Structure-terahertz property relationship in tellurite glasses
Structure-terahertz (THz) property relationship for sodium tungsten tellurite (NWT) and lanthanum tungsten tellurite (LWT) glass systems is reported and is the first of its kind for non-silicate oxide glasses. Raman spectroscopy was used to determine structural units, connectivity, and glass network...
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description | Structure-terahertz (THz) property relationship for sodium tungsten tellurite (NWT) and lanthanum tungsten tellurite (LWT) glass systems is reported and is the first of its kind for non-silicate oxide glasses. Raman spectroscopy was used to determine structural units, connectivity, and glass network. Terahertz time-domain spectroscopy (THz-TDS) was used to record the THz refractive index,
n
(THz), at 0.502 THz. NWT and LWT glasses record higher measurable
n
(THz) correlated to a glass network with substantial TeO
2
and WO
3
content with mixed Te–O–W linkages and TeO
2
- or WO
3
-rich content with homonuclear Te–O–Te or W–O–W linkages, respectively. Concurrent examination revealed three distinct regions of
n
(THz). |
doi_str_mv | 10.1007/s00339-022-06148-x |
format | Article |
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n
(THz), at 0.502 THz. NWT and LWT glasses record higher measurable
n
(THz) correlated to a glass network with substantial TeO
2
and WO
3
content with mixed Te–O–W linkages and TeO
2
- or WO
3
-rich content with homonuclear Te–O–Te or W–O–W linkages, respectively. Concurrent examination revealed three distinct regions of
n
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n
(THz), at 0.502 THz. NWT and LWT glasses record higher measurable
n
(THz) correlated to a glass network with substantial TeO
2
and WO
3
content with mixed Te–O–W linkages and TeO
2
- or WO
3
-rich content with homonuclear Te–O–Te or W–O–W linkages, respectively. Concurrent examination revealed three distinct regions of
n
(THz).</description><subject>Applied physics</subject><subject>Characterization and Evaluation of Materials</subject><subject>Condensed Matter Physics</subject><subject>Glass</subject><subject>Lanthanum</subject><subject>Linkages</subject><subject>Machines</subject><subject>Manufacturing</subject><subject>Materials science</subject><subject>Nanotechnology</subject><subject>Optical and Electronic Materials</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><subject>Processes</subject><subject>Raman spectroscopy</subject><subject>Refractivity</subject><subject>Surfaces and Interfaces</subject><subject>Tellurium dioxide</subject><subject>Thin Films</subject><subject>Tungsten oxides</subject><issn>0947-8396</issn><issn>1432-0630</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><recordid>eNp9kE9LAzEQxYMoWKtfwNOC52iSSbvJRZDiPyh4UM8hm07aLevummSh9dObuoI35zIz8N6b4UfIJWfXnLHyJjIGoCkTgrI5l4rujsiESziswI7JhGlZUgV6fkrOYtyyXFKICbl9TWFwaQhIEwa7wZC-ij50fR72RcDGprpr46bui7otEjbNEOqExbqxMWI8JyfeNhEvfvuUvD_cvy2e6PLl8Xlxt6QOuE5UwspZrrV0K2EBpHJlyRVUnCl0IB06X3rlLUfkXgqslJ8hsqpyqGelAJiSqzE3v_Y5YExm2w2hzSeNKIWSGgBEVolR5UIXY0Bv-lB_2LA3nJkDJzNyMpmT-eFkdtkEoylmcbvG8Bf9j-sbQd1tPA</recordid><startdate>20221101</startdate><enddate>20221101</enddate><creator>Tostanoski, Nicholas J.</creator><creator>Sundaram, S. K.</creator><general>Springer Berlin Heidelberg</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><orcidid>https://orcid.org/0000-0001-6208-0016</orcidid></search><sort><creationdate>20221101</creationdate><title>Structure-terahertz property relationship in tellurite glasses</title><author>Tostanoski, Nicholas J. ; Sundaram, S. K.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c319t-43dca1994cd2a3348c77183b108ec34cecf7f8fa1ee1f42eb8f5ee0bbce957233</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2022</creationdate><topic>Applied physics</topic><topic>Characterization and Evaluation of Materials</topic><topic>Condensed Matter Physics</topic><topic>Glass</topic><topic>Lanthanum</topic><topic>Linkages</topic><topic>Machines</topic><topic>Manufacturing</topic><topic>Materials science</topic><topic>Nanotechnology</topic><topic>Optical and Electronic Materials</topic><topic>Physics</topic><topic>Physics and Astronomy</topic><topic>Processes</topic><topic>Raman spectroscopy</topic><topic>Refractivity</topic><topic>Surfaces and Interfaces</topic><topic>Tellurium dioxide</topic><topic>Thin Films</topic><topic>Tungsten oxides</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Tostanoski, Nicholas J.</creatorcontrib><creatorcontrib>Sundaram, S. K.</creatorcontrib><collection>CrossRef</collection><jtitle>Applied physics. A, Materials science & processing</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Tostanoski, Nicholas J.</au><au>Sundaram, S. K.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Structure-terahertz property relationship in tellurite glasses</atitle><jtitle>Applied physics. A, Materials science & processing</jtitle><stitle>Appl. Phys. A</stitle><date>2022-11-01</date><risdate>2022</risdate><volume>128</volume><issue>11</issue><artnum>1001</artnum><issn>0947-8396</issn><eissn>1432-0630</eissn><abstract>Structure-terahertz (THz) property relationship for sodium tungsten tellurite (NWT) and lanthanum tungsten tellurite (LWT) glass systems is reported and is the first of its kind for non-silicate oxide glasses. Raman spectroscopy was used to determine structural units, connectivity, and glass network. Terahertz time-domain spectroscopy (THz-TDS) was used to record the THz refractive index,
n
(THz), at 0.502 THz. NWT and LWT glasses record higher measurable
n
(THz) correlated to a glass network with substantial TeO
2
and WO
3
content with mixed Te–O–W linkages and TeO
2
- or WO
3
-rich content with homonuclear Te–O–Te or W–O–W linkages, respectively. Concurrent examination revealed three distinct regions of
n
(THz).</abstract><cop>Berlin/Heidelberg</cop><pub>Springer Berlin Heidelberg</pub><doi>10.1007/s00339-022-06148-x</doi><orcidid>https://orcid.org/0000-0001-6208-0016</orcidid></addata></record> |
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subjects | Applied physics Characterization and Evaluation of Materials Condensed Matter Physics Glass Lanthanum Linkages Machines Manufacturing Materials science Nanotechnology Optical and Electronic Materials Physics Physics and Astronomy Processes Raman spectroscopy Refractivity Surfaces and Interfaces Tellurium dioxide Thin Films Tungsten oxides |
title | Structure-terahertz property relationship in tellurite glasses |
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