Easily Accessible Topologically Protected Charge Carriers in Pure and Robust α‐Sn Films

Experimental evidence of topological Dirac fermion charge carriers in pure and robust α‐Sn thin films grown on InSb substrates is reported. This evidence is acquired using standard macroscopic four‐point contact resistance measurements, conducted on uncapped films with a significantly reduced bulk m...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Physica status solidi. PSS-RRL. Rapid research letters 2022-11, Vol.16 (11), p.n/a
Hauptverfasser: Madarevic, Ivan, Claessens, Niels, Seliverstov, Aleksandr, Van Haesendonck, Chris, Van Bael, Margriet J.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!