Robustness of organic physically unclonable function with buskeeper circuit for flexible security devices
Flexible devices have been studied to realize IoT or novel wearable devices. The data that flexible devices deal with can include personal information when application areas further expand. A security system for flexible devices becomes more important in this case. In this study, we investigate the...
Gespeichert in:
Veröffentlicht in: | Japanese Journal of Applied Physics 2022-06, Vol.61 (SE), p.SE1016 |
---|---|
Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | SE |
container_start_page | SE1016 |
container_title | Japanese Journal of Applied Physics |
container_volume | 61 |
creator | Kuribara, Kazunori Watanabe, Yuichi Takei, Atsushi Uemura, Sei Yoshida, Manabu |
description | Flexible devices have been studied to realize IoT or novel wearable devices. The data that flexible devices deal with can include personal information when application areas further expand. A security system for flexible devices becomes more important in this case. In this study, we investigate the thermal stability of an organic flexible security system. The security system utilizes fabrication variation of a chip, and it is called a physically unclonable function (PUF). As a result, the bit error rate of the organic PUF is 1.8% and the index of ID uniqueness (i.e., randomness) has an almost theoretical value of 0.48. The generated ID remains even after annealing at 100 °C for 97 h by using CYTOP encapsulation. X-ray diffraction measurement implies that degradation of PUF characteristics partially derives from structure changes of the organic n-type semiconductor thin film after annealing. |
doi_str_mv | 10.35848/1347-4065/ac4c6a |
format | Article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2648175414</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2648175414</sourcerecordid><originalsourceid>FETCH-LOGICAL-c388t-f71b4574a05063b51d170af9855928b8fbacedee9455d55c0baeb4cdcf24ca613</originalsourceid><addsrcrecordid>eNp1kEtLxDAUhYMoOI7-AHcBVy7qJG2SZpYy-IIBwcc6JGnipNamJq3af2_Gim4ULtyby3fOJQeAY4zOCsoJX-CClBlBjC6kJprJHTD7We2CGUI5zsgyz_fBQYx1ejJK8Ay4O6-G2LcmRugt9OFJtk7DbjNGp2XTjHBodeNbqRoDbZp751v47voNTLpnYzoToHZBD66H1gdoG_PhtnA0egiuH2Fl3pw28RDsWdlEc_Td5-Dx8uJhdZ2tb69uVufrTBec95ktsSK0JBJRxApFcYVLJO2SU7rMueJWSW0qY5aE0opSjZQ0iuhK25xoyXAxByeTbxf862BiL2o_hDadFDkjHJfp3yRReKJ08DEGY0UX3IsMo8BIfCUqtvGJbXxiSjRpTieN892vaV3LTjAs7i9SYYSZ6Cqb2OwP9n_vT5J6iSk</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2648175414</pqid></control><display><type>article</type><title>Robustness of organic physically unclonable function with buskeeper circuit for flexible security devices</title><source>IOP Publishing Journals</source><source>Institute of Physics (IOP) Journals - HEAL-Link</source><creator>Kuribara, Kazunori ; Watanabe, Yuichi ; Takei, Atsushi ; Uemura, Sei ; Yoshida, Manabu</creator><creatorcontrib>Kuribara, Kazunori ; Watanabe, Yuichi ; Takei, Atsushi ; Uemura, Sei ; Yoshida, Manabu</creatorcontrib><description>Flexible devices have been studied to realize IoT or novel wearable devices. The data that flexible devices deal with can include personal information when application areas further expand. A security system for flexible devices becomes more important in this case. In this study, we investigate the thermal stability of an organic flexible security system. The security system utilizes fabrication variation of a chip, and it is called a physically unclonable function (PUF). As a result, the bit error rate of the organic PUF is 1.8% and the index of ID uniqueness (i.e., randomness) has an almost theoretical value of 0.48. The generated ID remains even after annealing at 100 °C for 97 h by using CYTOP encapsulation. X-ray diffraction measurement implies that degradation of PUF characteristics partially derives from structure changes of the organic n-type semiconductor thin film after annealing.