Double-sided detector for electron beam alignment and measurement of back-streaming electrons in ExtendedEBIS at BNL

We developed an electron beam detector installed between the superconducting solenoids in ExtentedEBIS. The detector is two-sided. Each side has 4 quadrant plates with an aperture slightly larger than the electron beam radius. The gun-side is for alignment of primary electron beam. The collector sid...

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Veröffentlicht in:Journal of physics. Conference series 2022-04, Vol.2244 (1), p.12085
Hauptverfasser: Ikeda, Shunsuke, Beebe, Edward, Kanesue, Takeshi, Kondrashev, Sergey, Okamura, Masahiro
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container_issue 1
container_start_page 12085
container_title Journal of physics. Conference series
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creator Ikeda, Shunsuke
Beebe, Edward
Kanesue, Takeshi
Kondrashev, Sergey
Okamura, Masahiro
description We developed an electron beam detector installed between the superconducting solenoids in ExtentedEBIS. The detector is two-sided. Each side has 4 quadrant plates with an aperture slightly larger than the electron beam radius. The gun-side is for alignment of primary electron beam. The collector side detector is to measure the electrons back-streaming from the collector or the downstream electrodes to the cathode. It is important to understand how the back-streaming electrons behave and how to control it. The detector was designed with considerations of heat load. The influence on the electric potential distribution was investigated. A detector test showed that the back-streaming electrons were affected by the external electromagnetic fields and the space charge of the primary electron beam. It was proved that the behaviour of the electrons can be observed by this detector.
doi_str_mv 10.1088/1742-6596/2244/1/012085
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fullrecord <record><control><sourceid>proquest_iop_j</sourceid><recordid>TN_cdi_proquest_journals_2655155691</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2655155691</sourcerecordid><originalsourceid>FETCH-LOGICAL-c359t-74588eaa45bdad481fb6718476f27428696b5deafa31c1597c20ef09a6a7e23</originalsourceid><addsrcrecordid>eNqFkF9LwzAUxYMoOKefwYBvQm3SNmn76ObUyVBhvoe0uRmd_TOTFPTbm1qZCIKBkBvyO-feHITOKbmiJMtCmiZRwFnOwyhKkpCGhEYkYwdosn853NdZdoxOrN0SEvuVTpC76fqihsBWChRW4KB0ncHab6h9bboWFyAbLOtq0zbQOixbhRuQtjfwde80LmT5GlhnPFi1m73S4qrFi3cHrTdfzJZrLB2ePa5O0ZGWtYWz73OK1reLl_l9sHq6W86vV0EZs9wFaeLnBSkTViipkozqgqc0S1KuI_-djOe8YAqkljEtKcvTMiKgSS65TCGKp-hidN2Z7q0H68S2603rG4qIM0YZ4zn1VDpSpemsNaDFzlSNNB-CEjEELIboxBCjGAIWVIwBe-XlqKy63Y_1w_N8_RsUO6U9HP8B_9fiE8IWi14</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2655155691</pqid></control><display><type>article</type><title>Double-sided detector for electron beam alignment and measurement of back-streaming electrons in ExtendedEBIS at BNL</title><source>IOP Publishing Free Content</source><source>Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals</source><source>IOPscience extra</source><source>Alma/SFX Local Collection</source><source>Free Full-Text Journals in Chemistry</source><creator>Ikeda, Shunsuke ; Beebe, Edward ; Kanesue, Takeshi ; Kondrashev, Sergey ; Okamura, Masahiro</creator><creatorcontrib>Ikeda, Shunsuke ; Beebe, Edward ; Kanesue, Takeshi ; Kondrashev, Sergey ; Okamura, Masahiro</creatorcontrib><description>We developed an electron beam detector installed between the superconducting solenoids in ExtentedEBIS. The detector is two-sided. Each side has 4 quadrant plates with an aperture slightly larger than the electron beam radius. The gun-side is for alignment of primary electron beam. The collector side detector is to measure the electrons back-streaming from the collector or the downstream electrodes to the cathode. It is important to understand how the back-streaming electrons behave and how to control it. The detector was designed with considerations of heat load. The influence on the electric potential distribution was investigated. A detector test showed that the back-streaming electrons were affected by the external electromagnetic fields and the space charge of the primary electron beam. It was proved that the behaviour of the electrons can be observed by this detector.