Design of Radiation-Tolerant High-Speed Signal Processing Circuit for Detecting Prompt Gamma Rays by Nuclear Explosion

Electronic equipment in nuclear power plants and nuclear warfare is damaged by transient effects that cause high-energy pulsed radiation. There is a concern that this type of damage can even cause enormous economic losses and human casualties by paralyzing control systems. To solve this problem, thi...

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Veröffentlicht in:	Electronics (Basel) 2022-09, Vol.11 (18), p.2970
Hauptverfasser:	Lee, Minwoong, Lee, Namho, Gwon, Huijeong, Kim, Jongyeol, Hwang, Younggwan, Cho, Seongik
Format:	Artikel
Sprache:	eng
Schlagworte:	Burnout Casualties Circuit design Circuits CMOS Design Design and construction Economic impact Electronic equipment Explosions Feedback Field effect transistors Gamma rays Identification and classification Metal oxide semiconductor field effect transistors MOSFETs Nuclear explosions Nuclear power plants Nuclear warfare Power consumption Power supply Pulsed radiation Radiation Radiation damage Radiation tests Radiation tolerance Semiconductor devices Sensors Signal processing Silicon Switching Switching circuits Testing Transistors
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