Double-sided detector for electron beam alignment and measurement of back-streaming electrons in ExtendedEBIS at BNL
We developed an electron beam detector installed between the superconducting solenoids in ExtentedEBIS. The detector is two-sided. Each side has 4 quadrant plates with an aperture slightly larger than the electron beam radius. The gun-side is for alignment of primary electron beam. The collector sid...
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Veröffentlicht in: | Journal of physics. Conference series 2022-04, Vol.2244 (1), p.12085 |
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creator | Ikeda, Shunsuke Beebe, Edward Kanesue, Takeshi Kondrashev, Sergey Okamura, Masahiro |
description | We developed an electron beam detector installed between the superconducting solenoids in ExtentedEBIS. The detector is two-sided. Each side has 4 quadrant plates with an aperture slightly larger than the electron beam radius. The gun-side is for alignment of primary electron beam. The collector side detector is to measure the electrons back-streaming from the collector or the downstream electrodes to the cathode. It is important to understand how the back-streaming electrons behave and how to control it. The detector was designed with considerations of heat load. The influence on the electric potential distribution was investigated. A detector test showed that the back-streaming electrons were affected by the external electromagnetic fields and the space charge of the primary electron beam. It was proved that the behaviour of the electrons can be observed by this detector. |
doi_str_mv | 10.1088/1742-6596/2244/1/012085 |
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It was proved that the behaviour of the electrons can be observed by this detector.</description><subject>Alignment</subject><subject>Electromagnetic fields</subject><subject>Electron beams</subject><subject>Electrons</subject><subject>Physics</subject><subject>Sensors</subject><subject>Solenoids</subject><subject>Space charge</subject><issn>1742-6588</issn><issn>1742-6596</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><sourceid>O3W</sourceid><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNqFkF9LwzAUxYMoOKefwYBvQm3SNmn76ObUyVBhvoe0uRmd_TOTFPTbm1qZCIKBkBvyO-feHITOKbmiJMtCmiZRwFnOwyhKkpCGhEYkYwdosn853NdZdoxOrN0SEvuVTpC76fqihsBWChRW4KB0ncHab6h9bboWFyAbLOtq0zbQOixbhRuQtjfwde80LmT5GlhnPFi1m73S4qrFi3cHrTdfzJZrLB2ePa5O0ZGWtYWz73OK1reLl_l9sHq6W86vV0EZs9wFaeLnBSkTViipkozqgqc0S1KuI_-djOe8YAqkljEtKcvTMiKgSS65TCGKp-hidN2Z7q0H68S2603rG4qIM0YZ4zn1VDpSpemsNaDFzlSNNB-CEjEELIboxBCjGAIWVIwBe-XlqKy63Y_1w_N8_RsUO6U9HP8B_9fiE8IWi14</recordid><startdate>20220401</startdate><enddate>20220401</enddate><creator>Ikeda, Shunsuke</creator><creator>Beebe, Edward</creator><creator>Kanesue, Takeshi</creator><creator>Kondrashev, Sergey</creator><creator>Okamura, Masahiro</creator><general>IOP Publishing</general><scope>O3W</scope><scope>TSCCA</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>H8D</scope><scope>HCIFZ</scope><scope>L7M</scope><scope>P5Z</scope><scope>P62</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope></search><sort><creationdate>20220401</creationdate><title>Double-sided detector for electron beam alignment and measurement of back-streaming electrons in ExtendedEBIS at BNL</title><author>Ikeda, Shunsuke ; Beebe, Edward ; Kanesue, Takeshi ; Kondrashev, Sergey ; Okamura, Masahiro</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c359t-74588eaa45bdad481fb6718476f27428696b5deafa31c1597c20ef09a6a7e23</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2022</creationdate><topic>Alignment</topic><topic>Electromagnetic fields</topic><topic>Electron beams</topic><topic>Electrons</topic><topic>Physics</topic><topic>Sensors</topic><topic>Solenoids</topic><topic>Space charge</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ikeda, Shunsuke</creatorcontrib><creatorcontrib>Beebe, Edward</creatorcontrib><creatorcontrib>Kanesue, Takeshi</creatorcontrib><creatorcontrib>Kondrashev, Sergey</creatorcontrib><creatorcontrib>Okamura, Masahiro</creatorcontrib><collection>IOP Publishing Free Content</collection><collection>IOPscience (Open Access)</collection><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Aerospace Database</collection><collection>SciTech Premium Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><jtitle>Journal of physics. 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subjects | Alignment Electromagnetic fields Electron beams Electrons Physics Sensors Solenoids Space charge |
title | Double-sided detector for electron beam alignment and measurement of back-streaming electrons in ExtendedEBIS at BNL |
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