Simple cleaning and regeneration of tip‐enhanced Raman spectroscopy probe with UV sources
Tip‐enhanced Raman spectroscopy (TERS) is a powerful nano‐optical approach that allows the extraction of nanometer resolved chemical information. The key to a successful TERS measurement is the quality of the TERS tip. However, tip contamination, which usually occurs during measurements on samples t...
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Veröffentlicht in: | Journal of Raman spectroscopy 2022-12, Vol.53 (12), p.2023-2030 |
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container_issue | 12 |
container_start_page | 2023 |
container_title | Journal of Raman spectroscopy |
container_volume | 53 |
creator | Zhang, Kaifeng Taniguchi, Shin‐ichi Saeki, Tomonori Bao, Yifan Cao, Maofeng Watanabe, Masahiro Wang, Xiang Kobayashi, Kei Ren, Bin Yamada, Hirofumi |
description | Tip‐enhanced Raman spectroscopy (TERS) is a powerful nano‐optical approach that allows the extraction of nanometer resolved chemical information. The key to a successful TERS measurement is the quality of the TERS tip. However, tip contamination, which usually occurs during measurements on samples that include organic molecules or after long‐term storage, remains a critical problem for TERS experiments. It not only affects the reliability of TERS results but also hinders the long‐term development of the TERS technique. Herein, we propose a method that enables the regeneration of contaminated TERS tips. For this purpose, we prepared a TERS tip contaminated by stable organic molecules, which was subjected to a simple and rapid ultraviolet (UV) cleaning procedure to remove the contaminants and to regenerate the tip. This method is demonstrated to be effective in removing the contaminants from the TERS tip by directly breaking the bonds in the contaminated molecules and oxidizing organic compounds with the generated reactive oxygen atom. This simple method could propel the development of the TERS technique.
A simple method for cleaning and regenerating TERS tips with UV light irradiation. |
doi_str_mv | 10.1002/jrs.6440 |
format | Article |
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A simple method for cleaning and regenerating TERS tips with UV light irradiation.</description><identifier>ISSN: 0377-0486</identifier><identifier>EISSN: 1097-4555</identifier><identifier>DOI: 10.1002/jrs.6440</identifier><language>eng</language><publisher>Bognor Regis: Wiley Subscription Services, Inc</publisher><subject>atomic force microscope (AFM) ; Chemical bonds ; Cleaning ; Contaminants ; Contamination ; Organic chemistry ; Organic compounds ; Oxidation ; Pollutant removal ; Raman spectroscopy ; Regeneration ; Spectroscopy ; Spectrum analysis ; thin‐film waveguide probe ; tip regeneration ; tip‐enhanced Raman spectroscopy (TERS) ; UV cleaning</subject><ispartof>Journal of Raman spectroscopy, 2022-12, Vol.53 (12), p.2023-2030</ispartof><rights>2022 John Wiley & Sons Ltd.</rights><rights>2022 John Wiley & Sons, Ltd.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c2930-f3557bda30b5c620232ba2d97987598f020d36ea48d290bb2f1ef545f7db22ee3</citedby><cites>FETCH-LOGICAL-c2930-f3557bda30b5c620232ba2d97987598f020d36ea48d290bb2f1ef545f7db22ee3</cites><orcidid>0000-0002-8659-1619 ; 0000-0002-9821-5864</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Fjrs.6440$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fjrs.6440$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,777,781,1412,27905,27906,45555,45556</link.rule.ids></links><search><creatorcontrib>Zhang, Kaifeng</creatorcontrib><creatorcontrib>Taniguchi, Shin‐ichi</creatorcontrib><creatorcontrib>Saeki, Tomonori</creatorcontrib><creatorcontrib>Bao, Yifan</creatorcontrib><creatorcontrib>Cao, Maofeng</creatorcontrib><creatorcontrib>Watanabe, Masahiro</creatorcontrib><creatorcontrib>Wang, Xiang</creatorcontrib><creatorcontrib>Kobayashi, Kei</creatorcontrib><creatorcontrib>Ren, Bin</creatorcontrib><creatorcontrib>Yamada, Hirofumi</creatorcontrib><title>Simple cleaning and regeneration of tip‐enhanced Raman spectroscopy probe with UV sources</title><title>Journal of Raman spectroscopy</title><description>Tip‐enhanced Raman spectroscopy (TERS) is a powerful nano‐optical approach that allows the extraction of nanometer resolved chemical information. The key to a successful TERS measurement is the quality of the TERS tip. However, tip contamination, which usually occurs during measurements on samples that include organic molecules or after long‐term storage, remains a critical problem for TERS experiments. It not only affects the reliability of TERS results but also hinders the long‐term development of the TERS technique. Herein, we propose a method that enables the regeneration of contaminated TERS tips. For this purpose, we prepared a TERS tip contaminated by stable organic molecules, which was subjected to a simple and rapid ultraviolet (UV) cleaning procedure to remove the contaminants and to regenerate the tip. This method is demonstrated to be effective in removing the contaminants from the TERS tip by directly breaking the bonds in the contaminated molecules and oxidizing organic compounds with the generated reactive oxygen atom. This simple method could propel the development of the TERS technique.
