Valence fluctuation in Yb3Si5 probed by synchrotron X-ray photoemission spectroscopy

We report the direct evidence of valence fluctuation in the thermoelectric material Yb3Si5 by using synchrotron X-ray photoemission spectroscopy. The Yb 3d core level photoemission spectrum of a Yb3Si5 single crystal shows clear separation of the Yb2+ peak and Yb3+ multiplet peaks. From the spectral...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	Japanese Journal of Applied Physics 2023-05, Vol.62 (SD), p.SD1014
Hauptverfasser:	Kuga, Kentaro, Matsunami, Masaharu, Fujiwara, Hidenori, Nozue, Goro, Ose, Akane, Sekiyama, Akira, Yasui, Akira, Hamamoto, Satoru, Oura, Masaki, Takeuchi, Tsunehiro
Format:	Artikel
Sprache:	eng
Schlagworte:	HAXPES Photoelectric emission Photoelectron spectroscopy Single crystals Soft x rays SXPES Synchrotron radiation Synchrotrons thermoelectric material Thermoelectric materials valence fluctuation
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	We report the direct evidence of valence fluctuation in the thermoelectric material Yb3Si5 by using synchrotron X-ray photoemission spectroscopy. The Yb 3d core level photoemission spectrum of a Yb3Si5 single crystal shows clear separation of the Yb2+ peak and Yb3+ multiplet peaks. From the spectral weight of each component, the mean valence of Yb ions is estimated to be +2.67 at 20 K. Furthermore, a Kondo resonance peak just below the Fermi energy is also observed by high-resolution soft X-ray photoemission spectroscopy, suggesting the valence fluctuating state in Yb3Si5.
ISSN:	0021-4922 1347-4065
DOI:	10.35848/1347-4065/aca911