</description><identifier>ISSN: 1742-6588</identifier><identifier>EISSN: 1742-6596</identifier><identifier>DOI: 10.1088/1742-6596/2244/1/012085</identifier><language>eng</language><publisher>Bristol: IOP Publishing</publisher><subject>Alignment ; Electromagnetic fields ; Electron beams ; Electrons ; Physics ; Sensors ; Solenoids ; Space charge</subject><ispartof>Journal of physics. Conference series, 2022-04, Vol.2244 (1), p.12085</ispartof><rights>Published under licence by IOP Publishing Ltd</rights><rights>Published under licence by IOP Publishing Ltd. This work is published under http://creativecommons.org/licenses/by/3.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c359t-74588eaa45bdad481fb6718476f27428696b5deafa31c1597c20ef09a6a7e23</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://iopscience.iop.org/article/10.1088/1742-6596/2244/1/012085/pdf$$EPDF$$P50$$Giop$$Hfree_for_read</linktopdf><link.rule.ids>314,780,784,27923,27924,38867,38889,53839,53866</link.rule.ids></links><search><creatorcontrib>Ikeda, Shunsuke</creatorcontrib><creatorcontrib>Beebe, Edward</creatorcontrib><creatorcontrib>Kanesue, Takeshi</creatorcontrib><creatorcontrib>Kondrashev, Sergey</creatorcontrib><creatorcontrib>Okamura, Masahiro</creatorcontrib><title>Double-sided detector for electron beam alignment and measurement of back-streaming electrons in ExtendedEBIS at BNL</title><title>Journal of physics. Conference series</title><addtitle>J. Phys.: Conf. Ser</addtitle><description>We developed an electron beam detector installed between the superconducting solenoids in ExtentedEBIS. The detector is two-sided. Each side has 4 quadrant plates with an aperture slightly larger than the electron beam radius. The gun-side is for alignment of primary electron beam. The collector side detector is to measure the electrons back-streaming from the collector or the downstream electrodes to the cathode. It is important to understand how the back-streaming electrons behave and how to control it. The detector was designed with considerations of heat load. The influence on the electric potential distribution was investigated. A detector test showed that the back-streaming electrons were affected by the external electromagnetic fields and the space charge of the primary electron beam. It was proved that the behaviour of the electrons can be observed by this detector.</description><subject>Alignment</subject><subject>Electromagnetic fields</subject><subject>Electron beams</subject><subject>Electrons</subject><subject>Physics</subject><subject>Sensors</subject><subject>Solenoids</subject><subject>Space charge</subject><issn>1742-6588</issn><issn>1742-6596</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><sourceid>O3W</sourceid><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNqFkF9LwzAUxYMoOKefwYBvQm3SNmn76ObUyVBhvoe0uRmd_TOTFPTbm1qZCIKBkBvyO-feHITOKbmiJMtCmiZRwFnOwyhKkpCGhEYkYwdosn853NdZdoxOrN0SEvuVTpC76fqihsBWChRW4KB0ncHab6h9bboWFyAbLOtq0zbQOixbhRuQtjfwde80LmT5GlhnPFi1m73S4qrFi3cHrTdfzJZrLB2ePa5O0ZGWtYWz73OK1reLl_l9sHq6W86vV0EZs9wFaeLnBSkTViipkozqgqc0S1KuI_-djOe8YAqkljEtKcvTMiKgSS65TCGKp-hidN2Z7q0H68S2603rG4qIM0YZ4zn1VDpSpemsNaDFzlSNNB-CEjEELIboxBCjGAIWVIwBe-XlqKy63Y_1w_N8_RsUO6U9HP8B_9fiE8IWi14</recordid><startdate>20220401</startdate><enddate>20220401</enddate><creator>Ikeda, Shunsuke</creator><creator>Beebe, Edward</creator><creator>Kanesue, Takeshi</creator><creator>Kondrashev, Sergey</creator><creator>Okamura, Masahiro</creator><general>IOP Publishing</general><scope>O3W</scope><scope>TSCCA</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>H8D</scope><scope>HCIFZ</scope><scope>L7M</scope><scope>P5Z</scope><scope>P62</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope></search><sort><creationdate>20220401</creationdate><title>Double-sided