Electron Scraping and Electron Temperature Reduction by Bias Electrode at the Extraction Region of a Large Negative Ion Source

The neutral beam test facility (NBTF), built in Consorzio RFX (Padua, Italy), aims at optimizing the ITER neutral beam injectors through dedicated devices. The facility hosts the full-size prototype of the ion source of the ITER injectors, source for the production of ions of deuterium extracted fro...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on plasma science 2022-11, Vol.50 (11), p.3983-3988
Hauptverfasser: Candeloro, Valeria, Sartori, Emanuele, Serianni, Gianluigi
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 3988
container_issue 11
container_start_page 3983
container_title IEEE transactions on plasma science
container_volume 50
creator Candeloro, Valeria
Sartori, Emanuele
Serianni, Gianluigi
description The neutral beam test facility (NBTF), built in Consorzio RFX (Padua, Italy), aims at optimizing the ITER neutral beam injectors through dedicated devices. The facility hosts the full-size prototype of the ion source of the ITER injectors, source for the production of ions of deuterium extracted from a radiofrequency plasma (SPIDER), a radio frequency-based, cesium-assisted negative ion source. The negative ion beam is extracted by a triode with total acceleration voltage up to 108 kV; each grid is provided with 1280 apertures. On the plasma side, the plasma electrode [plasma grid (PG)] is partially covered by an additional electrode [bias plate (BP)] featuring wide openings of the same size as the beamlet groups. The PG and BP can be independently biased with respect to the ion source, influencing the uniformity of the beam and the amount of coextracted electrons. This contribution aims at studying the scraping effect of the electrons by the BP along the direction parallel to the filter field through numerical simulations. The possible role of the BP bias in reducing both the electron density and temperature in front of the extraction apertures and the correlation of the electron temperature with the bias of the electrodes are also discussed.
doi_str_mv 10.1109/TPS.2022.3171731
format Article
fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_journals_2742704571</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>9773026</ieee_id><sourcerecordid>2742704571</sourcerecordid><originalsourceid>FETCH-LOGICAL-c291t-fa3ee8bfd0196eae79a059eaefd458b64e33a67565b6362b53a57c29f77cea9b3</originalsourceid><addsrcrecordid>eNo9kM1Lw0AUxBdRsFbvgpcFz6n7kc12jypVC0WlrefwkrzElDaJm43Yi3-7G1J7msfwmzcwhFxzNuGcmbv1-2oimBATyTXXkp-QETfSBEZqdUpGjBkZyCmX5-SibTeM8VAxMSK_sy2mztYVXaUWmrIqKFQZPbpr3DVowXUW6RKzLnWld5M9fSih_ccypOCo-0Q6-3EWBmaJRS91ToEuwBZIX7EAV34jnfd1dWdTvCRnOWxbvDromHw8zdaPL8Hi7Xn-eL8IUmG4C3KQiNMkzxg3EQJqA0wZf-RZqKZJFKKUEGkVqSSSkUiUBKV9NNc6RTCJHJPb4W9j668OWxdvfH_lK2OhQ6FZqDT3FBuo1NZtazGPG1vuwO5jzuJ-5divHPcrx4eVfeRmiJSIeMSN1pKJSP4B_7F54g</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2742704571</pqid></control><display><type>article</type><title>Electron Scraping and Electron Temperature Reduction by Bias Electrode at the Extraction Region of a Large Negative Ion Source</title><source>IEEE Electronic Library (IEL)</source><creator>Candeloro, Valeria ; Sartori, Emanuele ; Serianni, Gianluigi</creator><creatorcontrib>Candeloro, Valeria ; Sartori, Emanuele ; Serianni, Gianluigi</creatorcontrib><description>The neutral beam test facility (NBTF), built in Consorzio RFX (Padua, Italy), aims at optimizing the ITER neutral beam injectors through dedicated devices. The facility hosts the full-size prototype of the ion source of the ITER injectors, source for the production of ions of deuterium extracted from a radiofrequency plasma (SPIDER), a radio frequency-based, cesium-assisted negative ion source. The negative ion beam is extracted by a triode with total acceleration voltage up to 108 kV; each grid is provided with 1280 apertures. On the plasma side, the plasma electrode [plasma grid (PG)] is partially covered by an additional electrode [bias plate (BP)] featuring wide openings of the same size as the beamlet groups. The PG and BP can be independently biased with respect to the ion source, influencing the uniformity of the beam and the amount of coextracted electrons. This contribution aims at studying the scraping effect of the electrons by the BP along the direction parallel to the filter field through numerical simulations. The possible role of the BP bias in reducing both the electron density and temperature in front of the extraction apertures and the correlation of the electron temperature with the bias of the electrodes are also discussed.