Network Delay Measurement with Machine Learning: From Lab to Real-World Deployment

Artificial Intelligence (AI) continues to impact all facets of technology including Instrumentation and Measurement (I&M) with much effort spent on developing I&M systems assisted by machine learning (ML), especially deep learning [1]. While these ML-assisted I&M systems show promising r...

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Veröffentlicht in:	IEEE instrumentation & measurement magazine 2022-09, Vol.25 (6), p.25-30
Hauptverfasser:	Mohammed, Shady A., Shirmohammadi, Shervin, Alchalabi, Alaa Eddin
Format:	Magazinearticle
Sprache:	eng
Schlagworte:	Artificial intelligence Data models Deep learning Delays Machine learning Refining System performance Training data Transfer learning
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