A Starry Byte — proton beam measurements of single event upsets and other radiation effects in ABCStar ASIC Versions 0 and 1 for the ITk strip tracker
Single Event Effects (SEEs) — predominately bit-flips in electronics caused by particle interactions - are a major concern for ASICs operated in high radiation environments such as ABCStar ASICs, which are designed to be used in the future ATLAS ITk strip tracker. The chip design is therefore optimi...
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| Veröffentlicht in: | Journal of instrumentation 2022-03, Vol.17 (3), p.P03017 |
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| creator | Basso, M.J. Fernández-Tejero, J. Gallop, B.J. Greig, G. John, J.J. Keener, P.T. Krizka, K. Leitao, P.V. Norman, B. Phillips, P.W. Poley, L. Sawyer, C. Stack, T.L. Stucci, S. Trischuk, D.A. Warren, M. |
| description | Single Event Effects (SEEs) — predominately bit-flips in
electronics caused by particle interactions - are a major concern
for ASICs operated in high radiation environments such as ABCStar
ASICs, which are designed to be used in the future ATLAS ITk strip
tracker. The chip design is therefore optimised to protect it from
SEEs by implementing triplication techniques such as Triple Modular
Redundancy (TMR).
In order to verify the radiation protection mechanisms of the chip
design, the cross-section for Single Event Upsets (SEUs), a
particular class of SEEs, is measured by exposing the chip to
high-intensity particle beams while monitoring it for observed SEUs.
This study presents the setup, the performed measurements, and the
results from SEU tests performed using the latest version of the
ABCStar ASIC (ABCStar V1) using a 480 MeV proton beam. |
| doi_str_mv | 10.1088/1748-0221/17/03/P03017 |
| format | Article |
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electronics caused by particle interactions - are a major concern
for ASICs operated in high radiation environments such as ABCStar
ASICs, which are designed to be used in the future ATLAS ITk strip
tracker. The chip design is therefore optimised to protect it from
SEEs by implementing triplication techniques such as Triple Modular
Redundancy (TMR).
In order to verify the radiation protection mechanisms of the chip
design, the cross-section for Single Event Upsets (SEUs), a
particular class of SEEs, is measured by exposing the chip to
high-intensity particle beams while monitoring it for observed SEUs.
This study presents the setup, the performed measurements, and the
results from SEU tests performed using the latest version of the
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for ASICs operated in high radiation environments such as ABCStar
ASICs, which are designed to be used in the future ATLAS ITk strip
tracker. The chip design is therefore optimised to protect it from
SEEs by implementing triplication techniques such as Triple Modular
Redundancy (TMR).
In order to verify the radiation protection mechanisms of the chip
design, the cross-section for Single Event Upsets (SEUs), a
particular class of SEEs, is measured by exposing the chip to
high-intensity particle beams while monitoring it for observed SEUs.
This study presents the setup, the performed measurements, and the
results from SEU tests performed using the latest version of the
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electronics caused by particle interactions - are a major concern
for ASICs operated in high radiation environments such as ABCStar
ASICs, which are designed to be used in the future ATLAS ITk strip
tracker. The chip design is therefore optimised to protect it from
SEEs by implementing triplication techniques such as Triple Modular
Redundancy (TMR).
In order to verify the radiation protection mechanisms of the chip
design, the cross-section for Single Event Upsets (SEUs), a
particular class of SEEs, is measured by exposing the chip to
high-intensity particle beams while monitoring it for observed SEUs.
This study presents the setup, the performed measurements, and the
results from SEU tests performed using the latest version of the
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| identifier | ISSN: 1748-0221 |
| ispartof | Journal of instrumentation, 2022-03, Vol.17 (3), p.P03017 |
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| source | Institute of Physics Journals |
| subjects | Design optimization Front-end electronics for detector readout Particle beams Particle interactions Proton beams Radiation Radiation damage to electronic components Radiation effects Radiation protection Radiation-hard detectors Radiation-hard electronics Single Event Effects Single event upsets |
| title | A Starry Byte — proton beam measurements of single event upsets and other radiation effects in ABCStar ASIC Versions 0 and 1 for the ITk strip tracker |
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