A simple method for cleaning and regenerating TERS tips with UV light irradiation.</description><subject>atomic force microscope (AFM)</subject><subject>Chemical bonds</subject><subject>Cleaning</subject><subject>Contaminants</subject><subject>Contamination</subject><subject>Organic chemistry</subject><subject>Organic compounds</subject><subject>Oxidation</subject><subject>Pollutant removal</subject><subject>Raman spectroscopy</subject><subject>Regeneration</subject><subject>Spectroscopy</subject><subject>Spectrum analysis</subject><subject>thin‐film waveguide probe</subject><subject>tip regeneration</subject><subject>tip‐enhanced Raman spectroscopy (TERS)</subject><subject>UV cleaning</subject><issn>0377-0486</issn><issn>1097-4555</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><recordid>eNp1kL1OwzAURi0EEqUg8QiWWFhSbuw4jkdU8atKSC1lYbAc56ZNlTrBTlV14xF4Rp6ElLIy3eXofkeHkMsYRjEAu1n5MEqTBI7IIAYlo0QIcUwGwKWMIMnSU3IWwgoAlErjAXmfVeu2RmprNK5yC2pcQT0u0KE3XdU42pS0q9rvzy90S-MsFnRq1sbR0KLtfBNs0-5o65sc6bbqlnT-RkOz8RbDOTkpTR3w4u8Oyfz-7nX8GE1eHp7Gt5PIMsUhKrkQMi8Mh1zYlAHjLDesUFJlUqisBAYFT9EkWcEU5DkrYyxFIkpZ5Iwh8iG5OvztLT42GDq96gVcP6mZTKRiCeOip64PlO2lg8dSt75aG7_TMeh9Ot2n0_t0PRod0G1V4-5fTj9PZ7_8D59tcPo</recordid><startdate>202212</startdate><enddate>202212</enddate><creator>Zhang, Kaifeng</creator><creator>Taniguchi, Shin‐ichi</creator><creator>Saeki, Tomonori</creator><creator>Bao, Yifan</creator><creator>Cao, Maofeng</creator><creator>Watanabe, Masahiro</creator><creator>Wang, Xiang</creator><creator>Kobayashi, Kei</creator><creator>Ren, Bin</creator><creator>Yamada, Hirofumi</creator><general>Wiley Subscription Services, Inc</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7QF</scope><scope>7QO</scope><scope>7QQ</scope><scope>7SC</scope><scope>7SE</scope><scope>7SP</scope><scope>7SR</scope><scope>7TA</scope><scope>7TB</scope><scope>7U5</scope><scope>7U9</scope><scope>8BQ</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>H8D</scope><scope>H8G</scope><scope>H94</scope><scope>JG9</scope><scope>JQ2</scope><scope>KR7</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>P64</scope><scope>RC3</scope><orcidid>https://orcid.org/0000-0002-8659-1619</orcidid><orcidid>https://orcid.org/0000-0002-9821-5864</orcidid></search><sort><creationdate>202212</creationdate><title>Simple cleaning and regeneration of tip‐enhanced Raman spectroscopy probe with UV sources</title><author>Zhang, Kaifeng ; Taniguchi, Shin‐ichi ; Saeki, Tomonori ; Bao, Yifan ; Cao, Maofeng ; Watanabe, Masahiro ; Wang, Xiang ; Kobayashi, Kei ; Ren, Bin ; Yamada, Hirofumi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c2930-f3557bda30b5c620232ba2d97987598f020d36ea48d290bb2f1ef545f7db22ee3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2022</creationdate><topic>atomic force microscope (AFM)</topic><topic>Chemical bonds</topic><topic>Cleaning</topic><topic>Contaminants</topic><topic>Contamination</topic><topic>Organic chemistry</topic><topic>Organic compounds</topic><topic>Oxidation</topic><topic>Pollutant removal</topic><topic>Raman spectroscopy</topic><topic>Regeneration</topic><topic>Spectroscopy</topic><topic>Spectrum analysis</topic><topic>thin‐film waveguide probe</topic><topic>tip regeneration</topic><topic>tip‐enhanced Raman spectroscopy (TERS)</topic><topic>UV cleaning</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Zhang, Kaifeng</creatorcontrib><creatorcontrib>Taniguchi, Shin‐ichi</creatorcontrib><creatorcontrib>Saeki, Tomonori</creatorcontrib><creatorcontrib>Bao, Yifan</creatorcontrib><creatorcontrib>Cao, Maofeng</creatorcontrib><creatorcontrib>Watanabe, Masahiro</creatorcontrib><creatorcontrib>Wang, Xiang</creatorcontrib><creatorcontrib>Kobayashi, Kei</creatorcontrib><creatorcontrib>Ren, Bin</creatorcontrib><creatorcontrib>Yamada, Hirofumi</creatorcontrib><collection>CrossRef</collection><collection>Aluminium