Recrystallization effects in spray-pyrolyzed Nb2O5 thin films induced by 100 MeV O7+ swift heavy ion beam irradiation

[Display omitted] •Nb2O5 film is irradiated with 100 MeV O7+ high energy ion beam at various fluence.•Recrystallization is observed at the critical fluence 5 × 1012 ions/cm2.•Reduction in optical band gap and surface roughness is observed at critical fluence.•Non-monotonic electrical transport behav...

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Veröffentlicht in:	Materials science & engineering. B, Solid-state materials for advanced technology Solid-state materials for advanced technology, 2022-12, Vol.286, p.116071, Article 116071
Hauptverfasser:	Rathika, R., Kovendhan, M., Paul Joseph, D., Pachaiappan, Rekha, Maria Fernandes, Jean, Muniramaiah, Reddivari, Vijayarangamuthu, K., Venkateswaran, C., Asokan, K.
Format:	Artikel
Sprache:	eng
Schlagworte:	Amorphization Band gap Controllability Crystal defects Crystallites Damage accumulation Density Energy gap Fluence Hall effect Heavy ions Ion beam irradiation Ion beams Irradiation Mathematical analysis Nb2O5 Niobium oxides Oxygen ions Parameters Photoluminescence Point defects Raman spectra Recrystallization Spray pyrolysis Surface roughness Thin films
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