Scanning electron microscope fine tuning using four-bar piezoelectric actuated mechanism

Scanning Electron Microscopes are extensively used for accurate micro/nano images exploring. Several strategies have been proposed to fine tune those microscopes in the past few years. This work presents a new fine tuning strategy of a scanning electron microscope sample table using four bar piezoel...

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Veröffentlicht in:Journal of Electrical Engineering 2018-01, Vol.69 (1), p.24-31
Hauptverfasser: Hatamleh, Khaled S., Khasawneh, Qais A., Al-Ghasem, Adnan, Jaradat, Mohammad A., Sawaqed, Laith, Al-Shabi, Mohammad
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Sprache:eng
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