detector for electron beam alignment and measurement of back-streaming electrons in ExtendedEBIS at BNL</title><author>Ikeda, Shunsuke ; Beebe, Edward ; Kanesue, Takeshi ; Kondrashev, Sergey ; Okamura, Masahiro</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c359t-74588eaa45bdad481fb6718476f27428696b5deafa31c1597c20ef09a6a7e23</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2022</creationdate><topic>Alignment</topic><topic>Electromagnetic fields</topic><topic>Electron beams</topic><topic>Electrons</topic><topic>Physics</topic><topic>Sensors</topic><topic>Solenoids</topic><topic>Space charge</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ikeda, Shunsuke</creatorcontrib><creatorcontrib>Beebe, Edward</creatorcontrib><creatorcontrib>Kanesue, Takeshi</creatorcontrib><creatorcontrib>Kondrashev, Sergey</creatorcontrib><creatorcontrib>Okamura, Masahiro</creatorcontrib><collection>IOP Publishing Free Content</collection><collection>IOPscience (Open Access)</collection><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Aerospace Database</collection><collection>SciTech Premium Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Advanced Technologies &amp; Aerospace Database</collection><collection>ProQuest Advanced Technologies &amp; Aerospace Collection</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><jtitle>Journal of physics. Conference series</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Ikeda, Shunsuke</au><au>Beebe, Edward</au><au>Kanesue, Takeshi</au><au>Kondrashev, Sergey</au><au>Okamura, Masahiro</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Double-sided detector for electron beam alignment and measurement of back-streaming electrons in ExtendedEBIS at BNL</atitle><jtitle>Journal of physics. Conference series</jtitle><addtitle>J. Phys.: Conf. Ser</addtitle><date>2022-04-01</date><risdate>2022</risdate><volume>2244</volume><issue>1</issue><spage>12085</spage><pages>12085-</pages><issn>1742-6588</issn><eissn>1742-6596</eissn><abstract>We developed an electron beam detector installed between the superconducting solenoids in ExtentedEBIS. The detector is two-sided. Each side has 4 quadrant plates with an aperture slightly larger than the electron beam radius. The gun-side is for alignment of primary electron beam. The collector side detector is to measure the electrons back-streaming from the collector or the downstream electrodes to the cathode. It is important to understand how the back-streaming electrons behave and how to control it. The detector was designed with considerations of heat load. The influence on the electric potential distribution was investigated. A detector test showed that the back-streaming electrons were affected by the external electromagnetic fields and the space charge of the primary electron beam. It was proved that the behaviour of the electrons can be observed by this detector.</abstract><cop>Bristol</cop><pub>IOP Publishing</pub><doi>10.1088/1742-6596/2244/1/012085</doi><tpages>5</tpages><oa>free_for_read</oa></addata></record>
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subjects Alignment
Electromagnetic fields
Electron beams
Electrons
Physics
Sensors
Solenoids
Space charge
title Double-sided detector for electron beam alignment and measurement of back-streaming electrons in ExtendedEBIS at BNL
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-11T13%3A23%3A13IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_iop_j&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Double-sided%20detector%20for%20electron%20beam%20alignment%20and%20measurement%20of%20back-streaming%20electrons%20in%20ExtendedEBIS%20at%20BNL&rft.jtitle=Journal%20of%20physics.%20Conference%20series&rft.au=Ikeda,%20Shunsuke&rft.date=2022-04-01&rft.volume=2244&rft.issue=1&rft.spage=12085&rft.pages=12085-&rft.issn=1742-6588&rft.eissn=1742-6596&rft_id=info:doi/10.1088/1742-6596/2244/1/012085&rft_dat=%3Cproquest_iop_j%3E2655155691%3C/proquest_iop_j%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2655155691&rft_id=info:pmid/&rfr_iscdi=true