Effects of Remote Boundary Conditions on Clamping Loss in Micromechanical Resonators
Clamping loss in micromechanical resonators can strongly depend on the boundary conditions far away from the actual vibrating structure because the acoustic wavelength greatly exceeds the device dimensions. We demonstrate a scheme for post-fabrication tuning of the clamping loss in flexural-mode and...
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Veröffentlicht in: | Journal of microelectromechanical systems 2022-04, Vol.31 (2), p.204-216 |
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creator | Miller, James M. L. Vukasin, Gabrielle D. Zhang, Ze Kwon, Hyun-Keun Majumdar, Arun Kenny, Thomas W. Shaw, Steven W. |
description | Clamping loss in micromechanical resonators can strongly depend on the boundary conditions far away from the actual vibrating structure because the acoustic wavelength greatly exceeds the device dimensions. We demonstrate a scheme for post-fabrication tuning of the clamping loss in flexural-mode and bulk-mode resonators by modifying the boundary conditions of the chip with the frame. The measured quality factor increases by more than an order-of-magnitude for the microcantilevers and more than a factor of three for the bulk-mode resonators when frame contact is minimized via suspension of the chip by wirebonds. We propose a two-degree-of-freedom fluctuation-dissipation model to describe the thermomechanical noise and forced response in the presence of this tunable anchor damping. By studying the thermomechanical displacement spectrum with tunable clamping loss, we show that variable clamping loss tunes the mechanical quality factor, modifying both the resonator transfer function and thermomechanical noise force. We delineate the dependence of the tunable clamping loss mechanism on microcantilever beam length and ambient temperature from 300 K down to 40 K, and observe potential temperature dependence to clamping loss with reducing temperature. [2021-0141] |
doi_str_mv | 10.1109/JMEMS.2021.3136885 |
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L. ; Vukasin, Gabrielle D. ; Zhang, Ze ; Kwon, Hyun-Keun ; Majumdar, Arun ; Kenny, Thomas W. ; Shaw, Steven W.</creator><creatorcontrib>Miller, James M. L. ; Vukasin, Gabrielle D. ; Zhang, Ze ; Kwon, Hyun-Keun ; Majumdar, Arun ; Kenny, Thomas W. ; Shaw, Steven W.</creatorcontrib><description>Clamping loss in micromechanical resonators can strongly depend on the boundary conditions far away from the actual vibrating structure because the acoustic wavelength greatly exceeds the device dimensions. We demonstrate a scheme for post-fabrication tuning of the clamping loss in flexural-mode and bulk-mode resonators by modifying the boundary conditions of the chip with the frame. The measured quality factor increases by more than an order-of-magnitude for the microcantilevers and more than a factor of three for the bulk-mode resonators when frame contact is minimized via suspension of the chip by wirebonds. We propose a two-degree-of-freedom fluctuation-dissipation model to describe the thermomechanical noise and forced response in the presence of this tunable anchor damping. By studying the thermomechanical displacement spectrum with tunable clamping loss, we show that variable clamping loss tunes the mechanical quality factor, modifying both the resonator transfer function and thermomechanical noise force. We delineate the dependence of the tunable clamping loss mechanism on microcantilever beam length and ambient temperature from 300 K down to 40 K, and observe potential temperature dependence to clamping loss with reducing temperature. [2021-0141]</description><identifier>ISSN: 1057-7157</identifier><identifier>EISSN: 1941-0158</identifier><identifier>DOI: 10.1109/JMEMS.2021.3136885</identifier><identifier>CODEN: JMIYET</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Ambient temperature ; anchor damping ; Boundary conditions ; Clamping ; clamping loss ; Clamps ; Damping ; fluctuation-dissipation theorem ; Force ; MEMS ; microresonators ; Q factors ; Q-factor ; Resonators ; Semiconductor device measurement ; Temperature dependence ; thermoelastic dissipation ; Thermomechanical analysis ; Thermomechanical processes ; Transfer functions</subject><ispartof>Journal of microelectromechanical systems, 2022-04, Vol.31 (2), p.204-216</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2022</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c339t-8ae5b1c6986aff613637f742e4f1a646ab27e5fcef6e9fa37cbca0a089c29f5b3</citedby><cites>FETCH-LOGICAL-c339t-8ae5b1c6986aff613637f742e4f1a646ab27e5fcef6e9fa37cbca0a089c29f5b3</cites><orcidid>0000-0003-2570-287X ; 0000-0002-3874-4828 ; 0000-0002-4301-1880 ; 0000-0001-7428-0971</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/9674749$$EHTML$$P50$$Gieee$$Hfree_for_read</linktohtml><link.rule.ids>315,781,785,797,27929,27930,54763</link.rule.ids></links><search><creatorcontrib>Miller, James M. L.</creatorcontrib><creatorcontrib>Vukasin, Gabrielle D.</creatorcontrib><creatorcontrib>Zhang, Ze</creatorcontrib><creatorcontrib>Kwon, Hyun-Keun</creatorcontrib><creatorcontrib>Majumdar, Arun</creatorcontrib><creatorcontrib>Kenny, Thomas W.</creatorcontrib><creatorcontrib>Shaw, Steven W.</creatorcontrib><title>Effects of Remote Boundary Conditions on Clamping Loss in Micromechanical Resonators</title><title>Journal of microelectromechanical systems</title><addtitle>JMEMS</addtitle><description>Clamping loss in micromechanical resonators can strongly depend on the boundary conditions far away from the actual vibrating structure because the acoustic wavelength greatly exceeds the device dimensions. We demonstrate a scheme for post-fabrication tuning of the clamping loss in flexural-mode and bulk-mode resonators by modifying the boundary conditions of the chip with the frame. The measured quality factor increases by more than an order-of-magnitude for the microcantilevers and more than a factor of three for the bulk-mode resonators when frame contact is minimized via suspension of the chip by wirebonds. We propose a two-degree-of-freedom fluctuation-dissipation model to describe the thermomechanical noise and forced response in the presence of this tunable anchor damping. By studying the thermomechanical displacement spectrum with tunable clamping loss, we show that variable clamping loss tunes the mechanical quality factor, modifying both the resonator transfer function and thermomechanical noise force. We delineate the dependence of the tunable clamping loss mechanism on microcantilever beam length and ambient temperature from 300 K down to 40 K, and observe potential temperature dependence to clamping loss with reducing temperature. [2021-0141]</description><subject>Ambient temperature</subject><subject>anchor damping</subject><subject>Boundary conditions</subject><subject>Clamping</subject><subject>clamping loss</subject><subject>Clamps</subject><subject>Damping</subject><subject>fluctuation-dissipation theorem</subject><subject>Force</subject><subject>MEMS</subject><subject>microresonators</subject><subject>Q factors</subject><subject>Q-factor</subject><subject>Resonators</subject><subject>Semiconductor device measurement</subject><subject>Temperature dependence</subject><subject>thermoelastic dissipation</subject><subject>Thermomechanical analysis</subject><subject>Thermomechanical processes</subject><subject>Transfer functions</subject><issn>1057-7157</issn><issn>1941-0158</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><sourceid>ESBDL</sourceid><sourceid>RIE</sourceid><recordid>eNo9kE1LAzEQhoMoWKt_QC8Bz1uTzfdRl9YPWgSt55BNE03pJnWzPfjvTW3xNAPzvjPvPABcYzTBGKm7l8V08T6pUY0nBBMuJTsBI6worhBm8rT0iIlKYCbOwUXOa4QwpZKPwHLqvbNDhsnDN9elwcGHtIsr0__AJsVVGEKKZRphszHdNsRPOE85wxDhItg-dc5-mRis2RR7TtEMqc-X4MybTXZXxzoGH7Ppsnmq5q-Pz839vLKEqKGSxrEWW64kN97zkpsIL2jtqMeGU27aWjjmrfPcKW-IsK01yCCpbK08a8kY3B72bvv0vXN50Ou062M5qWtOmZIUYVRU9UFV4ubcO6-3fejKgxojvaen_-jpPT19pFdMNwdTcM79GxQXVFBFfgFwHWyM</recordid><startdate>20220401</startdate><enddate>20220401</enddate><creator>Miller, James M. 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L. ; Vukasin, Gabrielle D. ; Zhang, Ze ; Kwon, Hyun-Keun ; Majumdar, Arun ; Kenny, Thomas W. ; Shaw, Steven W.