Investigation of surface scaling, optical and microwave dielectric studies of Bi0.5Na0.5TiO3 thin films

Herein, we have investigated the optical and microwave dielectric properties of Bi 0.5 Na 0.5 TiO 3 (BNT) thin films grown under different oxygen pressure (PO 2 ) using the pulsed laser deposition technique. The X-ray diffraction measurements confirm the single phase of BNT and the secondary phase a...

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Veröffentlicht in:	Journal of materials science. Materials in electronics 2022-04, Vol.33 (11), p.8893-8905
Hauptverfasser:	Pattipaka, Srinivas, Dobbidi, Pamu, Pundareekam Goud, J., James Raju, K. C., Pradhan, Gobinda, Sridhar, V.
Format:	Artikel
Sprache:	eng
Schlagworte:	Bismuth titanate Characterization and Evaluation of Materials Chemistry and Materials Science Crystal structure Crystallinity Dielectric properties Dielectric strength Lattice vacancies Materials Science Optical and Electronic Materials Optical properties Oxygen Oxygen content Pulsed laser deposition Pulsed lasers Reduction Refractivity Thin films
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