Scanning electron microscope fine tuning using four-bar piezoelectric actuated mechanism
Scanning Electron Microscopes are extensively used for accurate micro/nano images exploring. Several strategies have been proposed to fine tune those microscopes in the past few years. This work presents a new fine tuning strategy of a scanning electron microscope sample table using four bar piezoel...
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Veröffentlicht in: | Journal of Electrical Engineering 2018-01, Vol.69 (1), p.24-31 |
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Format: | Artikel |
Sprache: | eng |
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