Determination of error-corrected full scattering parameters of a two-port device from uncalibrated measurements

A methodology relying on relating terms of a two-port error network to the scattering (S-) parameters of a two-port network or device is applied to extract its full S-parameters. The new methodology has only one sign ambiguity problem (two solutions) in evaluation of S11 (and thus S22) while the sim...

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Veröffentlicht in:	Measurement : journal of the International Measurement Confederation 2022-02, Vol.190, p.110656, Article 110656
Hauptverfasser:	Hasar, Ugur Cem, Ozturk, Hamdullah, Korkmaz, Huseyin, Izginli, Mucahit, Alfaqawi, Mona Sadat Sophi, Ramahi, Omar Mustafa
Format:	Artikel
Sprache:	eng
Schlagworte:	Ambiguity Calibration Error correction Measurement errors Methodology Microwave heating Non-reciprocal Parameter estimation Phase shifters Polyethylenes Reflection-asymmetric S parameters Scattering Two-port network (device) Uncalibrated measurements
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