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c339t-8ae5b1c6986aff613637f742e4f1a646ab27e5fcef6e9fa37cbca0a089c29f5b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2022</creationdate><topic>Ambient temperature</topic><topic>anchor damping</topic><topic>Boundary conditions</topic><topic>Clamping</topic><topic>clamping loss</topic><topic>Clamps</topic><topic>Damping</topic><topic>fluctuation-dissipation theorem</topic><topic>Force</topic><topic>MEMS</topic><topic>microresonators</topic><topic>Q factors</topic><topic>Q-factor</topic><topic>Resonators</topic><topic>Semiconductor device measurement</topic><topic>Temperature dependence</topic><topic>thermoelastic dissipation</topic><topic>Thermomechanical analysis</topic><topic>Thermomechanical processes</topic><topic>Transfer functions</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Miller, James M. L.</creatorcontrib><creatorcontrib>Vukasin, Gabrielle D.</creatorcontrib><creatorcontrib>Zhang, Ze</creatorcontrib><creatorcontrib>Kwon, Hyun-Keun</creatorcontrib><creatorcontrib>Majumdar, Arun</creatorcontrib><creatorcontrib>Kenny, Thomas W.</creatorcontrib><creatorcontrib>Shaw, Steven W.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE Open Access Journals</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of microelectromechanical systems</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Miller, James M. L.</au><au>Vukasin, Gabrielle D.</au><au>Zhang, Ze</au><au>Kwon, Hyun-Keun</au><au>Majumdar, Arun</au><au>Kenny, Thomas W.</au><au>Shaw, Steven W.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Effects of Remote Boundary Conditions on Clamping Loss in Micromechanical Resonators</atitle><jtitle>Journal of microelectromechanical systems</jtitle><stitle>JMEMS</stitle><date>2022-04-01</date><risdate>2022</risdate><volume>31</volume><issue>2</issue><spage>204</spage><epage>216</epage><pages>204-216</pages><issn>1057-7157</issn><eissn>1941-0158</eissn><coden>JMIYET</coden><abstract>Clamping loss in micromechanical resonators can strongly depend on the boundary conditions far away from the actual vibrating structure because the acoustic wavelength greatly exceeds the device dimensions. We demonstrate a scheme for post-fabrication tuning of the clamping loss in flexural-mode and bulk-mode resonators by modifying the boundary conditions of the chip with the frame. The measured quality factor increases by more than an order-of-magnitude for the microcantilevers and more than a factor of three for the bulk-mode resonators when frame contact is minimized via suspension of the chip by wirebonds. We propose a two-degree-of-freedom fluctuation-dissipation model to describe the thermomechanical noise and forced response in the presence of this tunable anchor damping. By studying the thermomechanical displacement spectrum with tunable clamping loss, we show that variable clamping loss tunes the mechanical quality factor, modifying both the resonator transfer function and thermomechanical noise force. We delineate the dependence of the tunable clamping loss mechanism on microcantilever beam length and ambient temperature from 300 K down to 40 K, and observe potential temperature dependence to clamping loss with reducing temperature. [2021-0141]</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/JMEMS.2021.3136885</doi><tpages>13</tpages><orcidid>https://orcid.org/0000-0003-2570-287X</orcidid><orcidid>https://orcid.org/0000-0002-3874-4828</orcidid><orcidid>https://orcid.org/0000-0002-4301-1880</orcidid><orcidid>https://orcid.org/0000-0001-7428-0971</orcidid><oa>free_for_read</oa></addata></record> |
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subjects | Ambient temperature anchor damping Boundary conditions Clamping clamping loss Clamps Damping fluctuation-dissipation theorem Force MEMS microresonators Q factors Q-factor Resonators Semiconductor device measurement Temperature dependence thermoelastic dissipation Thermomechanical analysis Thermomechanical processes Transfer functions |
title | Effects of Remote Boundary Conditions on Clamping Loss in Micromechanical Resonators |
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