Microstructure and mechanical properties of Cr films deposited with different peak powers by high-power impulse magnetron sputtering

For high-power impulse magnetron sputtering (HIPIMS), the peak power applied to the target is of great importance for regulating the ionization degree of the metal target and ion/atom flux ratio. In this work, chromium (Cr) films were deposited on 316-L stainless steel substrates and silicon (100) w...

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Veröffentlicht in:Rare metals 2023, Vol.42 (1), p.327-335
Hauptverfasser: Wang, Yu, Wu, Bao-Hua, Jiang, Fan, Ma, Dong-Lin, Yu, Yan, Sun, Hong, Huang, Nan, Leng, Yong-Xiang
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container_end_page 335
container_issue 1
container_start_page 327
container_title Rare metals
container_volume 42
creator Wang, Yu
Wu, Bao-Hua
Jiang, Fan
Ma, Dong-Lin
Yu, Yan
Sun, Hong
Huang, Nan
Leng, Yong-Xiang
description For high-power impulse magnetron sputtering (HIPIMS), the peak power applied to the target is of great importance for regulating the ionization degree of the metal target and ion/atom flux ratio. In this work, chromium (Cr) films were deposited on 316-L stainless steel substrates and silicon (100) wafers with different peak powers by HIPIMS. The relationship between peak target power and properties of Cr films was explored in detail. The resulting structure and mechanical properties of deposited Cr films were characterized by X-ray diffraction (XRD), transmission electron microscope (TEM), atomic force microscopy (AFM), indentation hardness and scratch tester. The results indicate that the ionization degree of metal target and ion/atom flux ratio increase with the increase in peak power but without the loss of deposition rate at the same time. At low ionization degree, the deposited Cr film has low compressive residual stress and low hardness but good adhesion strength. When the ionization degree of target metal increases with increasing peak power, Cr film exhibits finer size and smoother surface with improved hardness but decreased adhesion strength.
doi_str_mv 10.1007/s12598-017-0897-6
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In this work, chromium (Cr) films were deposited on 316-L stainless steel substrates and silicon (100) wafers with different peak powers by HIPIMS. The relationship between peak target power and properties of Cr films was explored in detail. The resulting structure and mechanical properties of deposited Cr films were characterized by X-ray diffraction (XRD), transmission electron microscope (TEM), atomic force microscopy (AFM), indentation hardness and scratch tester. The results indicate that the ionization degree of metal target and ion/atom flux ratio increase with the increase in peak power but without the loss of deposition rate at the same time. At low ionization degree, the deposited Cr film has low compressive residual stress and low hardness but good adhesion strength. 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When the ionization degree of target metal increases with increasing peak power, Cr film exhibits finer size and smoother surface with improved hardness but decreased adhesion strength.</description><subject>Adhesive strength</subject><subject>Biomaterials</subject><subject>Chemistry and Materials Science</subject><subject>Chromium</subject><subject>Compressive properties</subject><subject>Compressive strength</subject><subject>Energy</subject><subject>Hardness</subject><subject>Indentation</subject><subject>Ionization</subject><subject>Magnetron sputtering</subject><subject>Materials Engineering</subject><subject>Materials Science</subject><subject>Mechanical properties</subject><subject>Metallic Materials</subject><subject>Nanoscale Science and Technology</subject><subject>Physical Chemistry</subject><subject>Residual stress</subject><subject>Silicon substrates</subject><subject>Stainless steels</subject><issn>1001-0521</issn><issn>1867-7185</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2023</creationdate><recordtype>article</recordtype><recordid>eNp1kEFP5DAMhSu0SLDAD-AWiXMWJ03S5IhG7IIE4gLnKG2dmcC0DUkqxH1_OB0GiRMn2_J7tt5XVecM_jCA5jIzLo2mwBoK2jRUHVTHTKuGNkzLX0sPwChIzo6q3zk_AwihFBxX_-9Dl6Zc0tyVOSFxY08G7DZuDJ3bkpimiKkEzGTyZJWID9shkx7jlEPBnryFsiF98B4TjoVEdC8kTm-YMmnfySasN_RzJGGI8zYjGdx6xJKmkeQ4l4IpjOvT6tC7ZXn2VU-qp7_Xj6sbevfw73Z1dUe7mqlCjUAtOTQOHPYN1EwLZurWGI-Ccy4E9C04bbQzrRRe8U57LrGVvdK6FqI-qS72d5dYrzPmYp-nOY3LS8sbKbVhQtWLiu1VOzA5obcxhcGld8vA7mDbPWy7wLY72FYtHr735LgLhOn78s-mDzi3hF8</recordid><startdate>2023</startdate><enddate>2023</enddate><creator>Wang, Yu</creator><creator>Wu, Bao-Hua</creator><creator>Jiang, Fan</creator><creator>Ma, Dong-Lin</creator><creator>Yu, Yan</creator><creator>Sun, Hong</creator><creator>Huang, Nan</creator><creator>Leng, Yong-Xiang</creator><general>Nonferrous