Electron Scraping and Electron Temperature Reduction by Bias Electrode at the Extraction Region of a Large Negative Ion Source
The neutral beam test facility (NBTF), built in Consorzio RFX (Padua, Italy), aims at optimizing the ITER neutral beam injectors through dedicated devices. The facility hosts the full-size prototype of the ion source of the ITER injectors, source for the production of ions of deuterium extracted fro...
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Veröffentlicht in: | IEEE transactions on plasma science 2022-11, Vol.50 (11), p.3983-3988 |
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description | The neutral beam test facility (NBTF), built in Consorzio RFX (Padua, Italy), aims at optimizing the ITER neutral beam injectors through dedicated devices. The facility hosts the full-size prototype of the ion source of the ITER injectors, source for the production of ions of deuterium extracted from a radiofrequency plasma (SPIDER), a radio frequency-based, cesium-assisted negative ion source. The negative ion beam is extracted by a triode with total acceleration voltage up to 108 kV; each grid is provided with 1280 apertures. On the plasma side, the plasma electrode [plasma grid (PG)] is partially covered by an additional electrode [bias plate (BP)] featuring wide openings of the same size as the beamlet groups. The PG and BP can be independently biased with respect to the ion source, influencing the uniformity of the beam and the amount of coextracted electrons. This contribution aims at studying the scraping effect of the electrons by the BP along the direction parallel to the filter field through numerical simulations. The possible role of the BP bias in reducing both the electron density and temperature in front of the extraction apertures and the correlation of the electron temperature with the bias of the electrodes are also discussed. |
doi_str_mv | 10.1109/TPS.2022.3171731 |
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The facility hosts the full-size prototype of the ion source of the ITER injectors, source for the production of ions of deuterium extracted from a radiofrequency plasma (SPIDER), a radio frequency-based, cesium-assisted negative ion source. The negative ion beam is extracted by a triode with total acceleration voltage up to 108 kV; each grid is provided with 1280 apertures. On the plasma side, the plasma electrode [plasma grid (PG)] is partially covered by an additional electrode [bias plate (BP)] featuring wide openings of the same size as the beamlet groups. The PG and BP can be independently biased with respect to the ion source, influencing the uniformity of the beam and the amount of coextracted electrons. This contribution aims at studying the scraping effect of the electrons by the BP along the direction parallel to the filter field through numerical simulations. The possible role of the BP bias in reducing both the electron density and temperature in front of the extraction apertures and the correlation of the electron temperature with the bias of the electrodes are also discussed.</description><identifier>ISSN: 0093-3813</identifier><identifier>EISSN: 1939-9375</identifier><identifier>DOI: 10.1109/TPS.2022.3171731</identifier><identifier>CODEN: ITPSBD</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Apertures ; Bias ; Bias plate (BP) ; Cesium ; Deuterium ; Electric potential ; Electrodes ; Electron density ; Electron energy ; filter field ; Injectors ; Ion beams ; Ion sources ; Magnetic domains ; negative ion extraction ; Negative ions ; Neutral beams ; Numerical models ; particle-in-cell (PIC) ; plasma grid (PG) ; Plasma temperature ; Plasmas ; Radio frequency ; Radio frequency plasma ; Scraping ; Test facilities</subject><ispartof>IEEE transactions on plasma science, 2022-11, Vol.50 (11), p.3983-3988</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2022</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c291t-fa3ee8bfd0196eae79a059eaefd458b64e33a67565b6362b53a57c29f77cea9b3</citedby><cites>FETCH-LOGICAL-c291t-fa3ee8bfd0196eae79a059eaefd458b64e33a67565b6362b53a57c29f77cea9b3</cites><orcidid>0000-0001-6458-7718 ; 0000-0002-5651-1825 ; 0000-0002-4704-2019</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/9773026$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/9773026$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Candeloro, Valeria</creatorcontrib><creatorcontrib>Sartori, Emanuele</creatorcontrib><creatorcontrib>Serianni, Gianluigi</creatorcontrib><title>Electron Scraping and Electron Temperature Reduction by Bias Electrode at the Extraction Region of a Large Negative Ion Source</title><title>IEEE transactions on plasma science</title><addtitle>TPS</addtitle><description>The neutral beam test facility (NBTF), built in Consorzio RFX (Padua, Italy), aims at optimizing the ITER neutral beam injectors through dedicated devices. The facility hosts the full-size prototype of the ion source of the ITER injectors, source for the production of ions of deuterium extracted from a radiofrequency plasma (SPIDER), a radio frequency-based, cesium-assisted negative ion source. The negative ion beam is extracted by a triode with total acceleration voltage up to 108 kV; each grid is provided with 1280 apertures. On the plasma side, the plasma electrode [plasma grid (PG)] is partially covered by an additional electrode [bias plate (BP)] featuring wide openings of the same size as the beamlet groups. The PG and BP can be independently biased with respect to the ion source, influencing the uniformity of the beam and the amount of coextracted electrons. This contribution aims at studying the scraping effect of the electrons by the BP along the direction parallel to the filter field through numerical simulations. The possible role of the BP bias in reducing both the electron density and temperature in front of the extraction apertures and the correlation of the electron temperature with the bias of the electrodes are also discussed.