Industry Abstracts</collection><collection>Biotechnology Research Abstracts</collection><collection>Ceramic Abstracts</collection><collection>Computer and Information Systems Abstracts</collection><collection>Corrosion Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Materials Business File</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Virology and AIDS Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Aerospace Database</collection><collection>Copper Technical Reference Library</collection><collection>AIDS and Cancer Research Abstracts</collection><collection>Materials Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Civil Engineering Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>Biotechnology and BioEngineering Abstracts</collection><collection>Genetics Abstracts</collection><jtitle>Journal of Raman spectroscopy</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Zhang, Kaifeng</au><au>Taniguchi, Shin‐ichi</au><au>Saeki, Tomonori</au><au>Bao, Yifan</au><au>Cao, Maofeng</au><au>Watanabe, Masahiro</au><au>Wang, Xiang</au><au>Kobayashi, Kei</au><au>Ren, Bin</au><au>Yamada, Hirofumi</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Simple cleaning and regeneration of tip‐enhanced Raman spectroscopy probe with UV sources</atitle><jtitle>Journal of Raman spectroscopy</jtitle><date>2022-12</date><risdate>2022</risdate><volume>53</volume><issue>12</issue><spage>2023</spage><epage>2030</epage><pages>2023-2030</pages><issn>0377-0486</issn><eissn>1097-4555</eissn><abstract>Tip‐enhanced Raman spectroscopy (TERS) is a powerful nano‐optical approach that allows the extraction of nanometer resolved chemical information. The key to a successful TERS measurement is the quality of the TERS tip. However, tip contamination, which usually occurs during measurements on samples that include organic molecules or after long‐term storage, remains a critical problem for TERS experiments. It not only affects the reliability of TERS results but also hinders the long‐term development of the TERS technique. Herein, we propose a method that enables the regeneration of contaminated TERS tips. For this purpose, we prepared a TERS tip contaminated by stable organic molecules, which was subjected to a simple and rapid ultraviolet (UV) cleaning procedure to remove the contaminants and to regenerate the tip. This method is demonstrated to be effective in removing the contaminants from the TERS tip by directly breaking the bonds in the contaminated molecules and oxidizing organic compounds with the generated reactive oxygen atom. This simple method could propel the development of the TERS technique.
A simple method for cleaning and regenerating TERS tips with UV light irradiation.</abstract><cop>Bognor Regis</cop><pub>Wiley Subscription Services, Inc</pub><doi>10.1002/jrs.6440</doi><tpages>8</tpages><orcidid>https://orcid.org/0000-0002-8659-1619</orcidid><orcidid>https://orcid.org/0000-0002-9821-5864</orcidid></addata></record> |
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subjects | atomic force microscope (AFM) Chemical bonds Cleaning Contaminants Contamination Organic chemistry Organic compounds Oxidation Pollutant removal Raman spectroscopy Regeneration Spectroscopy Spectrum analysis thin‐film waveguide probe tip regeneration tip‐enhanced Raman spectroscopy (TERS) UV cleaning |
title | Simple cleaning and regeneration of tip‐enhanced Raman spectroscopy probe with UV sources |
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