Refractive index profile renormalization for a silicon waveguide bend

An index profile renormalization method is proposed to study the effective refraction index increase in a high-index contrast waveguide bend such as a silicon waveguide bend. This method transforms a waveguide bend to an equivalent straight waveguide (ESW). The simulation results show that the ESW m...

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Veröffentlicht in:	AIP advances 2023-01, Vol.13 (1), p.015123-015123-6
Hauptverfasser:	Lu, Ronger, Wang, Jiaying, Zhang, Binglin, Di, Dongrui, Liu, Ang
Format:	Artikel
Sprache:	eng
Schlagworte:	Finite difference time domain method Phase control Refraction Refractivity Silicon Waveguides
Online-Zugang:	Volltext
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