</description><identifier>ISSN: 0021-4922</identifier><identifier>EISSN: 1347-4065</identifier><identifier>DOI: 10.35848/1347-4065/ac4c6a</identifier><identifier>CODEN: JJAPB6</identifier><language>eng</language><publisher>Tokyo: IOP Publishing</publisher><subject>Annealing ; Bit error rate ; Circuits ; Electronic devices ; flexible ; N-type semiconductors ; Organic transistor ; physically unclonable function ; security ; Security systems ; Thermal stability ; Thin films ; Wearable technology</subject><ispartof>Japanese Journal of Applied Physics, 2022-06, Vol.61 (SE), p.SE1016</ispartof><rights>2022 The Japan Society of Applied Physics</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c388t-f71b4574a05063b51d170af9855928b8fbacedee9455d55c0baeb4cdcf24ca613</citedby><cites>FETCH-LOGICAL-c388t-f71b4574a05063b51d170af9855928b8fbacedee9455d55c0baeb4cdcf24ca613</cites><orcidid>0000-0002-7013-3613 ; 0000-0003-4729-3034 ; 0000-0003-2746-1467 ; 0000-0002-6164-2045 ; 0000-0002-9038-6722</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://iopscience.iop.org/article/10.35848/1347-4065/ac4c6a/pdf$$EPDF$$P50$$Giop$$H</linktopdf><link.rule.ids>314,780,784,27924,27925,53846,53893</link.rule.ids></links><search><creatorcontrib>Kuribara, Kazunori</creatorcontrib><creatorcontrib>Watanabe, Yuichi</creatorcontrib><creatorcontrib>Takei, Atsushi</creatorcontrib><creatorcontrib>Uemura, Sei</creatorcontrib><creatorcontrib>Yoshida, Manabu</creatorcontrib><title>Robustness of organic physically unclonable function with buskeeper circuit for flexible security devices</title><title>Japanese Journal of Applied Physics</title><addtitle>Jpn. J. Appl. Phys</addtitle><description>Flexible devices have been studied to realize IoT or novel wearable devices. The data that flexible devices deal with can include personal information when application areas further expand. A security system for flexible devices becomes more important in this case. In this study, we investigate the thermal stability of an organic flexible security system. The security system utilizes fabrication variation of a chip, and it is called a physically unclonable function (PUF). As a result, the bit error rate of the organic PUF is 1.8% and the index of ID uniqueness (i.e., randomness) has an almost theoretical value of 0.48. The generated ID remains even after annealing at 100 °C for 97 h by using CYTOP encapsulation. X-ray diffraction measurement implies that degradation of PUF characteristics partially derives from structure changes of the organic n-type semiconductor thin film after annealing.</description><subject>Annealing</subject><subject>Bit error rate</subject><subject>Circuits</subject><subject>Electronic devices</subject><subject>flexible</subject><subject>N-type semiconductors</subject><subject>Organic transistor</subject><subject>physically unclonable function</subject><subject>security</subject><subject>Security systems</subject><subject>Thermal stability</subject><subject>Thin films</subject><subject>Wearable technology</subject><issn>0021-4922</issn><issn>1347-4065</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><recordid>eNp1kEtLxDAUhYMoOI7-AHcBVy7qJG2SZpYy-IIBwcc6JGnipNamJq3af2_Gim4ULtyby3fOJQeAY4zOCsoJX-CClBlBjC6kJprJHTD7We2CGUI5zsgyz_fBQYx1ejJK8Ay4O6-G2LcmRugt9OFJtk7DbjNGp2XTjHBodeNbqRoDbZp751v47voNTLpnYzoToHZBD66H1gdoG_PhtnA0egiuH2Fl3pw28RDsWdlEc_Td5-Dx8uJhdZ2tb69uVufrTBec95ktsSK0JBJRxApFcYVLJO2SU7rMueJWSW0qY5aE0opSjZQ0iuhK25xoyXAxByeTbxf862BiL2o_hDadFDkjHJfp3yRReKJ08DEGY0UX3IsMo8BIfCUqtvGJbXxiSjRpTieN892vaV3LTjAs7i9SYYSZ6Cqb2OwP9n_vT5J6iSk</recordid><startdate>20220601</startdate><enddate>20220601</enddate><creator>Kuribara, Kazunori</creator><creator>Watanabe, Yuichi</creator><creator>Takei, Atsushi</creator><creator>Uemura, Sei</creator><creator>Yoshida, Manabu</creator><general>IOP Publishing</general><general>Japanese Journal of Applied Physics</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0002-7013-3613</orcidid><orcidid>https://orcid.org/0000-0003-4729-3034</orcidid><orcidid>https://orcid.org/0000-0003-2746-1467</orcidid><orcidid>https://orcid.org/0000-0002-6164-2045</orcidid><orcidid>https://orcid.org/0000-0002-9038-6722</orcidid></search><sort><creationdate>20220601</creationdate><title>Robustness of organic physically unclonable function with buskeeper circuit for flexible security devices</title><author>Kuribara, Kazunori ; Watanabe, Yuichi ; Takei, Atsushi ; Uemura, Sei ; Yoshida, Manabu</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c388t-f71b4574a05063b51d170af9855928b8fbacedee9455d55c0baeb4cdcf24ca613</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2022</creationdate><topic>Annealing</topic><topic>Bit error rate</topic><topic>Circuits</topic><topic>Electronic devices</topic><topic>flexible</topic><topic>N-type semiconductors</topic><topic>Organic transistor</topic><topic>physically unclonable function</topic><topic>security</topic><topic>Security systems</topic><topic>Thermal stability</topic><topic>Thin films</topic><topic>Wearable technology</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kuribara, Kazunori</creatorcontrib><creatorcontrib>Watanabe, Yuichi</creatorcontrib><creatorcontrib>Takei, Atsushi</creatorcontrib><creatorcontrib>Uemura, Sei</creatorcontrib><creatorcontrib>Yoshida, Manabu</creatorcontrib><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Japanese Journal of Applied Physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kuribara, Kazunori</au><au>Watanabe, Yuichi</au><au>Takei, Atsushi</au><au>Uemura, Sei</au><au>Yoshida, Manabu</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Robustness of organic physically unclonable function with buskeeper circuit for flexible security devices</atitle><jtitle>Japanese Journal of Applied Physics</jtitle><addtitle>Jpn. J. Appl. Phys</addtitle><date>2022-06-01</date><risdate>2022</risdate><volume>61</volume><issue>SE</issue><spage>SE1016</spage><pages>SE1016-</pages><issn>0021-4922</issn><eissn>1347-4065</eissn><coden>JJAPB6</coden><abstract>Flexible devices have been studied to realize IoT or novel wearable devices. The data that flexible devices deal with can include personal information when application areas further expand. A security system for flexible devices becomes more important in this case. In this study, we investigate the thermal stability of an organic flexible security system. The security system utilizes fabrication variation of a chip, and it is called a physically unclonable function (PUF). As a result, the bit error rate of the organic PUF is 1.8% and the index of ID uniqueness (i.e., randomness) has an almost theoretical value of 0.48. The generated ID remains even after annealing at 100 °C for 97 h by using CYTOP encapsulation. X-ray diffraction measurement implies that degradation of PUF characteristics partially derives from structure changes of the organic n-type semiconductor thin film after annealing.</abstract><cop>Tokyo</cop><pub>IOP Publishing</pub><doi>10.35848/1347-4065/ac4c6a</doi><tpages>6</tpages><orcidid>https://orcid.org/0000-0002-7013-3613</orcidid><orcidid>https://orcid.org/0000-0003-4729-3034</orcidid><orcidid>https://orcid.org/0000-0003-2746-1467</orcidid><orcidid>https://orcid.org/0000-0002-6164-2045</orcidid><orcidid>https://orcid.org/0000-0002-9038-6722</orcidid><oa>free_for_read</oa></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0021-4922 |
ispartof | Japanese Journal of Applied Physics, 2022-06, Vol.61 (SE), p.SE1016 |
issn | 0021-4922 1347-4065 |
language | eng |
recordid | cdi_proquest_journals_2648175414 |
source | IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link |
subjects | Annealing Bit error rate Circuits Electronic devices flexible N-type semiconductors Organic transistor physically unclonable function security Security systems Thermal stability Thin films Wearable technology |
title | Robustness of organic physically unclonable function with buskeeper circuit for flexible security devices |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T13%3A54%3A16IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Robustness%20of%20organic%20physically%20unclonable%20function%20with%20buskeeper%20circuit%20for%20flexible%20security%20devices&rft.jtitle=Japanese%20Journal%20of%20Applied%20Physics&rft.au=Kuribara,%20Kazunori&rft.date=2022-06-01&rft.volume=61&rft.issue=SE&rft.spage=SE1016&rft.pages=SE1016-&rft.issn=0021-4922&rft.eissn=1347-4065&rft.coden=JJAPB6&rft_id=info:doi/10.35848/1347-4065/ac4c6a&rft_dat=%3Cproquest_cross%3E2648175414%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2648175414&rft_id=info:pmid/&rfr_iscdi=true |