Detecting crop phenology from vegetation index time-series data by improved shape model fitting in each phenological stage
Crop phenology provides important information for crop growth management and yield estimations. The popular shape model fitting (SMF) method detects crop phenology from vegetation index (VI) time-series data, but it has two limitations. First, SMF assumes the same “relative position” of phenological...
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Veröffentlicht in: | Remote sensing of environment 2022-08, Vol.277, p.113060, Article 113060 |
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