Revealing a high-density three-dimensional Ruddlesden–Popper-type fault network in an SmNiO3 thin film

An epitaxial SmNiO 3 thin-film grown on an LaAlO 3 (001) substrate using pulsed laser deposition is investigated with spherical-aberration corrected scanning transmission electron microscopy techniques, including high-angle annular dark field, X-ray energy dispersive, and electron energy-loss spectr...

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Veröffentlicht in:	Journal of materials research 2021-04, Vol.36 (8), p.1637-1645
Hauptverfasser:	Zhong, Qilan, Deng, Xing, Lin, Lina, Song, Haili, Zheng, Yunzhe, Cheng, Yan, Xiang, Pinghua, Zhong, Ni, Qi, Ruijuan, Duan, Chungang, Huang, Rong
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied and Technical Physics Biomaterials Chemistry and Materials Science Density Distortion Electron beams Electron energy Electron energy loss spectroscopy Epitaxial growth Faults Image contrast Inorganic Chemistry Lattice strain Materials Engineering Materials research Materials Science Nanotechnology Physical properties Pulsed laser deposition Pulsed lasers Scanning transmission electron microscopy Stoichiometry Substrates Thin films Transition temperature
Online-Zugang:	Volltext
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