</description><identifier>ISSN: 0093-3813</identifier><identifier>EISSN: 1939-9375</identifier><identifier>DOI: 10.1109/TPS.2022.3171731</identifier><identifier>CODEN: ITPSBD</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Apertures ; Bias ; Bias plate (BP) ; Cesium ; Deuterium ; Electric potential ; Electrodes ; Electron density ; Electron energy ; filter field ; Injectors ; Ion beams ; Ion sources ; Magnetic domains ; negative ion extraction ; Negative ions ; Neutral beams ; Numerical models ; particle-in-cell (PIC) ; plasma grid (PG) ; Plasma temperature ; Plasmas ; Radio frequency ; Radio frequency plasma ; Scraping ; Test facilities</subject><ispartof>IEEE transactions on plasma science, 2022-11, Vol.50 (11), p.3983-3988</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2022</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c291t-fa3ee8bfd0196eae79a059eaefd458b64e33a67565b6362b53a57c29f77cea9b3</citedby><cites>FETCH-LOGICAL-c291t-fa3ee8bfd0196eae79a059eaefd458b64e33a67565b6362b53a57c29f77cea9b3</cites><orcidid>0000-0001-6458-7718 ; 0000-0002-5651-1825 ; 0000-0002-4704-2019</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/9773026$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/9773026$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Candeloro, Valeria</creatorcontrib><creatorcontrib>Sartori, Emanuele</creatorcontrib><creatorcontrib>Serianni, Gianluigi</creatorcontrib><title>Electron Scraping and Electron Temperature Reduction by Bias Electrode at the Extraction Region of a Large Negative Ion Source</title><title>IEEE transactions on plasma science</title><addtitle>TPS</addtitle><description>The neutral beam test facility (NBTF), built in Consorzio RFX (Padua, Italy), aims at optimizing the ITER neutral beam injectors through dedicated devices. The facility hosts the full-size prototype of the ion source of the ITER injectors, source for the production of ions of deuterium extracted from a radiofrequency plasma (SPIDER), a radio frequency-based, cesium-assisted negative ion source. The negative ion beam is extracted by a triode with total acceleration voltage up to 108 kV; each grid is provided with 1280 apertures. On the plasma side, the plasma electrode [plasma grid (PG)] is partially covered by an additional electrode [bias plate (BP)] featuring wide openings of the same size as the beamlet groups. The PG and BP can be independently biased with respect to the ion source, influencing the uniformity of the beam and the amount of coextracted electrons. This contribution aims at studying the scraping effect of the electrons by the BP along the direction parallel to the filter field through numerical simulations. The possible role of the BP bias in reducing both the electron density and temperature in front of the extraction apertures and the correlation of the electron temperature with the bias of the electrodes are also discussed.</description><subject>Apertures</subject><subject>Bias</subject><subject>Bias plate (BP)</subject><subject>Cesium</subject><subject>Deuterium</subject><subject>Electric potential</subject><subject>Electrodes</subject><subject>Electron density</subject><subject>Electron energy</subject><subject>filter field</subject><subject>Injectors</subject><subject>Ion beams</subject><subject>Ion sources</subject><subject>Magnetic domains</subject><subject>negative ion extraction</subject><subject>Negative ions</subject><subject>Neutral beams</subject><subject>Numerical models</subject><subject>particle-in-cell (PIC)</subject><subject>plasma grid (PG)</subject><subject>Plasma temperature</subject><subject>Plasmas</subject><subject>Radio frequency</subject><subject>Radio frequency plasma</subject><subject>Scraping</subject><subject>Test facilities</subject><issn>0093-3813</issn><issn>1939-9375</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kM1Lw0AUxBdRsFbvgpcFz6n7kc12jypVC0WlrefwkrzElDaJm43Yi3-7G1J7msfwmzcwhFxzNuGcmbv1-2oimBATyTXXkp-QETfSBEZqdUpGjBkZyCmX5-SibTeM8VAxMSK_sy2mztYVXaUWmrIqKFQZPbpr3DVowXUW6RKzLnWld5M9fSih_ccypOCo-0Q6-3EWBmaJRS91ToEuwBZIX7EAV34jnfd1dWdTvCRnOWxbvDromHw8zdaPL8Hi7Xn-eL8IUmG4C3KQiNMkzxg3EQJqA0wZf-RZqKZJFKKUEGkVqSSSkUiUBKV9NNc6RTCJHJPb4W9j668OWxdvfH_lK2OhQ6FZqDT3FBuo1NZtazGPG1vuwO5jzuJ-5divHPcrx4eVfeRmiJSIeMSN1pKJSP4B_7F54g</recordid><startdate>20221101</startdate><enddate>20221101</enddate><creator>Candeloro, Valeria</creator><creator>Sartori, Emanuele</creator><creator>Serianni, Gianluigi</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0001-6458-7718</orcidid><orcidid>https://orcid.org/0000-0002-5651-1825</orcidid><orcidid>https://orcid.org/0000-0002-4704-2019</orcidid></search><sort><creationdate>20221101</creationdate><title>Electron Scraping and Electron Temperature Reduction by Bias Electrode at the Extraction Region of a Large Negative Ion Source</title><author>Candeloro, Valeria ; Sartori, Emanuele ; Serianni, Gianluigi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c291t-fa3ee8bfd0196eae79a059eaefd458b64e33a67565b6362b53a57c29f77cea9b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2022</creationdate><topic>Apertures</topic><topic>Bias</topic><topic>Bias plate (BP)</topic><topic>Cesium</topic><topic>Deuterium</topic><topic>Electric potential</topic><topic>Electrodes</topic><topic>Electron density</topic><topic>Electron energy</topic><topic>filter field</topic><topic>Injectors</topic><topic>Ion beams</topic><topic>Ion sources</topic><topic>Magnetic domains</topic><topic>negative ion extraction</topic><topic>Negative ions</topic><topic>Neutral beams</topic><topic>Numerical models</topic><topic>particle-in-cell (PIC)</topic><topic>plasma grid (PG)</topic><topic>Plasma temperature</topic><topic>Plasmas</topic><topic>Radio frequency</topic><topic>Radio frequency plasma</topic><topic>Scraping</topic><topic>Test facilities</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Candeloro, Valeria</creatorcontrib><creatorcontrib>Sartori, Emanuele</creatorcontrib><creatorcontrib>Serianni, Gianluigi</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on plasma science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Candeloro, Valeria</au><au>Sartori, Emanuele</au><au>Serianni, Gianluigi</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Electron Scraping and Electron Temperature Reduction by Bias Electrode at the Extraction Region of a Large Negative Ion Source</atitle><jtitle>IEEE transactions on plasma science</jtitle><stitle>TPS</stitle><date>2022-11-01</date><risdate>2022</risdate><volume>50</volume><issue>11</issue><spage>3983</spage><epage>3988</epage><pages>3983-3988</pages><issn>0093-3813</issn><eissn>1939-9375</eissn><coden>ITPSBD</coden><abstract>The neutral beam test facility (NBTF), built in Consorzio RFX (Padua, Italy), aims at optimizing the ITER neutral beam injectors through dedicated devices. The facility hosts the full-size prototype of the ion source of the ITER injectors, source for the production of ions of deuterium extracted from a radiofrequency plasma (SPIDER), a radio frequency-based, cesium-assisted negative ion source. The negative ion beam is extracted by a triode with total acceleration voltage up to 108 kV; each grid is provided with 1280 apertures. On the plasma side, the plasma electrode [plasma grid (PG)] is partially covered by an additional electrode [bias plate (BP)] featuring wide openings of the same size as the beamlet groups. The PG and BP can be independently biased with respect to the ion source, influencing the uniformity of the beam and the amount of coextracted electrons. This contribution aims at studying the scraping effect of the electrons by the BP along the direction parallel to the filter field through numerical simulations. The possible role of the BP bias in reducing both the electron density and temperature in front of the extraction apertures and the correlation of the electron temperature with the bias of the electrodes are also discussed.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TPS.2022.3171731</doi><tpages>6</tpages><orcidid>https://orcid.org/0000-0001-6458-7718</orcidid><orcidid>https://orcid.org/0000-0002-5651-1825</orcidid><orcidid>https://orcid.org/0000-0002-4704-2019</orcidid></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 0093-3813
ispartof IEEE transactions on plasma science, 2022-11, Vol.50 (11), p.3983-3988
issn 0093-3813
1939-9375
language eng
recordid cdi_proquest_journals_2742704571
source IEEE Electronic Library (IEL)
subjects Apertures
Bias
Bias plate (BP)
Cesium
Deuterium
Electric potential
Electrodes
Electron density
Electron energy
filter field
Injectors
Ion beams
Ion sources
Magnetic domains
negative ion extraction
Negative ions
Neutral beams
Numerical models
particle-in-cell (PIC)
plasma grid (PG)
Plasma temperature
Plasmas
Radio frequency
Radio frequency plasma
Scraping
Test facilities
title Electron Scraping and Electron Temperature Reduction by Bias Electrode at the Extraction Region of a Large Negative Ion Source
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-07T01%3A10%3A15IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Electron%20Scraping%20and%20Electron%20Temperature%20Reduction%20by%20Bias%20Electrode%20at%20the%20Extraction%20Region%20of%20a%20Large%20Negative%20Ion%20Source&rft.jtitle=IEEE%20transactions%20on%20plasma%20science&rft.au=Candeloro,%20Valeria&rft.date=2022-11-01&rft.volume=50&rft.issue=11&rft.spage=3983&rft.epage=3988&rft.pages=3983-3988&rft.issn=0093-3813&rft.eissn=1939-9375&rft.coden=ITPSBD&rft_id=info:doi/10.1109/TPS.2022.3171731&rft_dat=%3Cproquest_RIE%3E2742704571%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2742704571&rft_id=info:pmid/&rft_ieee_id=9773026&rfr_iscdi=true