Saturation Effect of Secondary Emission Coefficient in MCP-based Multipliers

A strong dependence of the time-of-flight mass spectrum on the signal value was found when ions were detected by an MCP-based secondary electron multiplier. Ions were created by the photoionization of atoms generated during laser metal evaporation. The results indicate that this effect is associated...

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Veröffentlicht in:	Instruments and experimental techniques (New York) 2022-12, Vol.65 (6), p.903-909
Hauptverfasser:	Ershov, K. S., Kochubei, S. A., Baklanov, A. V.
Format:	Artikel
Sprache:	eng
Schlagworte:	Electrical Engineering General Experimental Techniques Mass spectrometry Measurement Science and Instrumentation Molecular beams Photoionization Photomultiplier tubes Physical Chemistry Physics Physics and Astronomy Saturation Secondary emission
Online-Zugang:	Volltext
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