</description><subject>Apertures</subject><subject>Bias</subject><subject>Bias plate (BP)</subject><subject>Cesium</subject><subject>Deuterium</subject><subject>Electric potential</subject><subject>Electrodes</subject><subject>Electron density</subject><subject>Electron energy</subject><subject>filter field</subject><subject>Injectors</subject><subject>Ion beams</subject><subject>Ion sources</subject><subject>Magnetic domains</subject><subject>negative ion extraction</subject><subject>Negative ions</subject><subject>Neutral beams</subject><subject>Numerical models</subject><subject>particle-in-cell (PIC)</subject><subject>plasma grid (PG)</subject><subject>Plasma temperature</subject><subject>Plasmas</subject><subject>Radio frequency</subject><subject>Radio frequency plasma</subject><subject>Scraping</subject><subject>Test facilities</subject><issn>0093-3813</issn><issn>1939-9375</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kM1Lw0AUxBdRsFbvgpcFz6n7kc12jypVC0WlrefwkrzElDaJm43Yi3-7G1J7msfwmzcwhFxzNuGcmbv1-2oimBATyTXXkp-QETfSBEZqdUpGjBkZyCmX5-SibTeM8VAxMSK_sy2mztYVXaUWmrIqKFQZPbpr3DVowXUW6RKzLnWld5M9fSih_ccypOCo-0Q6-3EWBmaJRS91ToEuwBZIX7EAV34jnfd1dWdTvCRnOWxbvDromHw8zdaPL8Hi7Xn-eL8IUmG4C3KQiNMkzxg3EQJqA0wZf-RZqKZJFKKUEGkVqSSSkUiUBKV9NNc6RTCJHJPb4W9j668OWxdvfH_lK2OhQ6FZqDT3FBuo1NZtazGPG1vuwO5jzuJ-5divHPcrx4eVfeRmiJSIeMSN1pKJSP4B_7F54g</recordid><startdate>20221101</startdate><enddate>20221101</enddate><creator>Candeloro, Valeria</creator><creator>Sartori, Emanuele</creator><creator>Serianni, Gianluigi</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0001-6458-7718</orcidid><orcidid>https://orcid.org/0000-0002-5651-1825</orcidid><orcidid>https://orcid.org/0000-0002-4704-2019</orcidid></search><sort><creationdate>20221101</creationdate><title>Electron Scraping and Electron Temperature Reduction by Bias Electrode at the Extraction Region of a Large Negative Ion Source</title><author>Candeloro, Valeria ; Sartori, Emanuele ; Serianni, Gianluigi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c291t-fa3ee8bfd0196eae79a059eaefd458b64e33a67565b6362b53a57c29f77cea9b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2022</creationdate><topic>Apertures</topic><topic>Bias</topic><topic>Bias plate (BP)</topic><topic>Cesium</topic><topic>Deuterium</topic><topic>Electric potential</topic><topic>Electrodes</topic><topic>Electron density</topic><topic>Electron energy</topic><topic>filter field</topic><topic>Injectors</topic><topic>Ion beams</topic><topic>Ion sources</topic><topic>Magnetic domains</topic><topic>negative ion extraction</topic><topic>Negative ions</topic><topic>Neutral beams</topic><topic>Numerical models</topic><topic>particle-in-cell (PIC)</topic><topic>plasma grid (PG)</topic><topic>Plasma temperature</topic><topic>Plasmas</topic><topic>Radio frequency</topic><topic>Radio frequency plasma</topic><topic>Scraping</topic><topic>Test facilities</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Candeloro, Valeria</creatorcontrib><creatorcontrib>Sartori, Emanuele</creatorcontrib><creatorcontrib>Serianni, Gianluigi</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on plasma science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Candeloro, Valeria</au><au>Sartori, Emanuele</au><au>Serianni, Gianluigi</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Electron Scraping and Electron Temperature Reduction by Bias Electrode at the Extraction Region of a Large Negative Ion Source</atitle><jtitle>IEEE transactions on plasma science</jtitle><stitle>TPS</stitle><date>2022-11-01</date><risdate>2022</risdate><volume>50</volume><issue>11</issue><spage>3983</spage><epage>3988</epage><pages>3983-3988</pages><issn>0093-3813</issn><eissn>1939-9375</eissn><coden>ITPSBD</coden><abstract>The neutral beam test facility (NBTF), built in Consorzio RFX (Padua, Italy), aims at optimizing the ITER neutral beam injectors through dedicated devices. The facility hosts the full-size prototype of the ion source of the ITER injectors, source for the production of ions of deuterium extracted from a radiofrequency plasma (SPIDER), a radio frequency-based, cesium-assisted negative ion source. The negative ion beam is extracted by a triode with total acceleration voltage up to 108 kV; each grid is provided with 1280 apertures. On the plasma side, the plasma electrode [plasma grid (PG)] is partially covered by an additional electrode [bias plate (BP)] featuring wide openings of the same size as the beamlet groups. The PG and BP can be independently biased with respect to the ion source, influencing the uniformity of the beam and the amount of coextracted electrons. This contribution aims at studying the scraping effect of the electrons by the BP along the direction parallel to the filter field through numerical simulations. The possible role of the BP bias in reducing both the electron density and temperature in front of the extraction apertures and the correlation of the electron temperature with the bias of the electrodes are also discussed.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TPS.2022.3171731</doi><tpages>6</tpages><orcidid>https://orcid.org/0000-0001-6458-7718</orcidid><orcidid>https://orcid.org/0000-0002-5651-1825</orcidid><orcidid>https://orcid.org/0000-0002-4704-2019</orcidid></addata></record> |
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subjects | Apertures Bias Bias plate (BP) Cesium Deuterium Electric potential Electrodes Electron density Electron energy filter field Injectors Ion beams Ion sources Magnetic domains negative ion extraction Negative ions Neutral beams Numerical models particle-in-cell (PIC) plasma grid (PG) Plasma temperature Plasmas Radio frequency Radio frequency plasma Scraping Test facilities |
title | Electron Scraping and Electron Temperature Reduction by Bias Electrode at the Extraction Region of a Large Negative Ion Source |
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