>Buhrow, Benjamin R</creator><creator>Buchs, Kevin</creator><creator>Lin, How</creator><creator>Gilbert, Barry K</creator><creator>Daniel, Erik S</creator><general>Cornell University Library, arXiv.org</general><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>L6V</scope><scope>M7S</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PTHSS</scope></search><sort><creationdate>20230117</creationdate><title>PWB Manufacturing Variability Effects on High Speed SerDes Links: Statistical Insights from Thousands of 4-Port SParameter Measurements</title><author>McCoy, Bart O ; Techentin, Robert W ; Buhrow, Benjamin R ; Buchs, Kevin ; Lin, How ; Gilbert, Barry K ; Daniel, Erik S</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-proquest_journals_27694380983</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2023</creationdate><topic>Backplanes</topic><topic>Circuit boards</topic><topic>Design criteria</topic><topic>Estimates</topic><topic>Printed circuits</topic><topic>Variability</topic><toplevel>online_resources</toplevel><creatorcontrib>McCoy, Bart O</creatorcontrib><creatorcontrib>Techentin, Robert W</creatorcontrib><creatorcontrib>Buhrow, Benjamin R</creatorcontrib><creatorcontrib>Buchs, Kevin</creatorcontrib><creatorcontrib>Lin, How</creatorcontrib><creatorcontrib>Gilbert, Barry K</creatorcontrib><creatorcontrib>Daniel, Erik S</creatorcontrib><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science &amp; Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Engineering Collection</collection><collection>Engineering Database</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>Engineering Collection</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>McCoy, Bart O</au><au>Techentin, Robert W</au><au>Buhrow, Benjamin R</au><au>Buchs, Kevin</au><au>Lin, How</au><au>Gilbert, Barry K</au><au>Daniel, Erik S</au><format>book</format><genre>document</genre><ristype>GEN</ristype><atitle>PWB Manufacturing Variability Effects on High Speed SerDes Links: Statistical Insights from Thousands of 4-Port SParameter Measurements</atitle><jtitle>arXiv.org</jtitle><date>2023-01-17</date><risdate>2023</risdate><eissn>2331-8422</eissn><abstract>Variability analysis is important in successfully deploying multi-gigabit backplane printed wiring boards (PWBs) with growing numbers of high-speed SerDes links. We discuss the need for large sample sizes to obtain accurate variability estimates of SI metrics (eye height, phase skew, etc). Using a dataset of 11,961 S-parameters, we demonstrate statistical techniques to extract accurate estimates of PWB SI performance variations. We cite numerical examples illustrating how these variations may contribute to underestimated or overestimated design criteria, causing unnecessary design expense. Tabular summaries of performance variation and key findings of broad interest to the general SI community are highlighted.</abstract><cop>Ithaca</cop><pub>Cornell University Library, arXiv.org</pub><oa>free_for_read</oa></addata></record>
fulltext fulltext
identifier EISSN: 2331-8422
ispartof arXiv.org, 2023-01
issn 2331-8422
language eng
recordid cdi_proquest_journals_2769438098
source Free E- Journals
subjects Backplanes
Circuit boards
Design criteria
Estimates
Printed circuits
Variability
title PWB Manufacturing Variability Effects on High Speed SerDes Links: Statistical Insights from Thousands of 4-Port SParameter Measurements
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-25T12%3A59%3A14IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=document&rft.atitle=PWB%20Manufacturing%20Variability%20Effects%20on%20High%20Speed%20SerDes%20Links:%20Statistical%20Insights%20from%20Thousands%20of%204-Port%20SParameter%20Measurements&rft.jtitle=arXiv.org&rft.au=McCoy,%20Bart%20O&rft.date=2023-01-17&rft.eissn=2331-8422&rft_id=info:doi/&rft_dat=%3Cproquest%3E2769438098%3C/proquest%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2769438098&rft_id=info:pmid/&rfr_iscdi=true