37.2: Development of High Performance Oxide TFTs Using Back‐Channel‐Etch Structure With Copper Electrodes
In this paper, back‐channel‐etch structure TFTs with copper electrodes were manufactured using Indium‐Gallium‐Zinc oxide (IGZO) and Lanthanide rare earth element doped Indium‐Zinc oxide (Ln‐IZO) as the active layer. After researching the influence of different copper etchants on oxide films and devi...
Gespeichert in:
Veröffentlicht in: | SID International Symposium Digest of technical papers 2022-10, Vol.53 (S1), p.396-399 |
---|---|
Hauptverfasser: | , , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Schreiben Sie den ersten Kommentar!