Metals Society of China</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><orcidid>https://orcid.org/0000-0001-6823-1233</orcidid></search><sort><creationdate>2023</creationdate><title>Microstructure and mechanical properties of Cr films deposited with different peak powers by high-power impulse magnetron sputtering</title><author>Wang, Yu ; Wu, Bao-Hua ; Jiang, Fan ; Ma, Dong-Lin ; Yu, Yan ; Sun, Hong ; Huang, Nan ; Leng, Yong-Xiang</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c316t-94e85207a0aed703184193b99fe4222440db0a898a9b54f62c8f25eb5d6883443</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2023</creationdate><topic>Adhesive strength</topic><topic>Biomaterials</topic><topic>Chemistry and Materials Science</topic><topic>Chromium</topic><topic>Compressive properties</topic><topic>Compressive strength</topic><topic>Energy</topic><topic>Hardness</topic><topic>Indentation</topic><topic>Ionization</topic><topic>Magnetron sputtering</topic><topic>Materials Engineering</topic><topic>Materials Science</topic><topic>Mechanical properties</topic><topic>Metallic Materials</topic><topic>Nanoscale Science and Technology</topic><topic>Physical Chemistry</topic><topic>Residual stress</topic><topic>Silicon substrates</topic><topic>Stainless steels</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Wang, Yu</creatorcontrib><creatorcontrib>Wu, Bao-Hua</creatorcontrib><creatorcontrib>Jiang, Fan</creatorcontrib><creatorcontrib>Ma, Dong-Lin</creatorcontrib><creatorcontrib>Yu, Yan</creatorcontrib><creatorcontrib>Sun, Hong</creatorcontrib><creatorcontrib>Huang, Nan</creatorcontrib><creatorcontrib>Leng, Yong-Xiang</creatorcontrib><collection>CrossRef</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Rare metals</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Wang, Yu</au><au>Wu, Bao-Hua</au><au>Jiang, Fan</au><au>Ma, Dong-Lin</au><au>Yu, Yan</au><au>Sun, Hong</au><au>Huang, Nan</au><au>Leng, Yong-Xiang</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Microstructure and mechanical properties of Cr films deposited with different peak powers by high-power impulse magnetron sputtering</atitle><jtitle>Rare metals</jtitle><stitle>Rare Met</stitle><date>2023</date><risdate>2023</risdate><volume>42</volume><issue>1</issue><spage>327</spage><epage>335</epage><pages>327-335</pages><issn>1001-0521</issn><eissn>1867-7185</eissn><abstract>For high-power impulse magnetron sputtering (HIPIMS), the peak power applied to the target is of great importance for regulating the ionization degree of the metal target and ion/atom flux ratio. In this work, chromium (Cr) films were deposited on 316-L stainless steel substrates and silicon (100) wafers with different peak powers by HIPIMS. The relationship between peak target power and properties of Cr films was explored in detail. The resulting structure and mechanical properties of deposited Cr films were characterized by X-ray diffraction (XRD), transmission electron microscope (TEM), atomic force microscopy (AFM), indentation hardness and scratch tester. The results indicate that the ionization degree of metal target and ion/atom flux ratio increase with the increase in peak power but without the loss of deposition rate at the same time. At low ionization degree, the deposited Cr film has low compressive residual stress and low hardness but good adhesion strength. 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subjects Adhesive strength
Biomaterials
Chemistry and Materials Science
Chromium
Compressive properties
Compressive strength
Energy
Hardness
Indentation
Ionization
Magnetron sputtering
Materials Engineering
Materials Science
Mechanical properties
Metallic Materials
Nanoscale Science and Technology
Physical Chemistry
Residual stress
Silicon substrates
Stainless steels
title Microstructure and mechanical properties of Cr films deposited with different peak powers by high-power impulse magnetron sputtering
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